Electromigration Analysis of Solder Joints for Power Modules Using an Electrical-Thermal-Stress Coupled Model

2020 ◽  
Author(s):  
Mitsuaki Kato ◽  
Takahiro Omori ◽  
Akihiro Goryu ◽  
Tomoya Fumikura ◽  
Kenji Hirohata
Keyword(s):  
Solder Joint ◽  
Mechanical Stress ◽  
Solder Joints ◽  
Hydrostatic Stress ◽  
Vacancy Concentration ◽  
Intermetallic Layer ◽  
Current Crowding ◽  
Metal Atoms ◽  
Power Modules ◽  
Rate Of Increase

Abstract Power modules are being developed with the aim of increasing power output. Achieving this aim requires increased current density in power modules. However, at high current densities, power modules can degrade as a result of electromigration, which is a phenomenon where atoms move due to momentum transfer between conducting electrons and metal atoms. In addition, atoms are also moved by mechanical stress gradients and temperature gradients, so it is necessary to consider the combined effects of electrical, thermal, and mechanical stress. This report describes an electromigration analysis of solder joints for power modules. First, we validated our numerical implementation and showed that it could reproduce the distributions of vacancy concentrations and hydrostatic stress that were almost the same as those in previous studies. We then describe the effects of electromigration in a single solder joint. Due to the appearance of plastic and creep strains, the rate of increase in vacancy concentration was very slow and inelastic strain grew at an increasing rate. This result indicates that inelastic properties may strongly affect electromigration-induced degradation. Next, we present results for the solder joint with a SiC device and substrate. A current crowding appeared at the edge of the solder joint, and a vacancy concentration gradient was generated in not only the thickness direction but also the longitudinal direction. The absolute value of vacancy concentration increased significantly at the edge and did not reach a steady state even after a long time. These results indicate that peripheral components may strongly affect the electromigration-induced degradation. In addition, we modeled the behavior of metal atoms passing through the interface of the solder joint and simulated the growth of the intermetallic layer by electromigration.

Electromigration Analysis of Solder Joints for Power Modules Using an Electrical-Thermal-Stress Coupled Model

2021 ◽  
Author(s):  
Mitsuaki Kato ◽  
Takahiro Omori ◽  
Akihiro Goryu ◽  
Tomoya Fumikura ◽  
Kenji Hirohata
Keyword(s):  
Thermal Stress ◽  
Solder Joint ◽  
Power Output ◽  
Solder Joints ◽  
Vacancy Concentration ◽  
Inelastic Strain ◽  
Power Device ◽  
Power Module ◽  
Power Modules ◽  
Rate Of Increase

Abstract Power modules are being developed to increase power output. The larger current densities accompanying increased power output are expected to degrade solder joints in power modules by electromigration. In previous research, numerical analysis of solder for electromigration has mainly examined ball grid arrays in flip-chip packages in which many solder balls are bonded under the semiconductor device. However, in a power module, a single solder joint is uniformly bonded under the power device. Because of this difference in geometric shape, the effect of electromigration in the solder of power modules may be significantly different from that in the solder of flip chips packages. This report describes an electromigration analysis of solder joints for power modules using an electrical-thermal-stress coupled analysis. First, we validate our numerical implementation and show that it can reproduce the vacancy concentrations and hydrostatic stress almost the same as the analytical solutions. We then simulate a single solder joint to evaluate electromigration in a solder joint in a power module. Once inelastic strain appears, the rate of increase in vacancy concentration slows, while the inelastic strain continuously increases. This phenomenon demonstrates that elastic-plastic-creep analysis is crucial for electromigration analysis of solder joints in power modules. Next, the solder joint with a power device and a substrate as used in power modules was simulated. Plasticity-creep and longitudinal gradient generated by current crowding have a strong effect on significantly reducing the vacancy concentration at the anode edge over a long period of time.

Electromigration Analysis of Solder Joints for Power Modules Using an Electrical-Thermal-Stress-Atomic Coupled Model

2021 ◽  
Author(s):  
Mitsuaki Kato ◽  
Takahiro Omori ◽  
Akihiro Goryu ◽  
Tomoya Fumikura ◽  
Kenji Hirohata
Keyword(s):  
Thermal Stress ◽  
Solder Joint ◽  
Creep Strain ◽  
Current Density ◽  
Solder Joints ◽  
Vacancy Concentration ◽  
Size Ratio ◽  
Power Device ◽  
Current Crowding ◽  
Power Modules

