Stable field emission of single B-doped Si tips and linear current scaling of uniform tip arrays for integrated vacuum microelectronic devices

2013 ◽  
Vol 31 (2) ◽  
pp. 02B101 ◽  
Author(s):  
Pavel Serbun ◽  
Benjamin Bornmann ◽  
Aliaksandr Navitski ◽  
Günter Müller ◽  
Christian Prommesberger ◽  
...  
Keyword(s):  
Field Emission ◽  
Microelectronic Devices ◽  
Linear Current ◽  
Vacuum Microelectronic ◽  
Stable Field

Improved Performance of Field Emission Vacuum Microelectronic Devices for Integrated Circuits

2016 ◽  
Vol 63 (9) ◽  
pp. 3753-3760 ◽  
Author(s):  
Erich J. Radauscher ◽  
Kristin Hedgepath Gilchrist ◽  
Shane T. Di Dona ◽  
Zachary E. Russell ◽  
Jeffrey R. Piascik ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Field Emission ◽  
Microelectronic Devices ◽  
Vacuum Microelectronic ◽  
Improved Performance

A Stable Field Emission Electron Source

1977 ◽  
Vol 35 ◽  
pp. 58-59
Author(s):  
W.R. Bottoms ◽  
G.B. Haydon
Keyword(s):  
Field Emission ◽  
Signal To Noise Ratio ◽  
High Brightness ◽  
Electron Sources ◽  
Brightness Field ◽  
Current Densities ◽  
Properties Of Materials ◽  
Stable Field ◽  
Stable Current ◽  
Careful Design

There is great interest in improving the brightness of electron sources and therefore the ability of electron optical instrumentation to probe the properties of materials. Extensive work by Dr. Crew and others has provided extremely high brightness sources for certain kinds of analytical problems but which pose serious difficulties in other problems. These sources cannot survive in conventional system vacuums. If one wishes to gather information from the other signal channels activated by electron beam bombardment it is necessary to provide sufficient current to allow an acceptable signal-to-noise ratio. It is possible through careful design to provide a high brightness field emission source which has the capability of providing high currents as well as high current densities to a specimen. In this paper we describe an electrode to provide long-lived stable current in field emission sources.The source geometry was based upon the results of extensive computer modeling. The design attempted to maximize the total current available at a specimen.

Stable field-emission from a CeB6 nanoneedle point electron source

Nanoscale ◽  
2021 ◽  
Author(s):  
Shuai Tang ◽  
Jie Tang ◽  
Yimeng Wu ◽  
You-Hu Chen ◽  
Jun Uzuhashi ◽  
...  
Keyword(s):  
Field Emission ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Electron Source ◽  
Emission Current ◽  
Field Emission Current ◽  
Stable Field ◽  
Single Emission

A single CeB6 nanoneedle structure has been fabricated using a focused ion beam (FIB) and it shows an excellent field emission current stability as well as a single emission spot.

Stable field emission from nanoporous silicon carbide

2013 ◽  
Vol 24 (6) ◽  
pp. 065201 ◽  
Author(s):  
Myung-Gyu Kang ◽  
Henri J Lezec ◽  
Fred Sharifi
Keyword(s):  
Silicon Carbide ◽  
Field Emission ◽  
Nanoporous Silicon ◽  
Stable Field

Effects of Hydrogen Post Treatment and Duty Factor on Carbon Nanotube Field Emission Stability

2006 ◽  
Vol 963 ◽  
Author(s):  
Sigen Wang ◽  
Sha Chang
Keyword(s):  
Field Emission ◽  
Hydrogen Plasma ◽  
Post Treatment ◽  
Emission Current ◽  
Duty Factor ◽  
Electron Sources ◽  
Emission Stability ◽  
High Emission ◽  
Microwave Power Amplifier ◽  
Stable Field

ABSTRACTCarbon nanotubes (CNTs) have been investigated as field emission electron sources for a number of applications such as x-ray source and microwave power amplifier. These applications often require that nanotubes provide a stable field emission at a high emission current. In this paper, we investigated the emission stability of CNTs as functions of hydrogen post-treatment and duty factor. The experimental results show that the hydrogen plasma treatment and a reduced duty cycle from 100% to 35% can noticeably improve the emission stability of CNTs at a high current value of 4 mA. Our study also shows that emission induced anode heating at high duty factor and high emission current level degrades vacuum level and thus the emission stability of CNTs.

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