Matrix and element dependences of useful yield in Si and SiO2 matrices using laser-ionization sputtered neutral mass spectrometry
2018 ◽
Vol 36
(3)
◽
pp. 03F128
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Keyword(s):
Keyword(s):
2010 ◽
Vol 65
(11)
◽
pp. 871-883
◽
Keyword(s):
Keyword(s):
Keyword(s):