Evolution of Anand Parameters With Elevated Temperature Aging for SnAgCu Lead-free Alloys

2020 ◽  
Vol 143 (2) ◽  
Author(s):  
Pradeep Lall ◽  
Vikas Yadav ◽  
Jeff Suhling ◽  
David Locker
Keyword(s):  
Constitutive Model ◽  
Thermal Aging ◽  
High Strain ◽  
Lead Free ◽  
Constitutive Behavior ◽  
Strain Rates ◽  
Lead Free Solder ◽  
High Strain Rates ◽  
Shock Event ◽  
Free Solder

Abstract Electronic components in downhole oil drilling and gas industry applications, automotive, and avionics may be exposed to high temperatures (>150 °C) and high strain rates (1–100 per sec) during storage, operation, and handling, which can contribute to the failures of electronic devices. Temperatures in these applications can exceed 200 °C, which is close to melting point for SnAgCu (SAC) alloys. Prior studies at low strain rates have shown property evolution even under moderate exposure to high temperature. In this paper, the evolution of Anand parameters for unaged and aged SAC (SAC105 and SAC-Q) lead-free solder alloys at high strain rates has been investigated induced under sustained periods of thermal aging. The thermal aged lead-free SAC solder alloys specimen has been tested at high strain rates (10–75 per sec) at elevated temperatures of (25 °C–200 °C). The SAC lead-free solder samples were subjected to isothermal aging at 50 °C up to 1-year before testing. To describe the material constitutive behavior, the Anand Viscoplastic model has been used. The effect of thermal aging on Anand parameters also has been investigated. In order to verify the accuracy of the model, the computed Anand parameters have been used to simulate the uni-axial tensile test. The material constitutive behavior has been implemented in a finite element framework to simulate the drop events using the Anand constitutive model and determine the plastic work per shock event. The plastic work per shock event is a measure of the damage progression in the solder interconnects. The constitutive model has been used to simulate the shock event of a ball-grid array package on printed circuit board assembly.

Evolution of Anand Parameters With Elevated Temperature Aging for SAC Leadfree Alloys

2019 ◽  
Author(s):  
Pradeep Lall ◽  
Vikas Yadav ◽  
Jeff Suhling ◽  
David Locker
Keyword(s):  
Thermal Aging ◽  
High Strain ◽  
Lead Free ◽  
Uniaxial Tensile ◽  
Strain Rates ◽  
Lead Free Solder ◽  
Solder Alloys ◽  
High Strain Rates ◽  
Free Solder ◽  
Sac Solder

Abstract Electronic components in downhole oil drilling and gas industry applications, automotive and avionics may exposed to high temperatures (> 150°C) and high strain rates (1–100 per sec) during storage, operation and handling which can contribute to the failures of electronics devices. Temperatures in these applications can exceed 200°C, which is closed to melting point for SAC alloys. The microstructure for lead free solder alloys constantly evolves when subjected to thermal aging for sustained periods with accompanying degradation in mechanical properties of solder alloys. In this paper, evolution of microstructure and Anand parameters for unaged and aged SAC (SAC105 and SAC-Q) lead free solder alloys at high strain rates has been investigated induced due to thermal aging. The microstructure of the SAC solder is studied using scanning electron microscopy (SEM) for different strain rate and elevating temperature. The thermal aged leadfree SAC solder alloys specimen has been tested at high strain rates (10–75 per sec) at elevated temperatures of (25°C–200°C). The SAC leadfree solder samples were subjected to isothermal aging at 50°C up to 1-year before testing. To describe the material constitutive behavior, Anand Viscoplastic model has been used. Effect of thermal aging on Anand parameters has been investigated. In order to verify the accuracy of the model, the computed Anand parameters have been used to simulate the uniaxial tensile test. FEA based method has been used to simulate the drop events using Anand constitutive model. Hysteresis loop and Plastic work density has been computed from FEA.

Stress–Strain Behavior of SAC305 at High Strain Rates

2015 ◽  
Vol 137 (1) ◽  
Author(s):  
Pradeep Lall ◽  
Sandeep Shantaram ◽  
Jeff Suhling ◽  
David Locker
Keyword(s):  
Constitutive Model ◽  
Solder Alloy ◽  
High Strain ◽  
Image Correlation ◽  
Lead Free ◽  
Constitutive Behavior ◽  
Strain Rates ◽  
Mechanical Shock ◽  
High Strain Rates ◽  
Test Technique

