Reflection electron microscope imaging of an operating scanning tunneling microscope

M. Kuwabara; W. Lo; J. C. H. Spence

doi:10.1116/1.575785

Reflection electron microscope imaging of an operating scanning tunneling microscope

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.575785 ◽

1989 ◽

Vol 7 (4) ◽

pp. 2745-2751 ◽

Cited By ~ 22

Author(s):

M. Kuwabara ◽

W. Lo ◽

J. C. H. Spence

Keyword(s):

Electron Microscope ◽

Scanning Tunneling Microscope ◽

Scanning Tunneling ◽

Tunneling Microscope ◽

Microscope Imaging ◽

Electron Microscope Imaging

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Electron Microscope Inventors Share Nobel Physics Prize: Ernst Ruska built the first electron microscope in 1931; Gerd Binnig and Heinrich Rohrer developed the scanning tunneling microscope 50 years later

Science ◽

10.1126/science.234.4778.821 ◽

1986 ◽

Vol 234 (4778) ◽

pp. 821-822 ◽

Cited By ~ 8

Author(s):

A. L. ROBINSON

Keyword(s):

Electron Microscope ◽

Scanning Tunneling Microscope ◽

Scanning Tunneling ◽

Tunneling Microscope

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Integrated nanofabrication with the scanning electron microscope and scanning tunneling microscope

Precision Engineering ◽

10.1016/0141-6359(94)90237-2 ◽

1994 ◽

Vol 16 (2) ◽

pp. 151

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Scanning Tunneling Microscope ◽

Scanning Tunneling ◽

Tunneling Microscope ◽

Scanning Electron

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Scanning tunneling microscope imaging technique for weakly bonded surface deposits

Journal of Applied Physics ◽

10.1063/1.343166 ◽

1989 ◽

Vol 65 (12) ◽

pp. 5237-5239 ◽

Cited By ~ 13

Author(s):

M. H. Jericho ◽

B. L. Blackford ◽

D. C. Dahn

Keyword(s):

Scanning Tunneling Microscope ◽

Imaging Technique ◽

Scanning Tunneling ◽

Tunneling Microscope ◽

Microscope Imaging

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Scanning-Tunneling Microscope Imaging of Single-Electron Solitons in a Material with Incommensurate Charge-Density Waves

Physical Review Letters ◽

10.1103/physrevlett.108.096801 ◽

2012 ◽

Vol 108 (9) ◽

Cited By ~ 38

Author(s):

Serguei Brazovskii ◽

Christophe Brun ◽

Zhao-Zhong Wang ◽

Pierre Monceau

Keyword(s):

Charge Density ◽

Scanning Tunneling Microscope ◽

Charge Density Waves ◽

Single Electron ◽

Scanning Tunneling ◽

Density Waves ◽

Tunneling Microscope ◽

Microscope Imaging

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A scanning tunneling microscope/scanning electron microscope system for the fabrication of nanostructures

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.585201 ◽

1991 ◽

Vol 9 (2) ◽

pp. 1380 ◽

Cited By ~ 25

Author(s):

E. E. Ehrichs

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Scanning Tunneling Microscope ◽

Scanning Tunneling ◽

Tunneling Microscope ◽

Scanning Electron

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Masking generates contiguous segments of metal-coated and bare DNA for scanning tunneling microscope imaging.

Proceedings of the National Academy of Sciences ◽

10.1073/pnas.90.16.7652 ◽

1993 ◽

Vol 90 (16) ◽

pp. 7652-7655 ◽

Cited By ~ 23

Author(s):

D. D. Dunlap ◽

R. Garcia ◽

E. Schabtach ◽

C. Bustamante

Keyword(s):

Scanning Tunneling Microscope ◽

Scanning Tunneling ◽

Tunneling Microscope ◽

Microscope Imaging

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Direct measurement of forces during scanning tunneling microscope imaging of graphite

Surface Science Letters ◽

10.1016/0167-2584(89)90579-3 ◽

1989 ◽

Vol 208 (3) ◽

pp. A14

Author(s):

C. Mathew Mate ◽

Ragnar Erlandsson ◽

GaryM. McClelland ◽

Shirley Chiang

Keyword(s):

Direct Measurement ◽

Scanning Tunneling Microscope ◽

Scanning Tunneling ◽

Tunneling Microscope ◽

Microscope Imaging

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Direct Observation of a Scanning Tunneling Microscope Tip Apex Using a Transmission Electron Microscope

10.7567/ssdm.1994.s-i-3-2 ◽

1994 ◽

Author(s):

M. I. Lutwyche ◽

Y. Wada

Keyword(s):

Electron Microscope ◽

Direct Observation ◽

Transmission Electron Microscope ◽

Scanning Tunneling Microscope ◽

Scanning Tunneling ◽

Tunneling Microscope ◽

Transmission Electron

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Direct measurement of forces during scanning tunneling microscope imaging of graphite

Surface Science ◽

10.1016/0039-6028(89)90014-9 ◽

1989 ◽

Vol 208 (3) ◽

pp. 473-486 ◽

Cited By ~ 71

Author(s):

C.Mathew Mate ◽

Ragnar Erlandsson ◽

Gary M. McClelland ◽

Shirley Chiang

Keyword(s):

Direct Measurement ◽

Scanning Tunneling Microscope ◽

Scanning Tunneling ◽

Tunneling Microscope ◽

Microscope Imaging

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In-SituObservation of the Fabrication Process of a Single Shell Carbon Fullerene Nano-Contact Using Transmission Electron Microscope–Scanning Tunneling Microscope

Japanese Journal of Applied Physics ◽

10.1143/jjap.46.l67 ◽

2007 ◽

Vol 46 (No. 3) ◽

pp. L67-L69 ◽

Cited By ~ 15

Author(s):

Makoto Yoshida ◽

Yoshihiko Kurui ◽

Yoshifumi Oshima ◽

Kunio Takayanagi

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Tunneling Microscope ◽

Fabrication Process ◽

Scanning Tunneling ◽

Tunneling Microscope ◽

Transmission Electron ◽

Single Shell

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