Abstract: Characterization of InN, In2O3, and In oxy‐nitride semiconducting thin films using XPS electron energy loss spectra

1979 ◽  
Vol 16 (2) ◽  
pp. 517-517 ◽  
Author(s):  
T. L. Barr ◽  
B. R. Natarajan ◽  
A. H. Eltoukhy ◽  
J. E. Greene
Keyword(s):  
Thin Films ◽  
Energy Loss ◽  
Electron Energy ◽  
Abstract Characterization ◽  
Semiconducting Thin Films ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra

Influence of film structure on the electron energy loss spectra of GaAs thin films

1983 ◽  
Vol 18 (8) ◽  
pp. 1035-1044 ◽  
Author(s):  
H. Boudriot ◽  
B. Kubier ◽  
K. Deus ◽  
R. Gründler ◽  
E. Kusior
Keyword(s):  
Thin Films ◽  
Energy Loss ◽  
Electron Energy ◽  
Film Structure ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra

Influence of the structure of InP thin films on electron energy loss spectra

1989 ◽  
Vol 24 (2) ◽  
pp. 149-152 ◽  
Author(s):  
R. Gründler ◽  
H. Boudriot ◽  
K. Deus ◽  
H. A. Sckneider ◽  
T. Stöckert
Keyword(s):  
Thin Films ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra

scholarly journals Characterization of BiVO4 Powders and Thin Films by Electron Microscopy and Electron Energy Loss Spectroscopy

2017 ◽  
Vol 23 (S1) ◽  
pp. 1822-1823
Author(s):  
H. A. Calderon ◽  
F. Toma ◽  
J. K. Cooper ◽  
I. D. Sharp ◽  
P. Ercius ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Electron Energy Loss

scholarly journals Electron-energy-loss spectroscopy characterization of thesp2bonding fraction within carbon thin films

2000 ◽  
Vol 62 (19) ◽  
pp. 12628-12631 ◽  
Author(s):  
A. J. Papworth ◽  
C. J. Kiely ◽  
A. P. Burden ◽  
S. R. P. Silva ◽  
G. A. J. Amaratunga
Keyword(s):  
Thin Films ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Carbon Thin Films ◽  
Electron Energy Loss

scholarly journals STEM Z-contrast and Electron Energy Loss Spectroscopy Characterization of Co-doped TiO2 Thin Films

2006 ◽  
Vol 12 (S02) ◽  
pp. 974-975
Author(s):  
L Fu ◽  
ND Browning ◽  
S Zhang ◽  
DC Kundaliya ◽  
SB Ogale ◽  
...  
Keyword(s):  
Thin Films ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Tio2 Thin Films ◽  
Doped Tio2 ◽  
Z Contrast ◽  
Electron Energy Loss ◽  
Co Doped

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

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