A new technique for characterization of thin‐film ferroelectric memory devices

1988 ◽  
Vol 6 (3) ◽  
pp. 1756-1758 ◽  
Author(s):  
G. Rohrer ◽  
S. Narayan ◽  
L. McMillan ◽  
A. Kulkarni
Keyword(s):  
Thin Film ◽  
New Technique ◽  
Memory Devices ◽  
Ferroelectric Memory ◽  
A New Technique

A New Technique for Characterization of Low Impedance Materials at Acoustic Frequencies

2018 ◽  
Vol 58 (8) ◽  
pp. 1311-1324 ◽  
Author(s):  
W. Nantasetphong ◽  
Z. Jia ◽  
M.A. Hasan ◽  
A.V. Amirkhizi ◽  
S. Nemat-Nasser
Keyword(s):  
New Technique ◽  
A New Technique ◽  
Low Impedance Materials

Mechanical deflection of cantilever microbeams: A new technique for testing the mechanical properties of thin films

1988 ◽  
Vol 3 (5) ◽  
pp. 931-942 ◽  
Author(s):  
T. P. Weihs ◽  
S. Hong ◽  
J. C. Bravman ◽  
W. D. Nix
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Mechanical Properties ◽  
Single Layer ◽  
Beam Theory ◽  
New Technique ◽  
Young’S Moduli ◽  
Silicon Micromachining ◽  
A New Technique

The mechanical deflection of cantilever microbeams is presented as a new technique for testing the mechanical properties of thin films. Single-layer microbeams of Au and SiO2 have been fabricated using conventional silicon micromachining techniques. Typical thickness, width, and length dimensions of the beams are 1.0,20, and 30 μm, respectively. The beams are mechanically deflected by a Nanoindenter, a submicron indentation instrument that continuously monitors load and deflection. Using simple beam theory and the load-deflection data, the Young's moduli and the yield strengths of thin-film materials that comprise the beams are determined. The measured mechanical properties are compared to those obtained by indenting similar thin films supported by their substrate.

Fluorescence lifetime spectroscopy: a new technique for the characterization of polyplexes

2014 ◽  
Author(s):  
Cosimo D’Andrea ◽  
Daniele Pezzoli ◽  
Chiara Malloggi ◽  
Alessia Candeo ◽  
Alessandro Volonterio ◽  
...  
Keyword(s):  
Fluorescence Lifetime ◽  
New Technique ◽  
A New Technique

A new technique for characterization of pore structures in materials—application to the study of hydroxyapatite thin films

1998 ◽  
Vol 37 (4-5) ◽  
pp. 211-214
Author(s):  
C.M. Lopatin ◽  
T.L. Alford ◽  
V.B. Pizziconi ◽  
T. Laursen
Keyword(s):  
Thin Films ◽  
New Technique ◽  
Pore Structures ◽  
A New Technique

Echocardiographically guided left atrial ablation: Characterization of a new technique

Heart Rhythm ◽  
2006 ◽  
Vol 3 (8) ◽  
pp. 930-938 ◽  
Author(s):  
David Schwartzman ◽  
John Nosbisch ◽  
Debra Housel
Keyword(s):  
Left Atrial ◽  
New Technique ◽  
Atrial Ablation ◽  
A New Technique
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