Nanoindentation Measurements of the Mechanical Properties of Individual Phases Within Lead Free Solder Joints Subjected to Isothermal Aging

Author(s):  
Abdullah Fahim ◽  
Sudan Ahmed ◽  
Jeffrey C. Suhling ◽  
Pradeep Lall

Exposure of lead free solder joints to high temperature isothermal aging conditions leads to microstructure evolution, which mainly includes coarsening of the intermetallic (IMC) phases. In our previous work, it was found that the coarsening of IMCs led to degradation of the overall mechanical properties of the SAC solder composite consisting of β-Sn matrix and IMC particles. However, it is not known whether the isothermal aging changes properties of the individual β-Sn and IMC phases, which could also be affecting to the overall degradation of properties. In this study, the aging induced variations of the mechanical properties of the β-Sn phase, and of Sn-Cu IMC particles in SAC solder joints have been explored using nanoindentation. SAC solder joints extracted from SuperBGA (SBGA) packages were aged for different time intervals (0, 1, 5, 10 days) at T = 125 °C. Nanoindentation test samples were prepared by cross sectioning the solder joints, and then molding them in epoxy and polishing them to prepare the joint surfaces for nanoindentation. Multiple β-Sn grains were identified in joints using optical polarized microscopy and IMCs were also observed. Individual β-Sn grains and IMC particles were then indented at room temperature to measure their mechanical properties (elastic modulus and hardness) and time dependent creep deformations. Properties measured at different aging time were then compared to explore aging induced degradations of the individual phases. The properties of the individual phases did not show significant degradation. Thus, IMC coarsening is the primary reason for the degradation of bulk solder joint properties, and changes of the properties of the individual phases making up the lead free solder material are negligible.

Author(s):  
Mohammad Hasnine ◽  
Muhannad Mustafa ◽  
Jing Zou ◽  
Jeffrey C. Suhling ◽  
Barton C. Prorok ◽  
...  

The mechanical properties of a lead free solder are strongly influenced by its microstructure, which is controlled by its thermal history including solidification rate and thermal aging after solidification. Due to aging phenomena, the microstructure, mechanical response, and failure behavior of lead free solder joints in electronic assemblies are constantly evolving when exposed to isothermal and/or thermal cycling environments. Through uniaxial testing of miniature bulk solder tensile specimens, we have previously demonstrated that large changes occur in the stress-strain and creep behaviors of lead free solder alloys with aging. Complementary studies by other research groups have verified aging induced degradations of SAC mechanical properties. In those investigations, mechanical testing was performed on a variety of sample geometries including lap shear specimens, Iosipescu shear specimens, and custom solder ball array shear specimens. While there are clearly aging effects in SAC solder materials, there have been limited prior mechanical loading studies on aging effects in actual solder joints extracted from area array assemblies (e.g. PBGA or flip chip). This is due to the extremely small size of the individual joints, and the difficulty in gripping them and applying controlled loadings (tension, compression, or shear). In the current work, we have explored aging phenomena in actual solder joints by nano-mechanical testing of single SAC305 lead free solder joints extracted from PBGA assemblies. Using nanoindentation techniques, the stress-strain and creep behavior of the SAC solder materials have been explored at the joint scale for various aging conditions. Mechanical properties characterized as a function of aging include the elastic modulus, hardness, and yield stress. Using a constant force at max indentation, the creep response of the aged and non-aged solder joint materials has also been measured as a function of the applied stress level. With these approaches, aging effects in solder joints were quantified and correlated to the magnitudes of those observed in testing of miniature bulk specimens. Our results show that the aging induced degradations of the mechanical properties (modulus, hardness) of single grain SAC305 joints were similar to those seen previously by testing of larger “bulk” solder specimens. However, due to the single grain nature of the joints considered in this study, the degradations of the creep responses were significantly less in the solder joints relative to those in larger uniaxial tensile specimens. The magnitude of aging effects in multi-grain lead free solder joints remains to be quantified. Due to the variety of crystal orientations realized during solidification, it was important to identify the grain structure and crystal orientations in the tested joints. Polarized light microscopy and Electron Back Scattered Diffraction (EBSD) techniques have been utilized for this purpose. The test results show that the elastic, plastic, and creep properties of the solder joints and their sensitivities to aging are highly dependent on the crystal orientation. In addition, an approach has been developed to predict tensile creep strain rates for low stress levels using nanoindentation creep data measured at very high compressive stress levels.


