Transmission electron microscopy study of damage layer formed through ion beam induced deposition of platinum on silicon substrate

2010 ◽  
Vol 28 (6) ◽  
pp. C6F31-C6F37 ◽  
Author(s):  
Byong Chon Park ◽  
Yun Chang Park ◽  
Hwack Joo Lee ◽  
Young Heon Kim
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Silicon Substrate ◽  
Ion Beam ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Transmission Electron Microscopy Study ◽  
Damage Layer ◽  
Transmission Electron

scholarly journals Transmission Electron Microscopy Study on the Crystallization of Ion Beam Assisted Deposited CoFeB/MgO/CoFeB Magnetic Tunnel Junctions with Tantalum Capping Layer

2011 ◽  
Vol 17 (S2) ◽  
pp. 1860-1861
Author(s):  
R Petrova ◽  
R Ferreira ◽  
S Cardoso ◽  
P Freitas ◽  
S McVitie ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Tunnel Junctions ◽  
Ion Beam ◽  
Magnetic Tunnel Junctions ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Transmission Electron Microscopy Study ◽  
Capping Layer ◽  
Transmission Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Transmission electron microscopy study on ion-beam-synthesized amorphous Fe–Si thin layers

2005 ◽  
Vol 87 (24) ◽  
pp. 241905 ◽  
Author(s):  
Muneyuki Naito ◽  
Manabu Ishimaru ◽  
Yoshihiko Hirotsu ◽  
James A. Valdez ◽  
Kurt E. Sickafus
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Ion Beam ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Thin Layers ◽  
Transmission Electron Microscopy Study ◽  
Transmission Electron
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