Abstract Numerical analysis of electromigration in solder joints has mainly examined ball grid arrays (BGAs) in flip-chip packages, and few numerical study has been reported on solder joints in power modules. This report describes an electromigration analysis of solder joints for power modules with a Si-based power device, which are still widely used today, using an electrical-thermal-stress-atomic coupled analysis. To evaluate electromigration, a solder joint with a power device and a substrate as used in power modules was simulated. Due to current crowding, the current density at the edge of the solder joint exceeded the electromigration threshold even in Si-based power modules. Unlike general electromigration phenomena, the vacancy concentration increased at the center and decreased at the edges of the solder joint, regardless of whether it was on the cathode side or anode side. The vacancy concentration clearly increased with increasing current density and size ratio. Creep strain increased significantly with increasing current density, temperature, and size ratio. The largest change in vacancy concentration and creep strain was at the anode edge where current crowding occurred. In addition, we modeled the two-dimensional behavior of metal atoms passing through the interface of the solder joint. The expansion of intermetallic compound was accelerated by increasing the temperature and current density.

Electromigration Analysis of Power Modules by Electrical-Thermal-Mechanical Coupled Model

2019 ◽  
Author(s):  
Mitsuaki Kato ◽  
Takahiro Omori ◽  
Akihiro Goryu ◽  
Tomoya Fumikura ◽  
Kenji Hirohata
Keyword(s):  
Mechanical Stress ◽  
Power Output ◽  
Hydrostatic Stress ◽  
Vacancy Concentration ◽  
Coupled Analysis ◽  
Local Concentration ◽  
Wire Surface ◽  
Bonding Wire ◽  
Power Modules ◽  
The Wire

Abstract Power semiconductors and modules are basic components of electrical infrastructure and are currently widely used in applications such as power conversion devices, industrial equipment, railways, and automobiles. Power modules are being developed with the aim of downsizing and increasing power output. With the larger current densities and higher operating temperatures associated with downsizing and increasing power output, degradation of power modules can occur as a result of electromigration. Electromigration is a phenomenon where atoms move due to the momentum transfer between conducting electrons and metal atoms. In addition, atoms are also moved by mechanical stress gradients and temperature gradients, so it is necessary to take into consideration the combined effects of electrical, thermal, and mechanical stress. In this report, we describe an electrical-thermal-mechanical coupled analysis of electromigration in a bonding wire of a power module. First, the analysis is validated under the condition that the displacement of the wire surface is fixed. The distributions of vacancy concentrations and hydrostatic stress are almost equal to those in previous studies. Next, we present the influences of current density, temperature, and the displacement constraint on electromigration in a wire with a simplified shape. The analysis results confirm that the plasticity and creep should be taken into consideration in a bonding wire. This also confirm that vacancy concentration increase more rapidly by changing the displacement of the wire surface from the fixed condition to the free condition. Finally, we present analysis results for a bonding wire with the actual shape found in power modules. In this wire, a local concentration peak appear in the electrode terminal. The analysis results reveal that electromigration may affect not only void formation but also other failure phenomena in the bonding wire of power modules.

A study on the effects of electrical and thermal stresses on void formation and migration lifetime of Sn3.0Ag0.5Cu solder joints

2021 ◽  
Vol ahead-of-print (ahead-of-print) ◽  
Author(s):  
Yanruoyue Li ◽  
Guicui Fu ◽  
Bo Wan ◽  
Zhaoxi Wu ◽  
Xiaojun Yan ◽  
...  
Keyword(s):  
Solder Joint ◽  
Thermal Stresses ◽  
Solder Joints ◽  
Void Formation ◽  
Model Parameters ◽  
Time To Failure ◽  
Current Crowding ◽  
Theoretical Derivation ◽  
Content Type ◽  
And Migration

Purpose The purpose of this study is to investigate the effect of electrical and thermal stresses on the void formation of the Sn3.0Ag0.5Cu (SAC305) lead-free ball grid array (BGA) solder joints and to propose a modified mean-time-to-failure (MTTF) equation when joints are subjected to coupling stress. Design/methodology/approach The samples of the BGA package were subjected to a migration test at different currents and temperatures. Voltage variation was recorded for analysis. Scanning electron microscope and electron back-scattered diffraction were applied to achieve the micromorphological observations. Additionally, the experimental and simulation results were combined to fit the modified model parameters. Findings Voids appeared at the corner of the cathode. The resistance of the daisy chain increased. Two stages of resistance variation were confirmed. The crystal lattice orientation rotated and became consistent and ordered. Electrical and thermal stresses had an impact on the void formation. As the current density and temperature increased, the void increased. The lifetime of the solder joint decreased as the electrical and thermal stresses increased. A modified MTTF model was proposed and its parameters were confirmed by theoretical derivation and test data fitting. Originality/value This study focuses on the effects of coupling stress on the void formation of the SAC305 BGA solder joint. The microstructure and macroscopic performance were studied to identify the effects of different stresses with the use of a variety of analytical methods. The modified MTTF model was constructed for application to SAC305 BGA solder joints. It was found suitable for larger current densities and larger influences of Joule heating and for the welding ball structure with current crowding.

