scholarly journals New method to analyze random telegraph signals in resistive random access memories

2019 ◽  
Vol 37 (1) ◽  
pp. 012203 ◽  
Author(s):  
Gerardo González-Cordero ◽  
Mireia B. González ◽  
Francisco Jiménez-Molinos ◽  
Francesca Campabadal ◽  
Juan Bautista Roldán
Keyword(s):  
Random Access ◽  
New Method ◽  
Random Telegraph Signals

Laser Scanning Localization Technique for Fast Analysis of High Speed DRAM Devices

2008 ◽  
Author(s):  
Martin Versen ◽  
Achim Schramm ◽  
Jan Schnepp ◽  
Sascha Hoch ◽  
Tapan Vikas ◽  
...  
Keyword(s):  
Integrated Circuit ◽  
High Speed ◽  
Laser Scanning ◽  
Random Access ◽  
Laser Scanning Microscopy ◽  
New Method ◽  
Temperature Influence ◽  
Fast Analysis ◽  
Knowledge Based ◽  
Defect Localization

Abstract Soft defect localization (SDL) is a method of laser scanning microscopy that utilizes the changing pass/fail behavior of an integrated circuit under test and temperature influence. Historically the pass and fail states are evaluated by a tester that leads to long and impracticable measurement times for dynamic random access memories (DRAM). The new method using a high speed comparison device allows SDL image acquisition times of a few minutes and a localization of functional DRAM fails that are caused by defects in the DRAM periphery that has not been possible before. This new method speeds up significantly the turn-around time in the failure analysis (FA) process compared to knowledge based FA.

New Method for Soft-Error Mapping in Dynamic Random Access Memory Using Nuclear Microprobe

1992 ◽  
Vol 31 (Part 1, No. 12B) ◽  
pp. 4541-4544 ◽  
Author(s):  
Hirokazu Sayama ◽  
Shigenori Hara ◽  
Hiroshi Kimura ◽  
Yoshikazu Ohno ◽  
Shinichi Satoh ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Soft Error ◽  
Dynamic Random Access Memory ◽  
New Method ◽  
Nuclear Microprobe ◽  
Access Memory

Angle/Fractal Multiplexing Usingx–yGalvano Mirror System and New Method of Improving Random-Access Performance

2006 ◽  
Vol 45 (2B) ◽  
pp. 1253-1257 ◽  
Author(s):  
Jin-Young Choi ◽  
Jae-Sung Lee ◽  
Sang-Hoon Kim ◽  
Jang-Hyun Kim ◽  
Hyun Seok Yang ◽  
...  
Keyword(s):  
Random Access ◽  
Mirror System ◽  
New Method

Selective Sampling and Orientation of Non-Homogeneous Tissues

1968 ◽  
Vol 26 ◽  
pp. 98-99
Author(s):  
C. C. Clawson ◽  
L. W. Anderson ◽  
R. A. Good
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Light Microscopy ◽  
Random Sampling ◽  
New Method ◽  
Microscope Examination ◽  
Small Areas ◽  
Selective Sampling ◽  
Large Numbers ◽  
Specific Orientation

Investigations which require electron microscope examination of a few specific areas of non-homogeneous tissues make random sampling of small blocks an inefficient and unrewarding procedure. Therefore, several investigators have devised methods which allow obtaining sample blocks for electron microscopy from region of tissue previously identified by light microscopy of present here techniques which make possible: 1) sampling tissue for electron microscopy from selected areas previously identified by light microscopy of relatively large pieces of tissue; 2) dehydration and embedding large numbers of individually identified blocks while keeping each one separate; 3) a new method of maintaining specific orientation of blocks during embedding; 4) special light microscopic staining or fluorescent procedures and electron microscopy on immediately adjacent small areas of tissue.

A new method for the determination of nitrates

1960 ◽  
Vol 23 ◽  
pp. 227-232 ◽  
Author(s):  
P WEST ◽  
G LYLES
Keyword(s):  
New Method
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