ac heating–dc detecting method for Seebeck coefficient measurement of the thermoelectric micro/nano devices

Tingting Miao; Weigang Ma; Xing Zhang

doi:10.1116/1.4750497

ac heating–dc detecting method for Seebeck coefficient measurement of the thermoelectric micro/nano devices

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.4750497 ◽

2012 ◽

Vol 30 (5) ◽

pp. 051804 ◽

Cited By ~ 6

Author(s):

Tingting Miao ◽

Weigang Ma ◽

Xing Zhang

Keyword(s):

Seebeck Coefficient ◽

Coefficient Measurement ◽

Detecting Method

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Seebeck Coefficient Measurement in Amorphous Alloys

Advances in Intelligent Systems and Computing - Mechatronics 2019: Recent Advances Towards Industry 4.0 ◽

10.1007/978-3-030-29993-4_38 ◽

2019 ◽

pp. 310-315

Author(s):

Dariusz T. Grudziński ◽

Łukasz Jaśkowski ◽

Michał Nowicki

Keyword(s):

Seebeck Coefficient ◽

Amorphous Alloys ◽

Coefficient Measurement

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The fabrication of thermoelectric La0.95Sr0.05CoO3nanofibers and Seebeck coefficient measurement

Nanotechnology ◽

10.1088/0957-4484/21/39/395303 ◽

2010 ◽

Vol 21 (39) ◽

pp. 395303 ◽

Cited By ~ 19

Author(s):

Weihe Xu ◽

Yong Shi ◽

Hamid Hadim

Keyword(s):

Seebeck Coefficient ◽

Coefficient Measurement

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Low temperature Seebeck coefficient measurement: Possible sources of uncertainty and spurious emf

Twenty-First International Conference on Thermoelectrics, 2002. Proceedings ICT '02. ◽

10.1109/ict.2002.1190340 ◽

2003 ◽

Author(s):

K.M. Sivakumar ◽

R.K. Singh ◽

N.K. Gaur ◽

V. Shelke

Keyword(s):

Low Temperature ◽

Seebeck Coefficient ◽

Sources Of Uncertainty ◽

Coefficient Measurement

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A simple and sensitive apparatus for Seebeck coefficient measurement down to 77 K

Twenty-First International Conference on Thermoelectrics, 2002. Proceedings ICT '02. ◽

10.1109/ict.2002.1190334 ◽

2003 ◽

Author(s):

K.M. Sivakumar ◽

R.K. Singh ◽

N.K. Gaur ◽

V. Ganesan

Keyword(s):

Seebeck Coefficient ◽

Coefficient Measurement

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Fabrication of a simple apparatus for the Seebeck coefficient measurement in temperature range 300-600 K

10.1063/1.4980411 ◽

2017 ◽

Author(s):

Saurabh Singh ◽

Sudhir K. Pandey

Keyword(s):

Seebeck Coefficient ◽

Simple Apparatus ◽

Temperature Range ◽

Coefficient Measurement

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Construction of Seebeck-coefficient measurement by Kelvin-probe force microscopy

10.1063/1.4731575 ◽

2012 ◽

Cited By ~ 1

Author(s):

Hiroya Ikeda ◽

Kazutoshi Miwa ◽

Faiz Salleh

Keyword(s):

Seebeck Coefficient ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Coefficient Measurement

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Precise absolute Seebeck coefficient measurement and uncertainty analysis using high-Tc superconductors as a reference

Review of Scientific Instruments ◽

10.1063/1.5122226 ◽

2020 ◽

Vol 91 (1) ◽

pp. 014903

Author(s):

Y. Amagai ◽

T. Shimazaki ◽

K. Okawa ◽

T. Kawae ◽

H. Fujiki ◽

...

Keyword(s):

Seebeck Coefficient ◽

Uncertainty Analysis ◽

High Tc Superconductors ◽

High Tc ◽

Coefficient Measurement ◽

Absolute Seebeck Coefficient

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Fabrication of Thermoelectric La0.95Sr0.05CoO3 Thin Film and Seebeck Coefficient Measurement

ASME/JSME 2011 8th Thermal Engineering Joint Conference ◽

10.1115/ajtec2011-44554 ◽

2011 ◽

Author(s):

Weihe Xu ◽

Qi Chen ◽

Yong Shi ◽

Hamid Hadim

Keyword(s):

Thin Film ◽

Seebeck Coefficient ◽

Spin Coating ◽

Complex Oxide ◽

Perovskite Oxides ◽

Voltage Output ◽

Custom Made ◽

Coefficient Measurement ◽

Micro Electromechanical System ◽

P Type

The P-type perovskite oxides La1-xSrxCoO3 are a promising group of complex oxide thermoelectric (TE) materials because of its a higher Seebeck coefficient. In this paper, the La0.95Sr0.05CoO3 thin film was prepared by spin coating. A custom-made MEMS (micro-electromechanical system) based device was used to measure the voltage output and Seebeck coefficient of the thin film. The measured Seebeck coefficient of the thin film was 350 μV/K.

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