The characterization of titanium nitride by x‐ray photoelectron spectroscopy and Rutherford backscattering
1990 ◽
Vol 8
(1)
◽
pp. 99-105
◽
1986 ◽
Vol 4
(6)
◽
pp. 2463-2469
◽
1993 ◽
Vol 8
(10)
◽
pp. 2679-2685
◽
Keyword(s):
2014 ◽
Vol 34
(3)
◽
pp. 841-849
◽
2003 ◽
Vol 18
(5)
◽
pp. 1123-1130
◽
1986 ◽
Vol 4
(3)
◽
pp. 1580-1584
◽
2011 ◽
Vol 415-417
◽
pp. 642-647
2012 ◽
Vol 405
(5)
◽
pp. 1479-1495
◽