Interfacial and electrical properties of Zr[sub x]Ti[sub 1−x]O[sub 4] (x=0.66) films deposited by liquid-delivery metal organic chemical vapor deposition to be used as high-k gate dielectric
2008 ◽
Vol 26
(4)
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pp. 1338
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2017 ◽
Vol 56
(10S)
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pp. 10PF12
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2013 ◽
Vol 52
(8S)
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pp. 08JB04
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2014 ◽
Vol 24
(10)
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pp. 543-549
1996 ◽
Vol 35
(Part 1, No. 9B)
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pp. 4890-4895
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2005 ◽
Vol 44
(No. 39)
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pp. L1231-L1233
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