scholarly journals Design, fabrication, and characterization of polymer-based cantilever probes for atomic force microscopes

2016 ◽  
Vol 34 (6) ◽  
pp. 06KI01 ◽  
Author(s):  
Fangzhou Yu ◽  
Jiangbo Liu ◽  
Xiao Zhang ◽  
Ai-Lian Lin ◽  
Nabeela Khan ◽  
...  
Keyword(s):  
Atomic Force Microscopes ◽  
Atomic Force ◽  
Fabrication And Characterization ◽  
Cantilever Probes

Characterization of the photocurrents generated by the laser of atomic force microscopes

2016 ◽  
Vol 87 (8) ◽  
pp. 083703 ◽  
Author(s):  
Yanfeng Ji ◽  
Fei Hui ◽  
Yuanyuan Shi ◽  
Vanessa Iglesias ◽  
David Lewis ◽  
...  
Keyword(s):  
Atomic Force Microscopes ◽  
Atomic Force

Characterization of a β-Glucan Particle Using the Scanning Tunneling and Atomic Force Microscopes

1992 ◽  
pp. 131-144
Author(s):  
Antonio A. Garcia ◽  
Patrick Oden ◽  
Uwe Knipping ◽  
Gary Ostroff ◽  
Roberta Druyor
Keyword(s):  
Scanning Tunneling ◽  
Atomic Force Microscopes ◽  
Atomic Force

Fabrication and Characterization of RF Magnetron Sputtered Silicon Oxide Films

2014 ◽  
Vol 970 ◽  
pp. 102-105
Author(s):  
Jian Wei Hoon ◽  
Kah Yoong Chan ◽  
Cheng Yang Low
Keyword(s):  
Indium Tin Oxide ◽  
Silicon Oxide ◽  
Rf Magnetron Sputtering ◽  
Surface Topology ◽  
Sputtering Deposition ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Atomic Force ◽  
Fabrication And Characterization

In this work, silicon dioxide (SiO2) films were fabricated on indium tin oxide (ITO) coated glass substrates by radio frequency (RF) magnetron sputtering deposition technique. The deposition rate of the magnetron sputtered SiO2 films was investigated. The SiO2 films were characterized with the atomic force microscopy (AFM) for their surface topology. In addition, the electrical insulating strength of the magnetron sputtered SiO2 was examined.

scholarly journals A Crowdsourcing-based Air Pollution Measurement System Using DIY Atomic Force Microscopes

2016 ◽  
Vol 3 (1) ◽  
Author(s):  
Daniel Lopez Martinez ◽  
Daniel Lombraña ◽  
Francois Grey ◽  
En-te Hwu
Keyword(s):  
Air Pollution ◽  
Measurement System ◽  
Human Computation ◽  
Global Pattern ◽  
Atomic Force Microscopes ◽  
Atomic Force ◽  
Production And Consumption ◽  
Pollution Measurement ◽  
Scientific Platform

Air pollutants have become the major problem of many cities, causing millions of human deaths worldwide every year. Among all the noxious pollutants in air, particles with a diameter of 2.5 micrometers or less (PM2.5) are the most hazardous because they are small enough to penetrate to the lungs and invade the smallest airways. Since the presence of dangerous levels of PM2.5, commonly reported in newspapers and on TV, is intertwined with the global pattern of production and consumption, there is a need for citizen science projects that engage the young generations in efforts toward reducing air pollution as they will become the future leaders of society. With this goal, and to enable the geo-temporal characterization of PM2.5, we present a crowdsourcing-based air pollution measurement system that uses affordable DIY atomic force microscopes to measure and characterize PM2.5, exploiting the power of human computation through an online crowdsourcing platform to study how PM2.5 varies over time and across geographical locations. Our system is intended as both a scientific platform and a teaching tool for children to engage in environmental policy. 

T1601-1-4 Fabrication and characterization of narrow-gapped silicon dual nano probe for atomic force microscope

2009 ◽  
Vol 2009.8 (0) ◽  
pp. 239-240
Author(s):  
Akihiro UMINO ◽  
Shinji MORITA ◽  
Takashi MINETA ◽  
Eiji MAKINO ◽  
Takahiro KAWASHIMA ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Force ◽  
Fabrication And Characterization
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