The Effect of Microstructure on Tensile Behaviour of X80 Microalloyed Steel

2012 ◽  
Author(s):  
Katherine Jonsson ◽  
Douglas G. Ivey ◽  
Hani Henein ◽  
Shahrooz Nafisi ◽  
Laurie Collins ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thermal Treatment ◽  
Work Hardening ◽  
Elevated Temperatures ◽  
Ion Beam ◽  
Hold Time ◽  
Tensile Behaviour ◽  
Microstructural Development ◽  
Line Pipe ◽  
Effect Of Microstructure

A high degree of work hardening is desirable for steels to be employed in strain-based pipeline designs. In an effort to enhance work hardening characteristics, this study was conducted to determine the effect of thermal treatment on microstructural development and the subsequent relationship between microstructure and tensile behaviour of high strength microalloyed line pipe steel. A series of thermal schedules was applied to X80 steel samples using a Gleeble thermo-mechanical simulator in order to generate a variety of microstructures. The microstructures were quantified by calculating the phase fraction of individual phases using scanning electron microscopy (SEM). A focused ion beam (FIB) instrument was used to prepare electron transparent samples of specific grains that were characterized using transmission electron microscopy (TEM). The X80 microstructures were composed mostly of bainitic and ferritic grains with isolated pockets of martensite and M-A islands due to local carbon segregation. The effect of thermal treatment on microstructural evolution was determined based on varying the interrupt temperature, re-heat temperature and hold time at elevated temperatures. The overall effect of microstructure on the mechanical properties was evaluated, with a particular focus on hardness values and the shape of the stress-strain curves. The effect of thermal history and microstructure development on the work hardening characteristics was also determined.

Microscopic characterisation of synthetic Terra Preta

Soil Research ◽  
2010 ◽  
Vol 48 (7) ◽  
pp. 593 ◽  
Author(s):  
Chee Hung Chia ◽  
Paul Munroe ◽  
Stephen Joseph ◽  
Yun Lin
Keyword(s):  
Electron Microscopy ◽  
Photoelectron Spectroscopy ◽  
Elevated Temperatures ◽  
Raw Materials ◽  
Chicken Manure ◽  
Microstructural Development ◽  
Cement Kiln ◽  
Organic Carbon Content ◽  
Terra Preta ◽  
High Organic Carbon Content

Amazonian Dark Earths (Terra Preta) are anthropogenic soils with high organic carbon content and the ability to sustain higher fertility than adjacent, intensely weathered, acidic soils. Consequently, the microstructural development of biochar–mineral complexes, termed synthetic Terra Preta (STP), has been investigated. Here, biochar–mineral complexes are produced at elevated temperatures to mimic the structure of Terra Preta. These materials, if added to soils, may then also improve fertility. The raw materials used in STP were organic biowaste, such as sawdust, chicken manure, and blood and bone, and inorganic minerals such as kaolinite, bentonite, and cement kiln dust (which consists mainly of calcite). The STP samples were characterised using X-ray photoelectron spectroscopy, nuclear magnetic resonance, scanning electron microscopy (SEM), and transmission electron microscopy (TEM), and associated microchemical analytical methods, to gain an understanding of the interactions that occurred during processing between the organic and inorganic phases. The STP specimens exhibited microstructures that closely resemble Terra Preta. SEM and TEM revealed a complex aggregation of phases, together with evidence of the interfacial reactions, especially at higher processing temperatures. It is anticipated then that STP may be as effective in promoting plant growth and in sequestering carbon as Terra Preta

Microstructural Development in Ion Beam Assisted Evaporation of Ni, Co and Fe Films

1990 ◽  
Vol 202 ◽  
Author(s):  
J.A. Trogolo ◽  
R.A. Roy ◽  
R. Petkie ◽  
J.J. Cuomo ◽  
K. Rajan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Ion Beam ◽  
Ion Bombardment ◽  
Metal Films ◽  
Electron Beam Evaporation ◽  
Microstructural Development ◽  
Transmission Electron ◽  
Argon Ion Bombardment ◽  
Argon Ion

ABSTRACTThe development of microstructure in metal films deposited by ion-assisted evaporation has been studied by transmission electron microscopy (TEM). Films of Ni, Co, and Fe of about 350 to 500 nm thickness were deposited by electron beam evaporation with concurrent argon ion bombardment during growth. Films grown at high ion/atom ratios develop compressive stress as revealed by lattice dilatation. The trends in grain size, orientation, and shape as a function of ion bombardment are documented by TEM.

