Structural characterization of multilayer metal phosphonate film on silicon using angular‐dependent x‐ray photoelectron spectroscopy

1989 ◽  
Vol 7 (3) ◽  
pp. 1608-1613 ◽  
Author(s):  
S. Akhter ◽  
H. Lee ◽  
H.‐G. Hong ◽  
T. E. Mallouk ◽  
J. M. White
Keyword(s):  
Structural Characterization ◽  
Photoelectron Spectroscopy ◽  
X Ray ◽  
Metal Phosphonate ◽  
Multilayer Metal

Structural Characterization of γ-Terpinene Thin Films Using Mass Spectroscopy and X-Ray Photoelectron Spectroscopy

2015 ◽  
Vol 12 (10) ◽  
pp. 1085-1094 ◽  
Author(s):  
Jakaria Ahmad ◽  
Kateryna Bazaka ◽  
Jason D. Whittle ◽  
Andrew Michelmore ◽  
Mohan V. Jacob
Keyword(s):  
Thin Films ◽  
Mass Spectroscopy ◽  
Structural Characterization ◽  
Photoelectron Spectroscopy ◽  
X Ray

scholarly journals Chemical and structural characterization of EUV photoresists as a function of depth by standing-wave x-ray photoelectron spectroscopy

2021 ◽  
Vol 20 (03) ◽  
Author(s):  
Giuseppina Conti ◽  
Henrique P. Martins ◽  
Isvar A. Cordova ◽  
Jonathan Ma ◽  
Rudy J. Wojtecki ◽  
...  
Keyword(s):  
Standing Wave ◽  
Structural Characterization ◽  
Photoelectron Spectroscopy ◽  
X Ray

Structural Characterization of CeO2−MO2(M = Si4+, Ti4+, and Zr4+) Mixed Oxides by Raman Spectroscopy, X-ray Photoelectron Spectroscopy, and Other Techniques

2003 ◽  
Vol 107 (41) ◽  
pp. 11475-11484 ◽  
Author(s):  
Benjaram M. Reddy ◽  
Ataullah Khan ◽  
Yusuke Yamada ◽  
Tetsuhiko Kobayashi ◽  
Stéphane Loridant ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Structural Characterization ◽  
Photoelectron Spectroscopy ◽  
Mixed Oxides ◽  
X Ray

Structural Characterization of Metal Phosphonate Langmuir−Blodgett Films by Grazing Incidence X-ray Diffraction

Langmuir ◽  
2002 ◽  
Vol 18 (21) ◽  
pp. 8260-8262 ◽  
Author(s):  
Jeffrey T. Culp ◽  
Mark Davidson ◽  
Randolph S. Duran ◽  
Daniel R. Talham
Keyword(s):  
Structural Characterization ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Langmuir Blodgett ◽  
Metal Phosphonate ◽  
Langmuir Blodgett Films

scholarly journals Structural and Electronic Characterization of CuxBi2Se3

2017 ◽  
Vol 60 (3) ◽  
Author(s):  
Paola Arévalo López ◽  
Francisco Morales Leal ◽  
Roberto Escudero Derat
Keyword(s):  
Topological Insulator ◽  
Structural Characterization ◽  
Photoelectron Spectroscopy ◽  
Binding Energies ◽  
X Ray Diffraction ◽  
X Ray ◽  
Chemical Studies

Topological insulator Bi2Se3 becomes superconductor when it is intercalated with copper. In this work, we present our studies related to the electronic and structural characterization of CuxBi2Se3 with Cu variation from x = 0.11 to 0.20. We show structural and chemical studies performed via X-ray diffraction and photoelectron spectroscopy. Cu insertion modifies the Bi and Se binding energies and induces superconductivity in the compound.

New horizons for the structural characterization of stainless steel slags by X-ray powder diffraction

2007 ◽  
Vol 2007 (suppl_26) ◽  
pp. 61-66 ◽  
Author(s):  
B. Peplinski ◽  
B. Adamczyk ◽  
G. Kley ◽  
K. Adam ◽  
F. Emmerling ◽  
...  
Keyword(s):  
Stainless Steel ◽  
Powder Diffraction ◽  
Structural Characterization ◽  
X Ray ◽  
New Horizons

scholarly journals Structural Characterization of Heterodinuclear ZnII-LnIII Complexes (Ln = Pr, Nd) with a Ring-Contracted H2valdien-Derived Schiff Base Ligand

2021 ◽  
Author(s):  
Shabana Noor ◽  
Richard Goddard ◽  
Fehmeeda Khatoon ◽  
Sarvendra Kumar ◽  
Rüdiger W. Seidel
Keyword(s):  
Molecular Structure ◽  
Schiff Base ◽  
Structural Characterization ◽  
Schiff Base Ligand ◽  
Crystal And Molecular Structure ◽  
X Ray ◽  
X Ray Crystallography ◽  
Imidazoline Ring

AbstractSynthesis and structural characterization of two heterodinuclear ZnII-LnIII complexes with the formula [ZnLn(HL)(µ-OAc)(NO3)2(H2O)x(MeOH)1-x]NO3 · n H2O · n MeOH [Ln = Pr (1), Nd (2)] and the crystal and molecular structure of [ZnNd(HL)(µ-OAc)(NO3)2(H2O)] [ZnNd(HL)(OAc)(NO3)2(H2O)](NO3)2 · n H2O · n MeOH (3) are reported. The asymmetrical compartmental ligand (E)-2-(1-(2-((2-hydroxy-3-methoxybenzylidene)amino)-ethyl)imidazolidin-2-yl)-6-methoxyphenol (H2L) is formed from N1,N3-bis(3-methoxysalicylidene)diethylenetriamine (H2valdien) through intramolecular aminal formation, resulting in a peripheral imidazoline ring. The structures of 1–3 were revealed by X-ray crystallography. The smaller ZnII ion occupies the inner N2O2 compartment of the ligand, whereas the larger and more oxophilic LnIII ions are found in the outer O2O2’ site. Graphic Abstract Synthesis and structural characterization of two heterodinuclear ZnII-LnIII complexes (Ln = Pr, Nd) bearing an asymmetrical compartmental ligand formed in situ from N1,N3-bis(3-methoxysalicylidene)diethylenetriamine (H2valdien) through intramolecular aminal formation are reported.

The Growth and Characterization of Germanium-Carbon Alloy Thin Films

1992 ◽  
Vol 270 ◽  
Author(s):  
Haojie Yuan ◽  
R. Stanley Williams
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Vacuum Chamber ◽  
Optical Band Gap ◽  
High Vacuum ◽  
Optical Absorption Spectroscopy ◽  
Alloy Thin Film ◽  
New Materials ◽  
X Ray

ABSTRACTThin films of pure germanium-carbon alloys (GexC1−x with x ≈ 0.0, 0.2, 0.4, 0.5, 0.6, 0.8, 1.0) have been grown on Si(100) and A12O3 (0001) substrates by pulsed laser ablation in a high vacuum chamber. The films were analyzed by x-ray θ-2θ diffraction (XRD), x-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), conductivity measurements and optical absorption spectroscopy. The analyses of these new materials showed that films of all compositions were amorphous, free of contamination and uniform in composition. By changing the film composition, the optical band gap of these semiconducting films was varied from 0.00eV to 0.85eV for x = 0.0 to 1.0 respectively. According to the AES results, the carbon atoms in the Ge-C alloy thin film samples has a bonding configuration that is a mixture of sp2 and sp3 hybridizations.

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