Experimental study of field emission from ultrasharp silicon, diamond, GaN, and tungsten tips in close proximity to the counter electrode
2018 ◽
Vol 36
(6)
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pp. 06JL03
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1995 ◽
Vol 13
(2)
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pp. 487
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1999 ◽
Vol 429
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pp. 299-303
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1998 ◽
Vol 16
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pp. 1180
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2013 ◽
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pp. 429-432
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1990 ◽
Vol 288
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pp. 324-328
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