Depth‐compositional analyses (angle‐resolved x‐ray photoelectron spectroscopy) of degradations on etched mercury cadmium telluride

1988 ◽  
Vol 6 (4) ◽  
pp. 2699-2709 ◽  
Author(s):  
M. Seelmann‐Eggebert ◽  
H. J. Richter
Keyword(s):  
Cadmium Telluride ◽  
Photoelectron Spectroscopy ◽  
Mercury Cadmium Telluride ◽  
X Ray

The preparation of stoichiometric mercury cadmium telluride surfaces

1987 ◽  
Vol 65 (8) ◽  
pp. 1044-1046
Author(s):  
R. B. North ◽  
W. M. Lau
Keyword(s):  
Surface Treatment ◽  
Cadmium Telluride ◽  
Photoelectron Spectroscopy ◽  
Chemical Etching ◽  
Mercury Cadmium Telluride ◽  
Surface Composition ◽  
Surface Enrichment ◽  
Air Oxidation ◽  
X Ray

A technique involving cathodization of an anodized surface has been proposed as a surface treatment of mercury cadmium telluride substrates in the fabrication of infrared-sensitive devices. The resultant surface was analyzed with X-ray photoelectron spectroscopy and compared with surfaces produced by cleavage, sputtering, and chemical etching. It was found that the cathodized surface had a surface composition close to the bulk stoichiometry. The first monolayer of the surface was enriched in mercury and depleted in cadmium. This surface was also more inert towards air oxidation than the Br–methanol treated surface, probably because of the surface enrichment of mercury.

X-ray characterization of LPE mercury cadmium telluride

1988 ◽  
Vol 89 (4) ◽  
pp. 608-611 ◽  
Author(s):  
S. Bernardi ◽  
C. Ferrari ◽  
P. Franzosi
Keyword(s):  
Cadmium Telluride ◽  
Mercury Cadmium Telluride ◽  
X Ray

scholarly journals The55Fe x-ray energy response of mercury cadmium telluride near-infrared detector arrays

2008 ◽  
Author(s):  
Ori Fox ◽  
Augustyn Waczynski ◽  
Yiting Wen ◽  
Roger D. Foltz ◽  
Robert J. Hill ◽  
...  
Keyword(s):  
Cadmium Telluride ◽  
Mercury Cadmium Telluride ◽  
Near Infrared ◽  
Infrared Detector ◽  
Energy Response ◽  
Detector Arrays ◽  
X Ray

X-ray photoelectron spectroscopic studies of electrodeposited mercury cadmium telluride semiconductor thin films

2000 ◽  
Vol 61 (5) ◽  
pp. 765-771 ◽  
Author(s):  
R Kumaresan ◽  
R Gopalakrishnan ◽  
S Moorthy Babu ◽  
P Ramasamy ◽  
D Kruger ◽  
...  
Keyword(s):  
Thin Films ◽  
Cadmium Telluride ◽  
Mercury Cadmium Telluride ◽  
Spectroscopic Studies ◽  
X Ray ◽  
Semiconductor Thin Films

X-ray rocking curve analysis of ion implanted mercury cadmium telluride

1997 ◽  
Vol 26 (6) ◽  
pp. 600-605 ◽  
Author(s):  
B. L. Williams ◽  
H. G. Robinson ◽  
C. R. Helms ◽  
N. Zhu
Keyword(s):  
Cadmium Telluride ◽  
Mercury Cadmium Telluride ◽  
Curve Analysis ◽  
Rocking Curve ◽  
X Ray ◽  
Ion Implanted

scholarly journals The55Fe X-Ray Energy Response of Mercury Cadmium Telluride Near-Infrared Detector Arrays

2009 ◽  
Vol 121 (881) ◽  
pp. 743-754 ◽  
Author(s):  
Ori Fox ◽  
Augustyn Waczynski ◽  
Yiting Wen ◽  
Roger D. Foltz ◽  
Robert J. Hill ◽  
...  
Keyword(s):  
Cadmium Telluride ◽  
Mercury Cadmium Telluride ◽  
Near Infrared ◽  
Infrared Detector ◽  
Energy Response ◽  
Detector Arrays ◽  
X Ray

Synthesis of Mercury Cadmium Telluride Nanoparticles by Solvothermal Method

2005 ◽  
Vol 878 ◽  
Author(s):  
RangaRao Arnepalli ◽  
Viresh Dutta
Keyword(s):  
Cadmium Telluride ◽  
Mercury Cadmium Telluride ◽  
Solvothermal Method ◽  
Average Particle Size ◽  
Average Particle ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Patterns ◽  
First Time ◽  
Elemental Form

Abstract:Mercury Cadmium Telluride (MCT) nanoparticles were synthesized by Solvothermal method for the first time. Mercury, Cadmium and Tellurium in compound/elemental form were added to Ethylenediamine (solvent) in the Teflon-Stainless-Steel autoclave along with a reducing agent. Different compositions of MCT were synthesized by varying the proportions of Hg and Cd to obtain Hg1-xCdxTe with x varying from 1 to 0. X-ray diffraction patterns revealed the formation of MCT nanoparticles with predominant cubic (111) phase. TEM studies revealed that the average particle size ranged from 10 to15 nm for different compositions.

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