Electronic products are subjected to high G-levels during mechanical shock and vibration. Failure-modes include solder-joint failures, pad cratering, chip-cracking, copper trace fracture, and underfill fillet failures. The second-level interconnects may be experience high strain rates and accrue damage during repetitive exposure to mechanical shock. Industry migration to lead-free solders has resulted in proliferation of a wide variety of solder alloy compositions. One of the popular tin-silver-copper alloys is Sn3Ag0.5Cu. The high strain rate properties of lead-free solder alloys are scarce. Typical material tests systems are not well suited for measurement of high strain rates typical of mechanical shock. Previously, high strain rates techniques such as the split Hopkinson pressure bar (SHPB) can be used for strain rates of 1000 s−1. However, measurement of materials at strain rates of 1–100 s−1 which are typical of mechanical shock is difficult to address. In this paper, a new test-technique developed by the authors has been presented for measurement of material constitutive behavior. The instrument enables attaining strain rates in the neighborhood of 1–100 s−1. High-speed cameras operating at 300,000 fps have been used in conjunction with digital image correlation (DIC) for the measurement of full-field strain during the test. Constancy of crosshead velocity has been demonstrated during the test from the unloaded state to the specimen failure. Solder alloy constitutive behavior has been measured for SAC305 solder. Constitutive model has been fit to the material data. Samples have been tested at various time under thermal aging at 25 °C and 125 °C. The constitutive model has been embedded into an explicit finite element framework for the purpose of life-prediction of lead-free interconnects. Test assemblies has been fabricated and tested under Joint Electron Device Engineering Council (JEDEC) JESD22-B111 specified condition for mechanical shock. Model predictions have been correlated with experimental data.

Understanding the impact response of lead-free solder at high strain rates

2020 ◽  
Vol 172 ◽  
pp. 105416
Author(s):  
Xu Long ◽  
Junmeng Xu ◽  
Shaobin Wang ◽  
Wenbin Tang ◽  
Chao Chang
Keyword(s):  
High Strain ◽  
Impact Response ◽  
Lead Free ◽  
Strain Rates ◽  
Lead Free Solder ◽  
High Strain Rates ◽  
Free Solder ◽  
The Impact

Medium to High Strain-Rate Characterization of Lead Free Solder Alloys Through Metal Cutting Experiments

2019 ◽  
Author(s):  
Yuvraj Singh ◽  
Anirudh Udupa ◽  
Srinivasan Chandrasekar ◽  
Ganesh Subbarayan
Keyword(s):  
High Strain Rate ◽  
Strain Rate ◽  
Metal Cutting ◽  
High Strain ◽  
Lead Free ◽  
Strain Rates ◽  
Lead Free Solder ◽  
Orthogonal Metal Cutting ◽  
Free Solder

Abstract Studies on medium to high strain-rate characterization (≥ 0.1s−1) of lead-free solder are relatively few, primarily due to the lack of available methods for testing. Prior work in literature uses Split Hopkinson Bar (SPHB) experiments for high strain-rate characterization (≥ 300s−1) [1,2], while a modified micro-scale tester is used for medium strain-rate characterization (0.005s−1 to 300s−1) [3] and an impact hammer test setup for testing in a strain-rate regime from 1s−1 to 100s−1 [4]. However, there is still limited data in strain-rate regimes of relevance, specifically for drop shock applications. In this paper, we present orthogonal metal cutting as a novel method to characterize lead-free solder alloys. Experiments are carried out using a wedgelike tool that cuts through a work piece at a fixed depth and rake angle while maintaining a constant cutting velocity. These experiments are conducted at room temperature on Sn1.0Ag0.5Cu bulk test specimens with strain-rates varying from 0.32 to 48s−1. The range of strain-rates is only limited by the ball screw driven slide allowing higher strain-rates if needed. The strains and strain-rates are captured through Particle Image Velocimetry (PIV) using sequential images taken from a high-speed camera just ahead of the cutting tool. The PIV enables non-contact recording of high strain-rate deformations, while the dynamometer on the cutting head allows one to capture the forces exerted during the cutting process. Results for the stress-strain response obtained through the experiments are compared to prior work for validation. Orthogonal metal cutting is shown to be a potentially attractive method for characterization of solder at higher strain-rates.

