scholarly journals Development of a compact neutron source based on field ionization processes

2011 ◽  
Vol 29 (2) ◽  
pp. 02B107 ◽  
Author(s):  
Arun Persaud ◽  
Ian Allen ◽  
Michael R. Dickinson ◽  
Thomas Schenkel ◽  
Rehan Kapadia ◽  
...  
Keyword(s):  
Neutron Source ◽  
Field Ionization ◽  
Ionization Processes

scholarly journals Field-ionization processes in high Rydberg states of Rb under a rotating electric field

2005 ◽  
Vol 72 (3) ◽  
Author(s):  
S. Yamada ◽  
H. Funahashi ◽  
M. Shibata ◽  
K. Kominato ◽  
Y. Kishimoto ◽  
...  
Keyword(s):  
Electric Field ◽  
Rydberg States ◽  
Field Ionization ◽  
Ionization Processes

Field ionization processes in field ion microscopy

1972 ◽  
Vol 33 (3) ◽  
pp. 525-534 ◽  
Author(s):  
Iwasaki Hiroshi ◽  
Nakamura Shogo
Keyword(s):  
Field Ionization ◽  
Field Ion Microscopy ◽  
Ionization Processes ◽  
Ion Microscopy

Field-Ionization Processes in Excited Atoms

1978 ◽  
Vol 41 (2) ◽  
pp. 103-107 ◽  
Author(s):  
Michael G. Littman ◽  
Michael M. Kash ◽  
Daniel Kleppner
Keyword(s):  
Field Ionization ◽  
Excited Atoms ◽  
Ionization Processes

Field-assisted ionization theory for microscopists

1994 ◽  
Vol 52 ◽  
pp. 820-821
Author(s):  
Patrick P. Camus
Keyword(s):  
Electric Field ◽  
Electron Tunneling ◽  
Ionization Probability ◽  
Critical Distance ◽  
Tunneling Probability ◽  
Field Ionization ◽  
Radius Of Curvature ◽  
Field Evaporation ◽  
A Value ◽  
Ion Emission

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).

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