Determination of the depletion layer width and effects on the formation of double-2DEG in AlGaAs/GaAs heterostructures

Author(s):  
Irving Eduardo Cortes-Mestizo ◽  
Leticia Ithsmel Espinosa-Vega ◽  
Jose Angel Espinoza-Figueroa ◽  
Alejandro Cisneros-de-la-Rosa ◽  
Eric Eugenio-Lopez ◽  
...  
2020 ◽  
Vol 22 (23) ◽  
pp. 13277-13284
Author(s):  
Wanchao Zheng ◽  
Yuchen Wang ◽  
Chao Jin ◽  
Ruihua Yin ◽  
Dong Li ◽  
...  

The resistive switching behavior in the Pt/Fe/BiFeO3/SrRuO3 heterostructures was observed. It results from the ferroelectric polarization modulated the depletion layer width around the BiFeO3/SrRuO3 interface.


1985 ◽  
Vol 53 ◽  
Author(s):  
B.A. Khan ◽  
T. Marshall ◽  
E. Arnold ◽  
R. Pandya

ABSTRACTWe have fabricated accumulation mode MOSFETS in poly-silicon thin films and studied the effect of passivation of the leakage currents in these devices. We have used C-V measurements ot determine the effective doping concentration and depletion layer widths in the passivated and unpassivated devices. We find that passivation reduces the effective doping concentration and therefore increases the depletion layer width. Although this change in effective doping concentration is small (less thean a factor of 2), the increase in depletion layer width is sufficient to pinch off the passivated device but not the unpassivated one. This leads to the dramatic reduction in leakage currents after passivation.


2018 ◽  
Vol 51 (20) ◽  
pp. 205303 ◽  
Author(s):  
Yu Bai ◽  
Zhan Jie Wang ◽  
Jian Zhong Cui ◽  
Zhi Dong Zhang

2015 ◽  
Vol 220 ◽  
pp. 1354-1360 ◽  
Author(s):  
Jianqiao Liu ◽  
Xuesong Liu ◽  
Zhaoxia Zhai ◽  
Guohua Jin ◽  
Qiuxuan Jiang ◽  
...  

2012 ◽  
Vol 171-172 ◽  
pp. 230-237 ◽  
Author(s):  
Ekasiddh Wongrat ◽  
Niyom Hongsith ◽  
Duangmanee Wongratanaphisan ◽  
Atcharawon Gardchareon ◽  
Supab Choopun

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