Interfacial reaction pathways and kinetics during annealing of 111-textured Al/TiN bilayers: A synchrotron x-ray diffraction and transmission electron microscopy study

J.-S. Chun; P. Desjardins; C. Lavoie; I. Petrov; C. Cabral; J. E. Greene

doi:10.1116/1.1379800

Interfacial reaction pathways and kinetics during annealing of 111-textured Al/TiN bilayers: A synchrotron x-ray diffraction and transmission electron microscopy study

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.1379800 ◽

2001 ◽

Vol 19 (5) ◽

pp. 2207-2216 ◽

Cited By ~ 11

Author(s):

J.-S. Chun ◽

P. Desjardins ◽

C. Lavoie ◽

I. Petrov ◽

C. Cabral ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Interfacial Reaction ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Reaction Pathways ◽

X Ray Diffraction ◽

Transmission Electron Microscopy Study ◽

X Ray ◽

Transmission Electron

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Dopant deactivation in heavily Sb doped Si (001): A high-resolution x-ray diffraction and transmission electron microscopy study

Journal of Applied Physics ◽

10.1063/1.1510953 ◽

2002 ◽

Vol 92 (9) ◽

pp. 5503-5507 ◽

Cited By ~ 22

Author(s):

Yayoi Takamura ◽

Arturas Vailionis ◽

Ann F. Marshall ◽

Peter B. Griffin ◽

James D. Plummer

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

Electron Microscopy Study ◽

X Ray Diffraction ◽

Transmission Electron Microscopy Study ◽

X Ray ◽

Transmission Electron ◽

Dopant Deactivation

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Base Metal Catalyzed Graphitization of Cellulose: A Combined Raman Spectroscopy, Temperature-Dependent X-ray Diffraction and High-Resolution Transmission Electron Microscopy Study

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.5b00477 ◽

2015 ◽

Vol 119 (19) ◽

pp. 10653-10661 ◽

Cited By ~ 67

Author(s):

Jacco Hoekstra ◽

Andrew M. Beale ◽

Fouad Soulimani ◽

Marjan Versluijs-Helder ◽

John W. Geus ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

X Ray Diffraction ◽

Temperature Dependent ◽

Transmission Electron Microscopy Study ◽

X Ray ◽

Transmission Electron ◽

Metal Catalyzed

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X-ray diffraction and transmission electron microscopy study of recovery and recrystallization in niobium and niobium--40 vanadium

10.2172/4653374 ◽

1972 ◽

Author(s):

Paul Vincent Guthrie, Jr.

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

X Ray Diffraction ◽

Transmission Electron Microscopy Study ◽

X Ray ◽

Transmission Electron

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Reactive magnetron sputtering of molybdenum sulfide thin films:In situsynchrotron x-ray diffraction and transmission electron microscopy study

Journal of Applied Physics ◽

10.1063/1.1736323 ◽

2004 ◽

Vol 95 (12) ◽

pp. 7665-7673 ◽

Cited By ~ 14

Author(s):

V. Weiss ◽

W. Bohne ◽

J. Röhrich ◽

E. Strub ◽

U. Bloeck ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Molybdenum Sulfide ◽

Electron Microscopy Study ◽

Reactive Magnetron ◽

X Ray Diffraction ◽

Transmission Electron Microscopy Study ◽

X Ray ◽

Transmission Electron

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An X-ray diffraction and transmission electron microscopy study of Pt–Ru fuel cell catalysts before and after operation

Journal of Applied Electrochemistry ◽

10.1023/b:jach.0000015674.49162.3f ◽

2004 ◽

Vol 34 (3) ◽

pp. 345-348 ◽

Cited By ~ 10

Author(s):

C. Roth ◽

N. Martz ◽

H. Fuess

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

X Ray Diffraction ◽

Transmission Electron Microscopy Study ◽

X Ray ◽

Transmission Electron ◽

Fuel Cell Catalysts ◽

Before And After

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X-ray diffraction and transmission electron microscopy study of extremely large-period polytypes in SiC

Acta Crystallographica Section A ◽

10.1107/s0567739477000692 ◽

1977 ◽

Vol 33 (2) ◽

pp. 276-279 ◽

Cited By ~ 26

Author(s):

M. Dubey ◽

G. Singh ◽

G. Van Tendeloo

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

X Ray Diffraction ◽

Transmission Electron Microscopy Study ◽

X Ray ◽

Transmission Electron ◽

Large Period

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Possible room-temperature ferromagnetism in K-dopedSnO2: X-ray diffraction and high-resolution transmission electron microscopy study

Physical Review B ◽

10.1103/physrevb.82.193203 ◽

2010 ◽

Vol 82 (19) ◽

Cited By ~ 33

Author(s):

S. K. Srivastava ◽

P. Lejay ◽

B. Barbara ◽

S. Pailhès ◽

V. Madigou ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Room Temperature ◽

Room Temperature Ferromagnetism ◽

Microscopy Study ◽

Electron Microscopy Study ◽

X Ray Diffraction ◽

Transmission Electron Microscopy Study ◽

X Ray ◽

Transmission Electron

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Small angle X-ray scattering and transmission electron microscopy study of theLactobacillus brevisS-layer protein

Journal of Physics Conference Series ◽

10.1088/1742-6596/247/1/012017 ◽

2010 ◽

Vol 247 ◽

pp. 012017 ◽

Cited By ~ 1

Author(s):

Pentti Jääskeläinen ◽

Peter Engelhardt ◽

Ulla Hynönen ◽

Mika Torkkeli ◽

Airi Palva ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Small Angle ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

X Ray ◽

X Ray Scattering ◽

Transmission Electron ◽

Ray Scattering

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Two-dimensional X-ray diffraction and transmission electron microscopy study on the effect of magnetron sputtering atmosphere on GaN/SiC interface and gallium nitride thin film crystal structure

Journal of Applied Physics ◽

10.1063/1.4914955 ◽

2015 ◽

Vol 117 (11) ◽

pp. 115301 ◽

Cited By ~ 2

Author(s):

Huaxiang Shen ◽

Guo-Zhen Zhu ◽

Gianluigi A. Botton ◽

Adrian Kitai

Keyword(s):

Thin Film ◽

Crystal Structure ◽

Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Two Dimensional ◽

X Ray Diffraction ◽

Transmission Electron Microscopy Study ◽

X Ray ◽

Transmission Electron

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High-resolution x-ray diffraction, x-ray standing-wave, and transmission electron microscopy study of Sb-based single-quantum-well structures

Journal of Applied Physics ◽

10.1063/1.373058 ◽

2000 ◽

Vol 87 (9) ◽

pp. 4234-4239 ◽

Cited By ~ 5

Author(s):

E. Kh. Mukhamedzhanov ◽

C. Bocchi ◽

S. Franchi ◽

A. Baraldi ◽

R. Magnanini ◽

...

Keyword(s):

Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Single Quantum ◽

X Ray Diffraction ◽

Transmission Electron Microscopy Study ◽

Single Quantum Well ◽

Quantum Well Structures ◽

X Ray ◽

Transmission Electron

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