Chemical shifts of silicon and titanium in titanium silicide studied by Auger electron spectroscopy, slow electron energy‐loss spectroscopy, and internal x‐ray photoelectron spectroscopy
1988 ◽
Vol 6
(6)
◽
pp. 3120-3124
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1992 ◽
Vol 10
(4)
◽
pp. 2822-2825
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1980 ◽
Vol 76
(0)
◽
pp. 1122
◽
2000 ◽
Vol 62
(16)
◽
pp. 11126-11133
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1990 ◽
Vol 8
(1)
◽
pp. 68
◽