Batch fabricated scanning near field optical microscope/atomic force microscopy microprobe integrated with piezoresistive cantilever beam with highly reproducible focused ion beam micromachined aperture
2004 ◽
Vol 22
(1)
◽
pp. 16
◽
Keyword(s):
Ion Beam
◽
High aspect ratio all diamond tips formed by focused ion beam for conducting atomic force microscopy
1999 ◽
Vol 17
(4)
◽
pp. 1570
◽
Keyword(s):
Ion Beam
◽