Direct observation of x-ray radiation-induced damage to SiO2/Si interface using multiwavelength room temperature photoluminescence
2016 ◽
Vol 34
(4)
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pp. 041208
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Keyword(s):
X Ray
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2002 ◽
Vol 16
(06n07)
◽
pp. 1047-1051
1968 ◽
Vol 23
(2)
◽
pp. 126-133
◽
2010 ◽
Vol 24
(32)
◽
pp. 3081-3087
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1993 ◽
Vol 57
(1-6)
◽
pp. 105-109
◽
2010 ◽
Vol 24
(10)
◽
pp. 945-951
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2007 ◽
Vol 31
◽
pp. 114-116
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