Radiofrequency pulsed glow discharge-ToFMS depth profiling of a CdTe solar cell: A comparative study versus time of flight secondary ion mass spectrometry

2013 ◽  
Vol 31 (6) ◽  
pp. 06F106 ◽  
Author(s):  
Cristina Gonzalez-Gago ◽  
Jorge Pisonero ◽  
Nerea Bordel ◽  
Alfredo Sanz-Medel ◽  
Nicole J. Tibbetts ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Solar Cell ◽  
Glow Discharge ◽  
Comparative Study ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Depth Profiling ◽  
Pulsed Glow Discharge ◽  
Cdte Solar Cell ◽  
Secondary Ion

Depth profiling by pulsed glow discharge time-of-flight mass spectrometry with a combined hollow cathode cell

2020 ◽  
Vol 35 (8) ◽  
pp. 1587-1596
Author(s):  
Anna Gubal ◽  
Victoria Chuchina ◽  
Yegor Lyalkin ◽  
Vladimir Mikhailovskii ◽  
Viktor Yakobson ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Glow Discharge ◽  
Hollow Cathode ◽  
Time Of Flight ◽  
Depth Profiling ◽  
Discharge Time ◽  
Pulsed Glow Discharge ◽  
Flight Mass Spectrometry ◽  
Depth Analysis ◽  
Mass Spectrometry System

A combined hollow cathode microsecond direct current pulsed glow discharge time-of-flight mass spectrometry system has proved its efficiency for quantification; however, it has not been properly tested for the purpose of depth analysis.

scholarly journals Enhancing Ion Yields in Time-of-Flight-Secondary Ion Mass Spectrometry: A Comparative Study of Argon and Water Cluster Primary Beams

2015 ◽  
Vol 87 (4) ◽  
pp. 2367-2374 ◽  
Author(s):  
Sadia Sheraz née Rabbani ◽  
Irma Berrueta Razo ◽  
Taylor Kohn ◽  
Nicholas P. Lockyer ◽  
John C. Vickerman
Keyword(s):  
Mass Spectrometry ◽  
Comparative Study ◽  
Water Cluster ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Ion Mass Spectrometry ◽  
Ion Yields ◽  
Secondary Ion
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