Thermal stability of heat‐reflective films consisting of oxide–Ag–oxide deposited by dc magnetron sputtering

1986 ◽  
Vol 4 (6) ◽  
pp. 2907-2910 ◽  
Author(s):  
E. Kusano ◽  
J. Kawaguchi ◽  
K. Enjouji
CrystEngComm ◽  
2014 ◽  
Vol 16 (13) ◽  
pp. 2835-2844 ◽  
Author(s):  
S. Thanka Rajan ◽  
A. K. Nanda Kumar ◽  
B. Subramanian

Zr-based thin film metallic glasses (TFMG) were fabricated from a polycrystalline Zr48Cu36Al8Ag8 (at.%) target by DC magnetron sputtering. A series of characterization techniques were employed to study the structure, composition and thermal stability of the glassy coating. Annealing studies show nanocrystallites of CuZr2 in an amorphous matrix.


2002 ◽  
Vol 194 (1) ◽  
pp. 192-205 ◽  
Author(s):  
S. Venkataraj ◽  
O. Kappertz ◽  
R. Drese ◽  
Ch. Liesch ◽  
R. Jayavel ◽  
...  

2021 ◽  
pp. 93-98
Author(s):  
Evgenii Erofeev ◽  
Egor Polyntsev ◽  
Sergei Ishutkin

Electrophysical characteristics and their thermal stability of thin-film resistors based on tantalum nitride (TaN) obtained by reactive magnetron sputtering were investigated. The optimal modes of the magnetron sputtering process are determined, ensuring the Ta2N phase film composition with the value of the specific electrical resistance of 250 μm cm and high thermal stability of the parameters. On the basis of the investigations carried out, thin-film matching resistors were manufactured for use as part of an electro-optical InP-based MZ modulator


2019 ◽  
Vol 32 (1) ◽  
pp. 136-144 ◽  
Author(s):  
Yan-Ming Liu ◽  
Tong Li ◽  
Feng Liu ◽  
Zhi-Liang Pei

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