High-precision determination of lattice constants and structural characterization of InN thin films
2006 ◽
Vol 24
(2)
◽
pp. 275-279
◽
2012 ◽
Vol 273
◽
pp. 105-108
◽
2009 ◽
Vol 35
(3)
◽
pp. 263-266
◽
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