Selected Observations in Phase Constituents, Growth Kinetics and Microstructural Development of Aluminides in U-Mo vs. Al and 6061 Diffusion Couples Annealed at 600°C

2009 ◽  
Vol 289-292 ◽  
pp. 41-49 ◽  
Author(s):  
E. Perez ◽  
Dennis D. Keiser ◽  
Yong Ho Sohn
Keyword(s):  
Electron Microscopy ◽  
Growth Kinetics ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Microstructural Analysis ◽  
Microstructural Development ◽  
Diffusion Couples ◽  
Solid Diffusion ◽  
Transmission Electron ◽  
Multi Phase

This paper presents selected experimental observations of phase constituents, growth kinetics, and microstructural development of aluminide phases that develop in solid-to-solid diffusion couples assembled with U-7wt.%Mo, U-10wt.%Mo and U-12wt.%Mo vs. Al and 6061 alloy after a diffusion anneal at 600°C for 24 hours. Scanning electron microscopy coupled with energy dispersive spectroscopy, electron microprobe analysis, and transmission electron microscopy via focused ion beam in-situ lift-out were employed to characterize the interaction layer that develops by interdiffusion. While concentration profiles exhibited no significant gradients, microstructural analysis revealed the presence of extremely complex and nano-scale phase constituents with presence of orthorhombic--U, cubic-UAl3, orthorhombic-UAl4, hexagonal-U6Mo4Al43 and diamond cubic-UMo2Al20 phases. Presence of multi-phase layers with microstructure, which suggest a significant role of grain boundary diffusion, was observed.

The Roles of Energetic Displacement Cascades in Ion Beam Modifications of Materials

1986 ◽  
Vol 74 ◽  
Author(s):  
R. S. Averback ◽  
S. -J. Kim ◽  
T. Diaz de la Rubia
Keyword(s):  
Point Defects ◽  
Elevated Temperatures ◽  
Ion Beam ◽  
Experimental Studies ◽  
Structural Disorder ◽  
Microstructural Development ◽  
Enhanced Diffusion ◽  
Displacement Cascades ◽  
Radiation Enhanced Diffusion ◽  
Cascade Processes

AbstractThe roles of energetic displacement cascades are ubiquitous in the fields of radiation damage and ion beam modifications of materials. These roles can be described on two time scales. For the first, which lasts ≈ 10-11 s, small cascade volumes are characterized by large supersaturations of point defects, structural disorder, and energy densities in excess of some tenths of eV's per atom. During this period, the system can be driven far from equilibrium with significant rearrangement of target atoms and the production of Frenkel pairs. Experimental studies of ion beam mixing in conjunction with molecular dynamics computer simulations, have contributed largely toward understanding these dynamic cascade processes. At later times, the microstructure of the material evolves as cascades begin to overlap, or at elevated temperatures, point defects migrate away from their nascent cascades. It will be shown how the primary state of damage in cascades influences this microstructural development. Examples involving radiation-enhanced diffusion and ion-induced amorphization will be discussed.

