Skew Ray Tracing and Sensitivity Analysis of Geometrical Optics

1999 ◽  
Vol 122 (2) ◽  
pp. 338-349 ◽  
Author(s):  
Psang Dain Lin ◽  
Te-tan Liao

In order to improve upon the inconvenient and complicated contemporary analytic techniques employed for optical systems, this paper investigates two important optical topics: (1) the determination of light ray paths and (2) sensitivity analysis of light path parameters with respect to the light source location for occasions when light rays cross medium boundary surfaces. To this end, the traditional laws of reflection and refraction are reformulated in terms of revolution geometry. This results in a set of laws much simpler than the original, suitable for use in mathematical modeling to determine light paths and system sensitivity from location of the light source, optical component location, the equation of the optical component’s surface curve, and the refractive index. Ray tracing and sensitivity analysis of the two most popular boundary surfaces, flat and spherical, are presented as examples. In order to illustrate experimentally the integration of these boundary surfaces into optical systems, an optical measurement system for measuring surface height and orientation, containing a beam splitter and a bi-convex lens, was built. Agreement between the experimental optical system’s performance and the theoretical predictions yielded by the proposed method are excellent. [S1087-1357(00)01501-X]

2006 ◽  
Vol 505-507 ◽  
pp. 613-618 ◽  
Author(s):  
Chi Kuen Sung ◽  
Psang Dain Lin

One of the most popular mathematical tools in fields of robotics, mechanisms and computer graphics is the 4x4 homogeneous transformation matrix. In previous work we applied this matrix to the optical domains of flat and spherical surfaces for: (1) skew ray tracing to determine the paths of skew rays being reflected/refracted; (2) sensitivity analysis to determine by direct mathematical analysis the differential change of incident point and reflected/refracted vector with respect to change in incident light source. The present work extends our previous work to include the case of parabaloidal boundary surfaces.


Optik ◽  
2013 ◽  
Vol 124 (12) ◽  
pp. 1159-1169 ◽  
Author(s):  
Chia-Hung Lu ◽  
Chi-Kuei Sung

2002 ◽  
Vol 124 (3) ◽  
pp. 223-229 ◽  
Author(s):  
Abraham Kribus ◽  
Andreas Timinger

A method for remote optical measurement of the geometry of nonimaging concentrators is presented. A concentrator installed in a solar tower was measured by observation of transmission patterns from the heliostat field, and comparison of the measured patterns to a ray tracing simulation. The actual geometry of the concentrator was derived from optimization of the match between real and simulated patterns. The measurement was sensitive and accurate enough to detect small errors in the concentrator geometry, such as 1 millimeter in linear dimension and 0.1° in concentrator tilt angle. The measurement procedure is simple and can be easily adapted to a wide range of nonimaging optical systems.


Author(s):  
Julian Wüster ◽  
Yannick Bourgin ◽  
Patrick Feßer ◽  
Arne Behrens ◽  
Stefan Sinzinger

AbstractPolarizing beamsplitters have numerous applications in optical systems, such as systems for freeform surface metrology. They are classically manufactured from birefringent materials or with stacks of dielectric coatings. We present a binary subwavelength-structured form-birefringent diffraction grating, which acts as a polarizing beamsplitter for a wide range of incidence angles −30∘…+30∘. We refine the general design method for such hybrid gratings. We furthermore demonstrate the manufacturing steps with Soft-UV-Nanoimprint-Lithography, as well as the experimental verification, that the structure reliably acts as a polarizing beamsplitter. The experimental results show a contrast in efficiency for TE- and TM-polarization of up to 1:18 in the first order, and 34:1 in the zeroth order. The grating potentially enables us to realize integrated compact optical measurement systems, such as common-path interferometers.


2011 ◽  
Vol 21 ◽  
pp. 149-161 ◽  
Author(s):  
Antoine Haarscher ◽  
P. De Doncker ◽  
David Lautru

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