Straightforward electrical measurement of forward-voltage to investigate thermal effects in InGaN/GaN high-brightness light-emitting diodes
2014 ◽
Vol 32
(6)
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pp. 061209
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1995 ◽
Vol 187
(2)
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pp. 467-470
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2008 ◽
Vol 20
(8)
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pp. 659-661
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2014 ◽
Vol 50
(11)
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pp. 911-920
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