Chemical shifts of silicon and titanium in titanium silicide studied by Auger electron spectroscopy, slow electron energy‐loss spectroscopy, and internal x‐ray photoelectron spectroscopy

1988 ◽  
Vol 6 (6) ◽  
pp. 3120-3124 ◽  
Author(s):  
J. K. N. Sharma ◽  
B. R. Chakraborty ◽  
S. M. Shivaprasad
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