Characterization of Rare-Earth Fluoride Anti-Stokes Phosphors by Scanning arid Transmission Electron Microscopy

1971 ◽  
Vol 29 ◽  
pp. 142-143
Author(s):  
N. M. P. Low ◽  
L. E. Brosselard
Keyword(s):  
Electron Microscopy ◽  
Rare Earth ◽  
Elevated Temperatures ◽  
Stoichiometric Composition ◽  
Rare Earth Ions ◽  
Crystalline Solid ◽  
Precipitation Process ◽  
Rare Earth Fluoride ◽  
Earth Fluoride ◽  
Rare Earth Fluorides

There has been considerable interest over the past several years in materials capable of converting infrared radiation to visible light by means of sequential excitation in two or more steps. Several rare-earth trifluorides (LaF3, YF3, GdF3, and LuF3) containing a small amount of other trivalent rare-earth ions (Yb3+ and Er3+, or Ho3+, or Tm3+) have been found to exhibit such phenomenon. The methods of preparation of these rare-earth fluorides in the crystalline solid form generally involve a co-precipitation process and a subsequent solid state reaction at elevated temperatures. This investigation was undertaken to examine the morphological features of both the precipitated and the thermally treated fluoride powders by both transmission and scanning electron microscopy.Rare-earth oxides of stoichiometric composition were dissolved in nitric acid and the mixed rare-earth fluoride was then coprecipitated out as fine granules by the addition of excess hydrofluoric acid. The precipitated rare-earth fluorides were washed with water, separated from the aqueous solution, and oven-dried.

The Microstructure of Nickel Oxide Scales

1981 ◽  
Vol 39 ◽  
pp. 86-87
Author(s):  
M. T. Tinker ◽  
L. W. Hobbs
Keyword(s):  
Electron Microscopy ◽  
Nickel Oxide ◽  
Ion Beam ◽  
Oxide Scales ◽  
Nickel Substrate ◽  
Outward Diffusion ◽  
Transmission Electron ◽  
Nickel Substrates ◽  
Nickel Base ◽  
Technological Interest

There is considerable technological interest in oxidation of nickel because of the importance of nickel-base superalloys in high-temperature oxidizing environments. NiO scales on nickel grow classically, by outward diffusion of nickel through the scale, and are among the most studied of oxidation systems. We report here the first extensive characterization by transmission electron microscopy of nickel oxide scales formed on bulk nickel substrates and sectioned both parallel and transversely to the Ni/NiO interface.Electrochemically-polished nickel sheet of 99.995% purity was oxidized at 1273 K in 0.1 MPa oxygen partial pressure for times between 5 s and 25 h. Parallel sections were produced using a combination of electropolishing of the nickel substrate and ion-beam thinning of the scale to any desired depth in the scale. Transverse sections were prepared by encasing stacked strips of oxidized nickel sheet in epoxy resin, sectioning transversely and ion-beam thinning until thin area spanning one or more interfaces was obtained.

Electron microscopy of crystalline structure in thermotropic random copolymers

1991 ◽  
Vol 49 ◽  
pp. 1054-1055
Author(s):  
Afzana Anwer ◽  
S. Eilidh Bedford ◽  
Richard J. Spontak ◽  
Alan H. Windle
Keyword(s):  
Electron Microscopy ◽  
Crystalline Structure ◽  
Liquid Crystalline ◽  
Elevated Temperatures ◽  
Random Copolymers ◽  
Molecular Characteristics ◽  
Scanning Calorimetry ◽  
X Ray ◽  
Identical Monomer ◽  
Periodic Layer

Random copolyesters composed of wholly aromatic monomers such as p-oxybenzoate (B) and 2,6-oxynaphthoate (N) are known to exhibit liquid crystalline characteristics at elevated temperatures and over a broad composition range. Previous studies employing techniques such as X-ray diffractometry (XRD) and differential scanning calorimetry (DSC) have conclusively proven that these thermotropic copolymers can possess a significant crystalline fraction, depending on molecular characteristics and processing history, despite the fact that the copolymer chains possess random intramolecular sequencing. Consequently, the nature of the crystalline structure that develops when these materials are processed in their mesophases and subsequently annealed has recently received considerable attention. A model that has been consistent with all experimental observations involves the Non-Periodic Layer (NPL) crystallite, which occurs when identical monomer sequences enter into register between adjacent chains. The objective of this work is to employ electron microscopy to identify and characterize these crystallites.

