Take‐off angle dependent x‐ray photoelectron spectroscopy, secondary ion mass spectrometry, and scanning electron microscopy for determining the thickness and composition of passivation layers on technical aluminum foils

P. L. J. Gunter; H. J. Borg; J. W. Niemantsverdriet; H. J. H. Rheiter

doi:10.1116/1.577718

Take‐off angle dependent x‐ray photoelectron spectroscopy, secondary ion mass spectrometry, and scanning electron microscopy for determining the thickness and composition of passivation layers on technical aluminum foils

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.577718 ◽

1992 ◽

Vol 10 (4) ◽

pp. 2846-2851 ◽

Cited By ~ 1

Author(s):

P. L. J. Gunter ◽

H. J. Borg ◽

J. W. Niemantsverdriet ◽

H. J. H. Rheiter

Keyword(s):

Electron Microscopy ◽

Mass Spectrometry ◽

Scanning Electron Microscopy ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

Passivation Layers ◽

Secondary Ion ◽

Scanning Electron

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Studies of coal derivatized with OsO4 using secondary ion mass spectrometry, scanning electron microscopy and X-ray photoelectron spectrometry

Fuel ◽

10.1016/0016-2361(91)90117-s ◽

1991 ◽

Vol 70 (3) ◽

pp. 316-321 ◽

Cited By ~ 2

Author(s):

R.R. Martin ◽

J. Li ◽

J.A. MacPhee

Keyword(s):

Electron Microscopy ◽

Mass Spectrometry ◽

Scanning Electron Microscopy ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Scanning Electron

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Using time of flight secondary ion mass spectrometry and field emission scanning electron microscopy with energy dispersive X-ray spectroscopy to determine the role of soil components in competitive copper and cadmium migration and fixation in soils

Geoderma ◽

10.1016/j.geoderma.2015.03.026 ◽

2015 ◽

Vol 251-252 ◽

pp. 65-77 ◽

Cited By ~ 10

Author(s):

B. Cerqueira ◽

D. Arenas-Lago ◽

M.L. Andrade ◽

F.A. Vega

Keyword(s):

Electron Microscopy ◽

Mass Spectrometry ◽

Scanning Electron Microscopy ◽

Field Emission ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Soil Components ◽

Secondary Ion ◽

Scanning Electron

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Secondary ion mass spectrometry and scanning electron microscopy characterisation of grain boundary oxide ridges in 9Cr–1Mo steels having different silicon contents, and influence of grain size on scale spalling

Materials Science and Technology ◽

10.1179/mst.1994.10.7.592 ◽

1994 ◽

Vol 10 (7) ◽

pp. 592-598 ◽

Cited By ~ 4

Author(s):

R. K. Singh Raman ◽

A. K. Tyagi ◽

K. Krishan ◽

J. B. Gnanamoorthy

Keyword(s):

Electron Microscopy ◽

Mass Spectrometry ◽

Scanning Electron Microscopy ◽

Grain Size ◽

Grain Boundary ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Scanning Electron

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Imaging Nutrient Distributions in Plant Tissue Using Time-of-Flight Secondary Ion Mass Spectrometry and Scanning Electron Microscopy

PLANT PHYSIOLOGY ◽

10.1104/pp.107.109215 ◽

2008 ◽

Vol 147 (4) ◽

pp. 1774-1787 ◽

Cited By ~ 49

Author(s):

Ralf Metzner ◽

Heike Ursula Schneider ◽

Uwe Breuer ◽

Walter Heinz Schroeder

Keyword(s):

Electron Microscopy ◽

Mass Spectrometry ◽

Scanning Electron Microscopy ◽

Plant Tissue ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Scanning Electron

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Surface morphology and chemistry of Prunus laurocerasus L. leaves: a study using X-ray photoelectron spectroscopy, time-of-flight secondary-ion mass spectrometry, atomic-force microscopy and scanning-electron microscopy

Planta ◽

10.1007/s00425-004-1417-0 ◽

2004 ◽

Vol 221 (1) ◽

pp. 123-134 ◽

Cited By ~ 23

Author(s):

Mark C. Perkins ◽

Clive J. Roberts ◽

David Briggs ◽

Martyn C. Davies ◽

Adrian Friedmann ◽

...

Keyword(s):

Electron Microscopy ◽

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Force Microscopy ◽

Atomic Force ◽

Secondary Ion ◽

Prunus Laurocerasus ◽

Scanning Electron

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Imaging of Distribution of Topically Applied Drug Molecules in Mouse Skin by Combination of Time-of-Flight Secondary Ion Mass Spectrometry and Scanning Electron Microscopy

Analytical Chemistry ◽

10.1021/ac403924w ◽

2014 ◽

Vol 86 (7) ◽

pp. 3443-3452 ◽

Cited By ~ 34

Author(s):

Peter Sjövall ◽

Tanja M. Greve ◽

Susanne K. Clausen ◽

Kristian Moller ◽

Stefan Eirefelt ◽

...

