Nonlinear Dynamics and Control of the Scan Process in Atomic Force Microscopy

2007 ◽  
Author(s):  
S. Hornstein ◽  
O. Gottlieb
Keyword(s):  
Atomic Force Microscopy ◽  
Degrees Of Freedom ◽  
Smooth Transition ◽  
Digital Controller ◽  
Force Microscopy ◽  
Imaging Tool ◽  
Atomic Force ◽  
Scan Speed ◽  
Dynamics And Control ◽  
Spatio Temporal

Atomic Force Microscopy (AFM) is a major imaging tool used to map surfaces down to atomic resolution. However, scanning rates in AFM are still low, and attempts to increase the speed usually end up with low-resolution pictures. In order to address this deficiency we propose a novel model that treats the scanning element as a moving continuous microcantilever, which undergoes a combined spatial motion in both the horizontal and the vertical directions. This research investigates the effect of increasing the scan speed on the dynamics and stability of a vibrating microcantilever that is governed by a specified control law. We reduce the spatio-temporal model to a rigid body two-degrees-of-freedom system, which is connected to a linear digital controller. Results demonstrate that the digital controller stabilizes the nonlinear system and enables a smooth transition from one side to the other side of the sample, needed for the scanning process.

scholarly journals Scanning speed phenomenon in contact-resonance atomic force microscopy

2018 ◽  
Vol 9 ◽  
pp. 945-952 ◽  
Author(s):  
Christopher C Glover ◽  
Jason P Killgore ◽  
Ryan C Tung
Keyword(s):  
Atomic Force Microscopy ◽  
Hydrodynamic Theory ◽  
Squeeze Film ◽  
Resonance Spectroscopy ◽  
Related Phenomenon ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scan Speed ◽  
Contact Resonance

This work presents data confirming the existence of a scan speed related phenomenon in contact-mode atomic force microscopy (AFM). Specifically, contact-resonance spectroscopy is used to interrogate this phenomenon. Above a critical scan speed, a monotonic decrease in the recorded contact-resonance frequency is observed with increasing scan speed. Proper characterization and understanding of this phenomenon is necessary to conduct accurate quantitative imaging using contact-resonance AFM, and other contact-mode AFM techniques, at higher scan speeds. A squeeze film hydrodynamic theory is proposed to explain this phenomenon, and model predictions are compared against the experimental data.

Scan speed limit in atomic force microscopy

1993 ◽  
Vol 169 (1) ◽  
pp. 75-84 ◽  
Author(s):  
H.-J. BUTT ◽  
P. SIEDLE ◽  
K. SEIFERT ◽  
K. FENDLER ◽  
T. SEEGER ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Speed Limit ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scan Speed

Real-time scan speed control of the atomic force microscopy for reducing imaging time based on sample topography

Micron ◽  
2018 ◽  
Vol 106 ◽  
pp. 1-6 ◽  
Author(s):  
Yingxu Zhang ◽  
Yingzi Li ◽  
Guanqiao Shan ◽  
Yifu Chen ◽  
Zhenyu Wang ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Real Time ◽  
Speed Control ◽  
Force Microscopy ◽  
Atomic Force ◽  
Imaging Time ◽  
Scan Speed ◽  
Time Scan

Nonlinear Dynamics and Control of the Scan Process in Noncontacting Atomic Force Microscopy

2005 ◽  
Author(s):  
S. Hornstein ◽  
O. Gottlieb ◽  
L. Ioffe
Keyword(s):  
Nonlinear Dynamics ◽  
Atomic Force Microscopy ◽  
Numerical Study ◽  
Initial Boundary ◽  
Atomic Interaction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dynamics And Control ◽  
And Control ◽  
Nonlinear Dynamics And Control

The focus of this paper is on the nonlinear dynamics and control of the scan process in noncontacting atomic force microscopy. An initial-boundary-value problem is consistently formulated to include both nonlinear dynamics of a microcantilever with a localized atomic interaction force for the surface it is mapping, and a horizontal boundary condition for a constant scan speed and its control. The model considered is obtained using the extended Hamilton’s principle which yields two partial differential equations for the combined horizontal and vertical motions. Isolation of a Lagrange multiplier describing the microbeam fixed length enables construction of a modified equation of motion which is reduced to a single mode dynamical system via Galerkin’s method. The analysis includes a numerical study of the strongly nonlinear system leading to a stability map describing an escape bifurcation threshold where the tip, at the free end of the microbeam, ‘jumps-to-contact’ with the sample. Results include periodic ultrasubharmonic and quasiperiodic solutions corresponding to primary and secondary resonances.

Utilization of a Two-Beam Cantilever Array for Enhanced Atomic Force Microscopy Sensitivity

2018 ◽  
Vol 140 (4) ◽  
Author(s):  
Samuel Jackson ◽  
Stefanie Gutschmidt
Keyword(s):  
Atomic Force Microscopy ◽  
Degrees Of Freedom ◽  
Sample Surface ◽  
Feedback Signal ◽  
Single Beam ◽  
Force Microscopy ◽  
Beam Array ◽  
Atomic Force ◽  
Alternative Approach ◽  
Cantilever Array

An array of cantilevers offers an alternative approach to standard single beam measurement in the context of atomic force microscopy (AFM). In comparison to a single beam, a multi-degrees-of-freedom system offers a greater level of flexibility with regard to parameter selection and tuning. By utilizing changes in the system eigenmodes as a feedback signal, it is possible to enhance the sensitivity of AFM to changes in sample topography above what is achievable with standard single beam techniques. In this paper, we analyze a two-beam array operated in FM-AFM mode. The array consists of a single active cantilever that is excited with a 90 deg phase-shifted signal and interacts with the sample surface. The active beam is mechanically coupled to a passive beam, which acts to vary the response between synchronized and unsynchronized behavior. We use a recently developed mathematical model of the coupled cantilever array subjected to nonlinear tip forces to simulate the response of the described system with different levels of coupling. We show that the sensitivity of the frequency feedback signal can be increased significantly in comparison to the frequency feedback from a single beam. This is a novel application for an AFM array that is not present in the literature.

Characterization and optimization of scan speed for tapping-mode atomic force microscopy

2002 ◽  
Vol 73 (8) ◽  
pp. 2928-2936 ◽  
Author(s):  
T. Sulchek ◽  
G. G. Yaralioglu ◽  
C. F. Quate ◽  
S. C. Minne
Keyword(s):  
Atomic Force Microscopy ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scan Speed ◽  
Mode Atomic Force Microscopy

Practical Scan Speed in Atomic Force Microscopy for Live Neurons in a Physiological Solution

1997 ◽  
Vol 36 (Part 1, No. 6B) ◽  
pp. 3877-3880 ◽  
Author(s):  
Shin Nagayama ◽  
Takuro Tojima ◽  
Mayumi Morimoto ◽  
Shigeo Sasaki ◽  
Kazushige Kawabata ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Physiological Solution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scan Speed

Atomic force microscopy as an imaging tool to study the bio/nonbio complexes

2020 ◽  
Vol 280 (3) ◽  
pp. 241-251
Author(s):  
Z. BEDNARIKOVA ◽  
Z. GAZOVA ◽  
F. VALLE ◽  
E. BYSTRENOVA
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Imaging Tool ◽  
Atomic Force
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