Ultrastructural Features of Normal and Diseased Hair Revealed by Ion Beam Etching and Freeze Fracture

1975 ◽  
Vol 33 ◽  
pp. 358-359
Author(s):  
M. Spector ◽  
A. C. Brown
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Ectodermal Dysplasia ◽  
Ion Beam ◽  
Freeze Fracture ◽  
Ion Current ◽  
Ion Beam Etching ◽  
Pili Torti ◽  
Argon Ion ◽  
Scanning Electron

Ion beam etching and freeze fracture techniques were utilized in conjunction with scanning electron microscopy to study the ultrastructure of normal and diseased human hair. Topographical differences in the cuticular scale of normal and diseased hair were demonstrated in previous scanning electron microscope studies. In the present study, ion beam etching and freeze fracture techniques were utilized to reveal subsurface ultrastructural features of the cuticle and cortex.Samples of normal and diseased hair including monilethrix, pili torti, pili annulati, and hidrotic ectodermal dysplasia were cut from areas near the base of the hair. In preparation for ion beam etching, untreated hairs were mounted on conducting tape on a conducting silicon substrate. The hairs were ion beam etched by an 18 ky argon ion beam (5μA ion current) from an ETEC ion beam etching device. The ion beam was oriented perpendicular to the substrate. The specimen remained stationary in the beam for exposures of 6 to 8 minutes.

Electron and ion irradiation-induced dissolution of mechanical twins in the intermetalic U3Si: An in situ HVEM study

1989 ◽  
Vol 47 ◽  
pp. 652-653
Author(s):  
Charles W. Allen ◽  
Robert C. Birtcher
Keyword(s):  
Elevated Temperatures ◽  
Ion Irradiation ◽  
Ion Beam ◽  
National Laboratory ◽  
Argonne National Laboratory ◽  
Heavy Ion ◽  
High Energy ◽  
Mechanical Twinning ◽  
In Situ Experiments

The uranium silicides, including U3Si, are under study as candidate low enrichment nuclear fuels. Ion beam simulations of the in-reactor behavior of such materials are performed because a similar damage structure can be produced in hours by energetic heavy ions which requires years in actual reactor tests. This contribution treats one aspect of the microstructural behavior of U3Si under high energy electron irradiation and low dose energetic heavy ion irradiation and is based on in situ experiments, performed at the HVEM-Tandem User Facility at Argonne National Laboratory. This Facility interfaces a 2 MV Tandem ion accelerator and a 0.6 MV ion implanter to a 1.2 MeV AEI high voltage electron microscope, which allows a wide variety of in situ ion beam experiments to be performed with simultaneous irradiation and electron microscopy or diffraction.At elevated temperatures, U3Si exhibits the ordered AuCu3 structure. On cooling below 1058 K, the intermetallic transforms, evidently martensitically, to a body-centered tetragonal structure (alternatively, the structure may be described as face-centered tetragonal, which would be fcc except for a 1 pet tetragonal distortion). Mechanical twinning accompanies the transformation; however, diferences between electron diffraction patterns from twinned and non-twinned martensite plates could not be distinguished.

TEM Sample Preparation Tricks for Advanced DRAMs

2015 ◽  
Author(s):  
Ching Shan Sung ◽  
Hsiu Ting Lee ◽  
Jian Shing Luo
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Sample Preparation ◽  
Integrated Circuit ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Tem Analysis ◽  
Cross Sectional ◽  
Transmission Electron ◽  
Characterization Of Materials

Abstract Transmission electron microscopy (TEM) plays an important role in the structural analysis and characterization of materials for process evaluation and failure analysis in the integrated circuit (IC) industry as device shrinkage continues. It is well known that a high quality TEM sample is one of the keys which enables to facilitate successful TEM analysis. This paper demonstrates a few examples to show the tricks on positioning, protection deposition, sample dicing, and focused ion beam milling of the TEM sample preparation for advanced DRAMs. The micro-structures of the devices and samples architectures were observed by using cross sectional transmission electron microscopy, scanning electron microscopy, and optical microscopy. Following these tricks can help readers to prepare TEM samples with higher quality and efficiency.

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