Constitutive Behavior of SAC Leadfree Alloys at High Strain Rates

2011 ◽  
Author(s):  
Pradeep Lall ◽  
Sandeep Shantaram ◽  
Mandar Kulkarni ◽  
Geeta Limaye ◽  
Jeff Suhling
Keyword(s):  
Constitutive Model ◽  
Solder Alloy ◽  
Failure Modes ◽  
High Strain ◽  
Image Correlation ◽  
Constitutive Behavior ◽  
Strain Rates ◽  
Mechanical Shock ◽  
High Strain Rates ◽  
Test Technique

Electronic products are subjected to high G-levels during mechanical shock and vibration. Failure-modes include solder-joint failures, pad cratering, chip-cracking, copper trace fracture, and underfill fillet failures. The second-level interconnects may be experience high-strain rates and accrue damage during repetitive exposure to mechanical shock. Industry migration to leadfree solders has resulted in proliferation of a wide variety of solder alloy compositions. Few of the popular tin-silver-copper alloys include Sn1Ag0.5Cu and Sn3Ag0.5Cu. The high strain rate properties of leadfree solder alloys are scarce. Typical material tests systems are not well suited for measurement of high strain rates typical of mechanical shock. Previously, high strain rates techniques such as the Split Hopkinson Pressure Bar (SHPB) can be used for strain rates of 1000 per sec. However, measurement of materials at strain rates of 1–100 per sec which are typical of mechanical shock is difficult to address. In this paper, a new test-technique developed by the authors has been presented for measurement of material constitutive behavior. The instrument enables attaining strain rates in the neighborhood of 1 to 100 per sec. High speed cameras operating at 300,000 fps have been used in conjunction with digital image correlation for the measurement of full-field strain during the test. Constancy of cross-head velocity has been demonstrated during the test from the unloaded state to the specimen failure. Solder alloy constitutive behavior has been measured for SAC105, and SAC305 solders. Constitutive model has been fit to the material data. Samples have been tested at various time under thermal aging at 25°C and 125°C. The constitutive model has been embedded into an explicit finite element framework for the purpose of life-prediction of leadfree interconnects. Test assemblies has been fabricated and tested under JEDEC JESD22-B111 specified condition for mechanical shock. Model predictions have been correlated with experimental data.

Viscoplastic Constitutive Model for Lead-Free Solder Including Effects of Silver Content, Solidification Profile, and Severe Aging

2015 ◽  
Author(s):  
Munshi Basit ◽  
Mohammad Motalab ◽  
Jeffrey C. Suhling ◽  
Pradeep Lall
Keyword(s):  
Mechanical Properties ◽  
Constitutive Model ◽  
Silver Content ◽  
Material Behavior ◽  
Lead Free ◽  
Model Parameters ◽  
Strain Rates ◽  
Lead Free Solder ◽  
Stress Strain ◽  
Free Solder

In the electronic packaging industry, it is important to be able to make accurate predictions of board level solder joint reliability during thermal cycling exposures. The Anand viscoplastic constitutive model is often used to represent the material behavior of the solder in finite element simulations. This model is defined using nine material parameters, and the reliability prediction results are often highly sensitive to the Anand parameters. In this work, an investigation on the Anand constitutive model and its application to SAC solders of various Ag contents (i.e. SACN05, with N = 1, 2, 3, 4) has been performed. For each alloy, both water quenched (WQ) and reflowed (RF) solidification profiles were utilized to establish two unique specimen microstructures, and the same reflow profile was used for all four of the SAC alloys so that the results could be compared and the effects of Ag content could be studied systematically. In addition, we have performed tensile testing on reflowed specimens subjected to 6 months of aging at 100 C. After this level of aging, any further changes in the mechanical response and properties will be rather small. Thus, the results for these tests can be regarded as approaching the highest level of mechanical behavior degradation possible for a “severely aged” lead free solder material. The nine Anand parameters were determined for each unique solder alloy and microstructure from a set of stress strain tests performed at several strain rates and temperatures. Testing conditions included strain rates of 0.001, 0.0001, and 0.00001 (sec−1), and temperatures of 25, 50, 75, 100, and 125 C. As expected, the mechanical properties (modulus and strength) increase with the percentage of Ag content, and these changes strongly affect the Anand parameters. The sensitivity of the mechanical properties and Anand parameters to silver content is higher at lower silver percentages (1–2%). Also, the observed mechanical properties of water quenched samples were better (higher in magnitude) than the corresponding mechanical properties of the reflowed samples. Although the differences in elastic modulus between the water quenched and reflowed samples are relatively small, significant differences are present for the yield and ultimate tensile stresses of all four SAC alloys. The changes in the Anand model parameters after severe aging (6 months at 100 °C) were significant. The measured experimental results have been used to illustrate the range of values possible for Anand parameters for the SACN05 alloys. The upper extreme was the water quenched limit, where the materials have extremely fine microstructures and high mechanical properties. The lower extreme was the severely aged limit, where the materials have extremely coarsened microstructures and highly degraded mechanical properties. While further degradations are certainly possible with even further aging, the limiting values found for a severely aged SAC alloy can be used by designers as a conservative set of constitutive parameters representing the lower end of the material properties for that alloy. After deriving the Anand parameters for each alloy and microstructure, the stress-strain curves have been calculated for various conditions, and excellent agreement was found between the predicted results and experimental stress-strain curves.

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