2010 ◽  
Vol 2010 (1) ◽  
pp. 000314-000318
Author(s):  
Tong Jiang ◽  
Fubin Song ◽  
Chaoran Yang ◽  
S. W. Ricky Lee

The enforcement of environmental legislation is pushing electronic products to take lead-free solder alloys as the substitute of traditional lead-tin solder alloys. Applications of such alloys require a better understanding of their mechanical behaviors. The mechanical properties of the lead-free solders and IMC layers are affected by the thermal aging. The lead-free solder joints on the pads subject to thermal aging test lead to IMC growth and cause corresponding reliability concerns. In this paper, the mechanical properties of the lead-free solders and IMCs were characterized by nanoindentation. Both the Sn-rich phase and Ag3Sn + β-Sn phase in the lead-free solder joint exhibit strain rate depended and aging soften effect. When lead-free solder joints were subject to thermal aging, Young's modulus of the (Cu, Ni)6Sn5 IMC and Cu6Sn5 IMC changed in very small range. While the hardness value decreased with the increasing of the thermal aging time.


2013 ◽  
Vol 634-638 ◽  
pp. 2800-2803 ◽  
Author(s):  
Li Meng Yin ◽  
Yan Fei Geng ◽  
Zhang Liang Xu ◽  
Song Wei

Adopting an accurate micro-tensile method based on dynamic mechanical analyzer (DMA) instrument, the tensile strength of three kinds of copper-wire/solder/copper-wire sandwich structured microscale lead-free solder joints that underwent current stressing with a direct current density of 1.0×104 A/cm2 and loading time of 48 hours were investigated, and compared with those solder joints isothermal aged at 100 0C for 48 hours and as-reflowed condition. These three kinds of microscale columnar solder joints have different volumes, i.e., a same diameter of 300 μm but different heights of 100 μm, 200 μm and 300 μm. Experimental results show that both current stressing and isothermal aging degrades the tensile strength of microscale solder joints, and the solder joint with smaller volume obtains higher tensile strength under same test condition. In addition, current stressing induces obvious electromigration (EM) issue under high current density of 1.0×104 A/cm2, resulting in the decreasing of tensile strength and different fracture position, mode and surface morphology of microscale solder joints. The degree of strength degradation increases with the increasing of joint height when keep joint diameter constant, this is mainly due to that electromigration leads to voids form and grow at the interface of cathode, and solder joints with larger volume may contains more soldering defects as well.


Author(s):  
Mohd Aminul Hoque ◽  
Md Mahmudur Chowdhury ◽  
Sa’d Hamasha ◽  
Jeffrey C. Suhling ◽  
Pradeep Lall

Abstract Solder joint reliability is a chief concern in electronic assemblies. Electronic packages consist of various materials, each having their own Coefficient of Thermal Expansion (CTE). When assembled packages experience high temperature gradients and thermal cycles, a mismatch in the CTE values brings about cyclic shear strains in the solder joints, which can ultimately lead to failure. Thus, it is important to understand the effects of shear cycling on the damage accumulated in solder joints. Previous studies conducted on the effect of mechanical cycling on the material behavior of lead free solders have been performed on bulk samples subjected to tension and compression. Our goal in this study was to determine the evolution of the mechanical properties of doped lead free solder joints when subjected to mechanical shear cycling. Experiments conducted on actual solder joints would help us gain a better understanding on the real life effects of shear cycling. The test specimens consisted of a 3 × 3 array of nine solder joints of approximately 0.75 mm diameter. With the aid of specially designed test fixtures, the specimens were gripped and then subjected to mechanical cycling in the shear using an Instron Micromechanical tester. Testing was performed on both SAC305 and SACX (SAC+Bi) solder joints. The joints were cycled for certain durations, and a nanoindentation system was used to measure the evolution of the mechanical properties (elastic modulus, hardness, creep rate) as a function of the number of shear cycles.


2021 ◽  
pp. 114201 ◽  
Author(s):  
Pierre Roumanille ◽  
Emna Ben Romdhane ◽  
Samuel Pin ◽  
Patrick Nguyen ◽  
Jean-Yves Delétage ◽  
...  

Author(s):  
Hongtao Ma ◽  
Tae-Kyu Lee ◽  
Dong Hyun Kim ◽  
H G Park ◽  
Sang Ha Kim ◽  
...  

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