Detection of neutral atoms sputtered from ion‐bombarded single‐crystal surfaces Rh{111} and p(2×2) O/Rh{111}: Ejection mechanism and surface structure determinations from energy‐ and angle‐resolved measurements

1987 ◽  
Vol 5 (4) ◽  
pp. 1191-1193 ◽  
Author(s):  
J. Singh ◽  
C. T. Reimann ◽  
J. P. Baxter ◽  
G. A. Schick ◽  
P. H. Kobrin ◽  
...  
Author(s):  
N. Yao ◽  
J. M. Cowley

The REM technique may be used to reveal detail on the surfaces of large crystals. The single-atom-height steps on certain single crystal surfaces can be seen with high contrast. The observations of double contours of atomic steps on single crystal surfaces have been reported recently. The doubling has been interpreted as Fresnel diffraction contrast or as effects caused by the distortion field around the surface steps. However, due to the foreshortening and other effects, the resolution in the observation direction is limited and details of the surface structure can be obscured by imaging and diffraction artefacts.The InP(110) surface was obtained by cleavage of a (100) wafer in air. In order to reduce the contamination effects, a nitrogen cooling holder was employed during the observation. The Pt (111) surface was prepared and observed under the conditions described by Hsu and Cowley.


RSC Advances ◽  
2015 ◽  
Vol 5 (71) ◽  
pp. 57361-57371 ◽  
Author(s):  
Lihui Ou

The research results have great significance for the in depth understanding of the selectivity of the CO2 electrochemical reduction process and the sensitivity of the Cu surface structure.


2021 ◽  
pp. 138947
Author(s):  
José M. Gisbert-González ◽  
María V. Oliver-Pardo ◽  
Francisco J. Sarabia ◽  
Víctor Climent ◽  
Juan M. Feliu ◽  
...  

1976 ◽  
Vol 9 (7) ◽  
pp. 248-256 ◽  
Author(s):  
Gabor A. Somorjai

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