Ellipsometric studies of low‐temperature metalorganic chemical vapor deposited ZnS thin films

1990 ◽  
Vol 8 (3) ◽  
pp. 1544-1548 ◽  
Author(s):  
Roger L. Strong ◽  
Patricia B. Smith
1999 ◽  
Vol 14 (7) ◽  
pp. 2732-2738 ◽  
Author(s):  
Ch. Grigis ◽  
S. Schamm ◽  
D. Dorignac

New structural planar defects in Ba-deficient Y1Ba2Cu3O7−δ (YBCO) (1:1.6:3) thin films grown on NdGaO3 and SrTiO3 substrates by metalorganic chemical vapor deposition have been observed by means of high-resolution electron microscopy. The defects are associated with perturbations of the YBCO “1:2:3” stacking sequences along the c direction, which give rise to structural variants with locally “2:5:7,” “3:4:7,” or “4:6:10” cationic stoichiometries. The defects can be consistently interpreted as CuO–YO–CuO/CuO conversions or YO/BaO (BaO/YO) interconversions in the (a,b) planes and extending over a few nanometers along the c axis. Structural models based on image matching with simulations are proposed for two particular cases. It is thought that these structural imperfections can be effective sites of flux pinning.


Shinku ◽  
2003 ◽  
Vol 46 (9) ◽  
pp. 703-707
Author(s):  
Ken-ichi TSUJIMOTO ◽  
Satoshi MITANI ◽  
Tokuyuki TERAJI ◽  
Toshimichi ITO

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