scholarly journals Study on the Reliability of Sn–Bi Composite Solder Pastes with Thermosetting Epoxy under Thermal Cycling and Humidity Treatment

Crystals ◽  
2021 ◽  
Vol 11 (7) ◽  
pp. 733
Author(s):  
Lu Liu ◽  
Songbai Xue ◽  
Ruiyang Ni ◽  
Peng Zhang ◽  
Jie Wu
Keyword(s):  
Solder Joint ◽  
Thermal Cycling ◽  
Composite Solder ◽  
Solder Joints ◽  
Solder Paste ◽  
Epoxy System ◽  
Mechanical Reinforcement ◽  
Microstructure Observation ◽  
Temperature And Humidity ◽  
Thermosetting Epoxy

In this study, a Sn–Bi composite solder paste with thermosetting epoxy (TSEP Sn–Bi) was prepared by mixing Sn–Bi solder powder, flux, and epoxy system. The melting characteristics of the Sn–Bi solder alloy and the curing reaction of the epoxy system were measured by differential scanning calorimeter (DSC). A reflow profile was optimized based on the Sn–Bi reflow profile, and the Organic Solderability Preservative (OSP) Cu pad mounted 0603 chip resistor was chosen to reflow soldering and to prepare samples of the corresponding joint. The high temperature and humidity reliability of the solder joints at 85 °C/85% RH (Relative Humidity) for 1000 h and the thermal cycle reliability of the solder joints from −40 °C to 125 °C for 1000 cycles were investigated. Compared to the Sn–Bi solder joint, the TSEP Sn–Bi solder joints had increased reliability. The microstructure observation shows that the epoxy resin curing process did not affect the transformation of the microstructure. The shear force of the TSEP Sn–Bi solder joints after 1000 cycles of thermal cycling test was 1.23–1.35 times higher than the Sn–Bi solder joint and after 1000 h of temperature and humidity tests was 1.14–1.27 times higher than the Sn–Bi solder joint. The fracture analysis indicated that the cured cover layer could still have a mechanical reinforcement to the TSEP Sn–Bi solder joints after these reliability tests.

Electromigration Analysis of Solder Joints for Power Modules Using an Electrical-Thermal-Stress Coupled Model

2021 ◽  
Author(s):  
Mitsuaki Kato ◽  
Takahiro Omori ◽  
Akihiro Goryu ◽  
Tomoya Fumikura ◽  
Kenji Hirohata
Keyword(s):  
Thermal Stress ◽  
Solder Joints ◽  
Coupled Model ◽  
Power Modules

Effect of intermetallic compound layer thickness on the shear strength of 1206 chip resistor solder joint

2015 ◽  
Vol 27 (1) ◽  
pp. 52-58 ◽  
Author(s):  
Peter K. Bernasko ◽  
Sabuj Mallik ◽  
G. Takyi
Keyword(s):  
Shear Strength ◽  
Intermetallic Compound ◽  
Solder Joint ◽  
Layer Thickness ◽  
Solder Joints ◽  
Ageing Time ◽  
Circuit Board ◽  
Intermetallic Compound Layer ◽  
Content Type ◽  
Surface Mount

Purpose – The purpose of this paper is to study the effect of intermetallic compound (IMC) layer thickness on the shear strength of surface-mount component 1206 chip resistor solder joints. Design/methodology/approach – To evaluate the shear strength and IMC thickness of the 1206 chip resistor solder joints, the test vehicles were conventionally reflowed for 480 seconds at a peak temperature of 240°C at different isothermal ageing times of 100, 200 and 300 hours. A cross-sectional study was conducted on the reflowed and aged 1206 chip resistor solder joints. The shear strength of the solder joints aged at 100, 200 and 300 hours was measured using a shear tester (Dage-4000PXY bond tester). Findings – It was found that the growth of IMC layer thickness increases as the ageing time increases at a constant temperature of 175°C, which resulted in a reduction of solder joint strength due to its brittle nature. It was also found that the shear strength of the reflowed 1206 chip resistor solder joint was higher than the aged joints. Moreover, it was revealed that the shear strength of the 1206 resistor solder joints aged at 100, 200 and 300 hours was influenced by the ageing reaction times. The results also indicate that an increase in ageing time and temperature does not have much influence on the formation and growth of Kirkendall voids. Research limitations/implications – A proper correlation between shear strength and fracture mode is required. Practical implications – The IMC thickness can be used to predict the shear strength of the component/printed circuit board pad solder joint. Originality/value – The shear strength of the 1206 chip resistor solder joint is a function of ageing time and temperature (°C). Therefore, it is vital to consider the shear strength of the surface-mount chip component in high-temperature electronics.