Keyword(s):

Electron Microscopy ◽

Mass Spectrometry ◽

Scanning Electron Microscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Mouse Skin ◽

Drug Molecules ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Scanning Electron

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Compatibilization of polycarbonate and poly(vinylidene fluoride) blends studied by time-of-flight secondary ion mass spectrometry and scanning electron microscopy

Surface and Interface Analysis ◽

10.1002/(sici)1096-9918(200002)29:2<168::aid-sia725>3.0.co;2-i ◽

2000 ◽

Vol 29 (2) ◽

pp. 168-174 ◽

Cited By ~ 10

Author(s):

Jiyun Feng ◽

Lu-Tao Weng ◽

Lin Li ◽

Chi-Ming Chan

Keyword(s):

Electron Microscopy ◽

Mass Spectrometry ◽

Scanning Electron Microscopy ◽

Secondary Ion Mass Spectrometry ◽

Vinylidene Fluoride ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

Poly Vinylidene Fluoride ◽

Secondary Ion ◽

Scanning Electron

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Production of monodisperse uranium oxide particles and their characterization by scanning electron microscopy and secondary ion mass spectrometry

Spectrochimica Acta Part B Atomic Spectroscopy ◽

10.1016/s0584-8547(00)00262-7 ◽

2000 ◽

Vol 55 (10) ◽

pp. 1565-1575 ◽

Cited By ~ 53

Author(s):

N Erdmann ◽

M Betti ◽

O Stetzer ◽

G Tamborini ◽

J.V Kratz ◽

...

Keyword(s):

Electron Microscopy ◽

Mass Spectrometry ◽

Scanning Electron Microscopy ◽

Uranium Oxide ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

Oxide Particles ◽

Secondary Ion ◽

Scanning Electron

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Evaluation of the compositional changes during flooding of reactive fluids using scanning electron microscopy, nano-secondary ion mass spectrometry, x-ray diffraction and whole rock geochemistry

AAPG Bulletin ◽

10.1306/12221412196 ◽

2015 ◽

Vol 99 (05) ◽

pp. 791-805 ◽

Cited By ~ 12

Author(s):

Udo Zimmerman ◽

Merte Vadla Madland ◽

Anders Nermoen ◽

Tania Hildebrand-Habel ◽

Silvana A. R. Bertolino ◽

...

Keyword(s):

Electron Microscopy ◽

Mass Spectrometry ◽

Scanning Electron Microscopy ◽

Secondary Ion Mass Spectrometry ◽

X Ray Diffraction ◽

X Ray ◽

Compositional Changes ◽

Reactive Fluids ◽

Secondary Ion ◽

Scanning Electron

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Application of the TOF-SIMS and SEM-EDS methods to assess the influence of dusting from a phosphate waste deposal place based on hair analysis

Polish Journal of Chemical Technology ◽

10.2478/v10026-007-0097-5 ◽

2007 ◽

Vol 9 (4) ◽

pp. 85-90 ◽

Cited By ~ 1

Author(s):

Małgorzata Szynkowska ◽

Ewa Leśniewska ◽

Aleksandra Pawlaczyk ◽

Jacek Rogowski ◽

Tadeusz Paryjczak

Keyword(s):

Electron Microscopy ◽

Mass Spectrometry ◽

Scanning Electron Microscopy ◽

Secondary Ion Mass Spectrometry ◽

Hair Analysis ◽

X Ray ◽

Tof Sims ◽

Secondary Ion ◽

Hair Surface ◽

Scanning Electron

Application of the TOF-SIMS and SEM-EDS methods to assess the influence of dusting from a phosphate waste deposal place based on hair analysis In this work, scanning electron microscopy with energy dispersive X-ray spectrometry (SEM-EDS) and the time-of-flight secondary ion mass spectrometry (TOF-SIMS) were used to study the particles present on the hair surface of the inhabitants of Wislinka (people environmentally exposed due to the closeness of a dump) in order to obtain the information about the possible influence of dusting from a phosphate waste deposal place. Additionally, the morphology and the composition of fresh phosphogypsum were analyzed. Waste phosphogypsum is formed in the process of a wet phosphoric acid production and there is still a problem with its storage. A thorough understanding of the composition and chemistry of phosphogypsum seems to be necessary to evaluate its environmental impact comprehensively. The results obtained from these two techniques turned out to be complementary and revealed the information expected.

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