Growth and trends in Auger-electron spectroscopy and x-ray photoelectron spectroscopy for surface analysis

C. J. Powell

doi:10.1116/1.1599862

Growth and trends in Auger-electron spectroscopy and x-ray photoelectron spectroscopy for surface analysis

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.1599862 ◽

2003 ◽

Vol 21 (5) ◽

pp. S42-S53 ◽

Cited By ~ 26

Author(s):

C. J. Powell

Keyword(s):

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray

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International Standardization of Quantitative Surface Analysis by Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy

Shinku ◽

10.3131/jvsj.48.261 ◽

2005 ◽

Vol 48 (4) ◽

pp. 261-264

Author(s):

Shigeo TANUMA

Keyword(s):

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Quantitative Surface Analysis ◽

International Standardization

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Growth of Surface Analysis and the Development of Databases and Modeling Software for Auger-Electron Spectroscopy and X-ray Photoelectron Spectroscopy

Microscopy Today ◽

10.1017/s1551929516000080 ◽

2016 ◽

Vol 24 (2) ◽

pp. 16-23 ◽

Cited By ~ 12

Author(s):

C. J. Powell

Keyword(s):

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Modeling Software

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Surface analysis: x-ray photoelectron spectroscopy and Auger electron spectroscopy

Analytical Chemistry ◽

10.1021/ac00036a017 ◽

1992 ◽

Vol 64 (12) ◽

pp. 302-320 ◽

Cited By ~ 14

Author(s):

Noel H. Turner ◽

John A. Schreifels

Keyword(s):

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray

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Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy, and secondary ion mass spectrometry

Analytical Chemistry ◽

10.1021/ac00242a027 ◽

1982 ◽

Vol 54 (5) ◽

pp. 293-322 ◽

Cited By ~ 44

Author(s):

Noel H. Turner ◽

Richard J. Colton

Keyword(s):

Mass Spectrometry ◽

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Surface Analysis: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy

Analytical Chemistry ◽

10.1021/a19600146 ◽

1996 ◽

Vol 68 (12) ◽

pp. 309-332 ◽

Cited By ~ 16

Author(s):

Noel H. Turner ◽

John A. Schreifels

Keyword(s):

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray

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Quantitative surface analysis by X-ray photoelectron spectroscopy and X-ray excited auger electron spectroscopy

Microchimica Acta ◽

10.1007/bf01244157 ◽

1990 ◽

Vol 101 (1-6) ◽

pp. 49-54 ◽

Cited By ~ 2

Author(s):

Maria F. Ebel ◽

Horst Ebel

Keyword(s):

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Quantitative Surface Analysis

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Surface Analysis: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy

Analytical Chemistry ◽

10.1021/a10000110 ◽

2000 ◽

Vol 72 (12) ◽

pp. 99-110 ◽

Cited By ~ 31

Author(s):

Noel H. Turner ◽

John A. Schreifels

Keyword(s):

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray

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Formalism and parameters for quantitative surface analysis by Auger electron spectroscopy and x-ray photoelectron spectroscopy

Surface and Interface Analysis ◽

10.1002/sia.740200906 ◽

1993 ◽

Vol 20 (9) ◽

pp. 771-786 ◽

Cited By ~ 91

Author(s):

A. Jablonski ◽

C. J. Powell

Keyword(s):

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Quantitative Surface Analysis

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NIST data resources for surface analysis by X-ray photoelectron spectroscopy and Auger electron spectroscopy

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/s0368-2048(00)00252-8 ◽

2001 ◽

Vol 114-116 ◽

pp. 1097-1102 ◽

Cited By ~ 25

Author(s):

C.J. Powell ◽

A. Jablonski ◽

A. Naumkin ◽

A. Kraut-Vass ◽

J.M. Conny ◽

...

Keyword(s):

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray

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ChemInform Abstract: SURFACE ANALYSIS: X-RAY PHOTOELECTRON SPECTROSCOPY, AUGER ELECTRON SPECTROSCOPY, AND SECONDARY ION MASS SPECTROMETRY

Chemischer Informationsdienst ◽

10.1002/chin.198249370 ◽

1982 ◽

Vol 13 (49) ◽

Author(s):

N. H. TURNER ◽

R. J. COLTON

Keyword(s):

Mass Spectrometry ◽

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion

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