Influence of reactive sputter deposition conditions on crystallization of zirconium oxide thin films

2009 ◽  
Vol 27 (3) ◽  
pp. 577-583 ◽  
Author(s):  
Guneet Sethi ◽  
Paul Sunal ◽  
Mark W. Horn ◽  
Michael T. Lanagan
2017 ◽  
Vol 56 (8) ◽  
pp. 088004 ◽  
Author(s):  
Yoshio Abe ◽  
Shun Yamauchi ◽  
Midori Kawamura ◽  
Kyung Ho Kim ◽  
Takayuki Kiba ◽  
...  

1991 ◽  
Vol 250 (1-3) ◽  
pp. A288
Author(s):  
V. Maurice ◽  
K. Takeuchi ◽  
M. Salmeron ◽  
G.A. Somorjai

Author(s):  
Ah-Jin Cho ◽  
Jihoon Jeon ◽  
Hong Keun Chung ◽  
In-Hwan Baek ◽  
Kun Yang ◽  
...  

2007 ◽  
Vol 1035 ◽  
Author(s):  
Eliana Kaminska ◽  
Anna Piotrowska ◽  
Marie-Antoinette di Forte Poisson ◽  
Sylvain Delage ◽  
Hacene Lahreche ◽  
...  

AbstractThe fabrication of high-resistivity ZnO-based thin films lattice-matched to AlGaN/GaN structures has been developed. It relies on low-temperature reactive sputter deposition of ZnO:Sb from ZnSb target. Taking into account the hygroscopic nature of ZnO surface, an additional coating by Si3N4 films is applied to ensure the humidity protecition. The developped passivation suppresses leakage currents in Schottky diods, and substantially improves output characteristics of AlGaN/GaN HEMT.


1994 ◽  
Vol 18 (5-6) ◽  
pp. 251-256 ◽  
Author(s):  
M.J. O'Keefe ◽  
J.M. Rigsbee

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