Homogenization of tantalum pentoxide reference materials and the establishment of a reference standard for sputtering fluxes and for cross section measurements in nuclear instruments

1987 ◽  
Vol 5 (4) ◽  
pp. 1988-1993 ◽  
Author(s):  
M. P. Seah ◽  
M. W. Holbourn ◽  
J. A. Davies ◽  
C. Ortega
Keyword(s):  
Cross Section ◽  
Reference Materials ◽  
Tantalum Pentoxide ◽  
Reference Standard

Blind Deconvolution of SEM Images

2007 ◽  
Author(s):  
William E. Vanderlinde ◽  
James N. Caron
Keyword(s):  
Cross Section ◽  
Integrated Circuit ◽  
Blind Deconvolution ◽  
Signal To Noise Ratio ◽  
Image Resolution ◽  
Reference Standard ◽  
Signal To Noise ◽  
Sem Images ◽  
Resolution Improvement ◽  
Deconvolution Techniques

Abstract Blind deconvolution techniques were used to enhance scanning electron microscope (SEM) images in the range of 200,000x to 500,000x magnification. Typical SEM samples were imaged including a gold island reference standard, a plasma delayered integrated circuit, and an integrated circuit cross section. Image resolution improvement up to 40% was observed. However, it was necessary to use 16-bit TIFF images with greater than 120:1 signal to noise ratio, which required 10 minute frame times.

The use of reference materials in sensory analysis

1995 ◽  
Vol 31 (11) ◽  
pp. 265-272 ◽  
Author(s):  
S. W. Krasner
Keyword(s):  
Reference Materials ◽  
Sensory Analysis ◽  
Reference Standards ◽  
Natural Material ◽  
Reference Standard ◽  
Reference Library ◽  
Language Differences ◽  
Different Types ◽  
Industrial Sources ◽  
Different Levels

In descriptive sensory techniques, reference materials are used to establish a common vocabulary for various aromas and flavors. A reference standard can be any chemical or natural material that adequately represents the particular characteristic described. This paper evaluates the utility of various reference materials that have been proposed as odor standards. The odor reference library used included odors commonly attributable to microbiological and industrial sources. The results of utilizing reference standards demonstrated that some materials were very good; that is, they yielded a distinctive odor that transcended cultural and language differences, as well as different levels of experience. Other aromas required several standards to distinguish among subtle but important differences, e.g., geosmin and 2-methylisoborneol to differentiate earthy/musty odors. These standards also included natural materials prepared in various states to reference different types of common odors in water - for example, grass clippings (in water) that had been freshly cut to represent a grassy odor, or had been held for a week to represent a septic odor, as well as dried grass for a hay odor. Other reference materials yielded bimodal distributions in which, primarily, two groups centered around different descriptors; these kinds of materials would not make good reference standards.

Analytical Reference Materials. I. Preparation and Purification of Photomirex

1979 ◽  
Vol 62 (6) ◽  
pp. 1302-1308
Author(s):  
Alfred S Y Chau ◽  
Rod Thomson
Keyword(s):  
Propionic Acid ◽  
Reference Materials ◽  
Column Chromatography ◽  
Reference Standard ◽  
Alumina Column ◽  
Synthetic Procedure ◽  
Alumina Column Chromatography ◽  
Analytical Reference

Abstract The preparation and purification of photomirex (1,2,3,4,5,5,6,7,9,10,10 - undecachloropentacyclo [5.3.0.02,6.03,9.04,8]decane) as an analytical reference standard is detailed. A previous synthetic procedure was modified and improved to reduce hazards and to increase yield. Briefly, Mirex is reduced by triphenylphosphine in the presence of propionic acid, and purified by alumina column chromatography to obtain 60-70% yield of the desired compound.

Determination of the collision-induced depolarized Raman light scattering cross section of the argon diatom

1981 ◽  
Vol 59 (10) ◽  
pp. 1418-1420 ◽  
Author(s):  
Fabrizio Barocchi ◽  
Marco Zoppi ◽  
Michael H. Proffitt ◽  
Lothar Frommhold
Keyword(s):  
Light Scattering ◽  
Cross Section ◽  
Scattering Cross Section ◽  
Excitation Wavelength ◽  
Reference Standard ◽  
Absolute Value ◽  
Scattering Cross ◽  
Raman Light Scattering ◽  
External Reference

We report two independent calibrations of the argon diatom Raman light scattering cross section at 20 cm−1 shift (Stokes side), based on rotational Raman lines of hydrogen and nitrogen as an external reference standard. The precision is about 5% on an absolute scale, and the agreement relative to each other even better. The excitation wavelength is 5145 Å, but calibrations at 4880 and 4579 Å are seen to be consistent if the dominating factor 1/λ4 (λ = wavelength) is accounted for. Thus, a useful secondary standard for the calibration of similar spectra is obtained, and a long-standing question as to the absolute value of the diatom scattering cross section appears to be settled.

XUV Absorption Spectra of Carbon Ions

1988 ◽  
Vol 102 ◽  
pp. 71-73
Author(s):  
E. Jannitti ◽  
P. Nicolosi ◽  
G. Tondello
Keyword(s):  
Absorption Spectra ◽  
Cross Section ◽  
Theoretical Calculations ◽  
Photoionization Cross Section ◽  
Carbon Ions

AbstractThe photoabsorption spectra of the carbon ions have been obtained by using two laser-produced plasmas. The photoionization cross-section of the CV has been absolutely measured and the value at threshold, σ=(4.7±0.5) × 10−19cm2, as well as its behaviour at higher energies agrees quite well with the theoretical calculations.

Elastic Scattering in Electron Microscopy

1973 ◽  
Vol 31 ◽  
pp. 252-253
Author(s):  
J. Langmore ◽  
M. Isaacson ◽  
J. Wall ◽  
A. V. Crewe
Keyword(s):  
Electron Microscopy ◽  
Elastic Scattering ◽  
Cross Section ◽  
Quantum Noise ◽  
Dark Field ◽  
Elastic Cross Section ◽  
Biological Molecules ◽  
Dark Field Microscopy ◽  
Field Systems ◽  
Effects Of Radiation

High resolution dark field microscopy is becoming an important tool for the investigation of unstained and specifically stained biological molecules. Of primary consideration to the microscopist is the interpretation of image Intensities and the effects of radiation damage to the specimen. Ignoring inelastic scattering, the image intensity is directly related to the collected elastic scattering cross section, σɳ, which is the product of the total elastic cross section, σ and the eficiency of the microscope system at imaging these electrons, η. The number of potentially bond damaging events resulting from the beam exposure required to reduce the effect of quantum noise in the image to a given level is proportional to 1/η. We wish to compare η in three dark field systems.

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