Thickness dependence of structural and electrical characteristics of ZrO[sub 2] thin films as grown on Si by chemical-vapor deposition

Author(s):  
Shih-Sian Huang ◽  
Tai-Bor Wu
2003 ◽  
Vol 82 (24) ◽  
pp. 4319-4321 ◽  
Author(s):  
A. V. Pogrebnyakov ◽  
J. M. Redwing ◽  
J. E. Jones ◽  
X. X. Xi ◽  
S. Y. Xu ◽  
...  

2014 ◽  
Vol 558 ◽  
pp. 112-117 ◽  
Author(s):  
Veronica S. Sulyaeva ◽  
Marina L. Kosinova ◽  
Yurii M. Rumyantsev ◽  
Fedor A. Kuznetsov ◽  
Valerii G. Kesler ◽  
...  

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