scholarly journals Prediction of mechanical properties and fatigue life of nano silver paste in chip interconnection

2020 ◽  
Author(s):  
Hui YANG ◽  
Jihui Wu
Keyword(s):  
Fatigue Life ◽  
Solder Joint ◽  
Thermal Cycling ◽  
Solder Joints ◽  
Stress And Strain ◽  
Nano Silver ◽  
Finite Element Software ◽  
Flip Chips ◽  
Empirical Correction ◽  
Prediction Of Mechanical Properties

Abstract The simulation of nano-silver solder joints in flip-chips is performed by the finite element software ANSYS, and the stress-strain distribution results of the solder joints are displayed. In this simulation, the solder joints use Anand viscoplastic constitutive model, which can reasonably simulate the stress and strain of solder joints under thermal cycling load. At the same time this model has been embedded in ANSYS software, so it is more convenient to use. The final simulation results show that the areas where the maximum stresses and strains occur at the solder joints are mostly distributed in the contact areas between the solder joints and the copper pillars and at the solder joints. During the entire thermal cycling load process, the area where the maximum change in stress and strain occurs is always at the solder joint, and when the temperature changes, the temperature at the solder joint changes significantly. Based on comprehensive analysis, the relevant empirical correction calculation equation is used to calculate and predict the thermal fatigue life of nano-silver solder joints. The analysis results provide a reference for the application of nano-silver solder in the electronic packaging industry.

Elevated Stand-Off Heights in Solder Joint Interconnections of Surface Mounted IC Packages Result in Appreciable Stress and Warpage Relief

2018 ◽  
Vol 2018 (1) ◽  
pp. 000534-000542
Author(s):  
Ephraim Suhir ◽  
Sung Yi ◽  
Jennie S. Hwang ◽  
R. Ghaffarian
Keyword(s):  
Solder Joint ◽  
Solder Joints ◽  
Calculated Data ◽  
Ball Grid Array ◽  
Substantial Improvement ◽  
Stress Model ◽  
Solder Material ◽  
The Difference ◽  
Free Solder ◽  
Ic Package

Abstract The “head-in-pillow” (HnP) defects in lead-free solder joint interconnections of IC packages with conventional (small) stand-off heights of the solder joints, and particularly in packages with fine pitches, are attributed by many electronic material scientists to the three major causes: 1) attributes of the manufacturing process, 2) solder material properties and 3)design-related issues. The latter are thought to be caused primarily by elevated stresses in the solder material, as well as by the excessive warpage of the PCB-package assembly and particularly to the differences in the thermally induced curvatures of the PCB and the package. In this analysis the stress-and-warpage issue is addressed using an analytical predictive stress model. This model is a modification and an extension of the model developed back in 1980-s by the first author. It is assumed that it is the difference in the post-fabrication deflections of the PCB-package assembly that is the root cause of the solder materials failures and particularly and perhaps the HnP defects. The calculated data based on the developed analytical thermal stress model suggest that the replacement of the conventional ball-grid-array (BGA) designs with designs characterized by elevated stand-off heights of the solder joints could result in significant stress and warpage relief and, hopefully, in a lower propensity of the IC package to HnP defects as well. The general concepts are illustrated by a numerical example, in which the responses to the change in temperature of a conventional design referred to as ball-grid-array (BGA) and a design with solder joints with elevated stand-off heights referred to as column-grid-array (CGA) are compared. The computed data indicated that the effective stress in the solder material is relieved by about 40% and the difference between the maximum deflections of the PCB and the package is reduced by about 60%, when the BGA design is replaced by a CGA system. Although no proof that the use of solder joints with elevated stand-off heights will lessen the package propensity to the HnP defects is provided, the authors think that there is a reason to believe that the application of solder joints with elevated stand-off heights could result in a substantial improvement in the general IC package performance, including, perhaps, its propensity to HnP defects.

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