scholarly journals Etching sharp tips from thin metallic wires for tuning-fork-based scanning probe microscopy

2020 ◽  
Vol 38 (2) ◽  
pp. 024004
Author(s):  
Patrick Wallace Krantz ◽  
Venkat Chandrasekhar
Keyword(s):  
Scanning Probe Microscopy ◽  
Tuning Fork ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Metallic Wires

Improve performance of scanning probe microscopy by balancing tuning fork prongs

2009 ◽  
Vol 109 (4) ◽  
pp. 291-295 ◽  
Author(s):  
Boon Ping Ng ◽  
Ying Zhang ◽  
Shaw Wei Kok ◽  
Yeng Chai Soh
Keyword(s):  
Scanning Probe Microscopy ◽  
Tuning Fork ◽  
Scanning Probe ◽  
Improve Performance ◽  
Probe Microscopy

scholarly journals Dynamics of quartz tuning fork force sensors used in scanning probe microscopy

2009 ◽  
Vol 20 (21) ◽  
pp. 215502 ◽  
Author(s):  
A Castellanos-Gomez ◽  
N Agraït ◽  
G Rubio-Bollinger
Keyword(s):  
Scanning Probe Microscopy ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Scanning Probe ◽  
Force Sensors ◽  
Probe Microscopy

Measuring the Interaction Force Between a Tip and a Substrate Using a Quartz Tuning Fork Under Ambient Conditions

2006 ◽  
Vol 6 (11) ◽  
pp. 3455-3459
Author(s):  
Yexian Qin ◽  
R. Reifenberger
Keyword(s):  
Resonant Frequency ◽  
Scanning Probe Microscopy ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Interaction Force ◽  
Scanning Probe ◽  
Ambient Conditions ◽  
Probe Microscopy ◽  
Tuning Forks ◽  
Force Data

Tuning forks mounted with sharp tips provide an alternate method to silicon microcantilevers for probing the tip-substrate interaction in scanning probe microscopy. The high quality factor and stable resonant frequency of the tuning fork allow accurate measurements of small shifts in the resonant frequency as the tip approaches the substrate. To permit an accurate measure of surface interaction forces, the electrical and piezomechanical properties of a tuning fork has been characterized using techniques derived from scanning probe microscopy. After proper calibration, representative interaction force data for a conventional Si tip and an HOPG substrate are obtained under ambient conditions.

scholarly journals Controlling the quality factor of a tuning-fork resonance between 9 and 300 K for scanning-probe microscopy

2011 ◽  
Vol 44 (37) ◽  
pp. 375502 ◽  
Author(s):  
G Ctistis ◽  
E H Frater ◽  
S R Huisman ◽  
J P Korterik ◽  
J L Herek ◽  
...  
Keyword(s):  
Quality Factor ◽  
Scanning Probe Microscopy ◽  
Tuning Fork ◽  
Scanning Probe ◽  
Probe Microscopy

Scanning Probe Microscopy in an Ultra-Low Vibration Closed-Cycle Cryostat: Skyrmion Lattice Detection and Tuning Fork Implementation

2015 ◽  
Vol 23 (6) ◽  
pp. 12-17 ◽  
Author(s):  
Francesca Paola Quacquarelli ◽  
Jorge Puebla ◽  
Thomas Scheler ◽  
Dieter Andres ◽  
Christoph Bödefeld ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Tuning Fork ◽  
Scanning Probe ◽  
Closed Cycle ◽  
Probe Microscopy

An improved dynamic model of tuning fork probe for scanning probe microscopy

2009 ◽  
Vol 234 (2) ◽  
pp. 191-195 ◽  
Author(s):  
B.P. NG ◽  
Y. ZHANG ◽  
S.W. KOK ◽  
Y.C. SOH
Keyword(s):  
Dynamic Model ◽  
Scanning Probe Microscopy ◽  
Tuning Fork ◽  
Scanning Probe ◽  
Probe Microscopy
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