Application of matrix isolation spectroscopy to the measurement of sputtering yields
1979 ◽
Vol 16
(2)
◽
pp. 251-254
◽
1981 ◽
Vol 18
(2)
◽
pp. 235-237
◽
1987 ◽
pp. 589-593
◽
2006 ◽
Vol 124
(23)
◽
pp. 234509
◽
2009 ◽
Vol 919
(1-3)
◽
pp. 271-276
◽