An Electron Diffraction Study of the Oxide Formed on Cemented Tungsten Carbide—Titanium Carbide Cutting Tools

1968 ◽  
Vol 90 (1) ◽  
pp. 92-96 ◽  
Author(s):  
J. Stanislao ◽  
M. H. Richman ◽  
C. F. James
Keyword(s):  
Solid Solution ◽  
Electron Diffraction ◽  
Tool Wear ◽  
Titanium Carbide ◽  
Outer Layer ◽  
Intermediate Layer ◽  
Carbide Particle ◽  
Cutting Tools ◽  
Protective Layer ◽  
Electron Diffraction Study

The oxide protecting the surface of cemented carbide cutting tools containing both tungsten and titanium carbides is identified by electron diffraction as Ti2O3, which is formed during the cutting operations. This is a protective and adherent oxide which is formed as an intermediate layer between the TiC-TiO solid solution (the titanium carbide particle) and an outer layer of TiO2. The outer layer of TiO2 is spolled off by the abrasive action of the chip and only the Ti2O3 layer protects against welding of the chip fragments to the tool; and the protective layer retards tool wear.

Stress-Induced Ordering in Y203-Stabilized Tetragonal Zr02

1985 ◽  
Vol 43 ◽  
pp. 222-223
Author(s):  
J. Y. Koo ◽  
M. P. Anderson
Keyword(s):  
Electron Diffraction ◽  
Ionic Conduction ◽  
Electron Diffraction Study ◽  
Ceramic Materials ◽  
Bright Field Image ◽  
Transformation Toughening ◽  
Ion Milling ◽  
Thin Foils ◽  
Carbon Coated ◽  
Convergent Beam

Tetragonal Zr02 has been used as a toughening phase in a large number of ceramic materials. In this system, complex diffraction phenomena have been observed and an understanding of the origin of the diffraction effects provides important information on the nature of transformation toughening, ionic conduction, and phase destabilization. This paper describes the results of an electron diffraction study of Y203-stabilized, tetragonal Zr02 polycrystals (Y-TZP).Thin foils from the bulk Y-TZP sample were prepared by careful grinding and cryo ion-milling. They were carbon coated and examined in a Philips 400T/FEG microscope. Fig. 1 shows a typical bright field image of the 100% tetragonal(t) Zr02. The tetragonal structure was identified by both bulk x-ray diffraction and convergent beam electron diffraction (Fig. 2. A local region within a t-Zr02 grain was subjected to an intense electron beam irradiation which caused partial martensitic transformation of the t-Zr02 to monoclinic(m) symmetry, Fig. 3 A.

Large-angle convergent-beam electron-diffraction study of coherent precipitates and decorated dislocations

1996 ◽  
Vol 54 ◽  
pp. 1002-1004
Author(s):  
J.M.K. Wiezorek ◽  
H.L. Fraser
Keyword(s):  
Electron Diffraction ◽  
Angular Resolution ◽  
Large Angle ◽  
Electron Diffraction Study ◽  
Convergent Beam Electron Diffraction ◽  
Crystal Defects ◽  
High Angular Resolution ◽  
Beam Electron ◽  
Diffraction Plane ◽  
Convergent Beam

Conventional methods of convergent beam electron diffraction (CBED) use a fully converged probe focused on the specimen in the object plane resulting in the formation of a CBED pattern in the diffraction plane. Large angle CBED (LACBED) uses a converged but defocused probe resulting in the formation of ‘shadow images’ of the illuminated sample area in the diffraction plane. Hence, low-spatial resolution image information and high-angular resolution diffraction information are superimposed in LACBED patterns which enables the simultaneous observation of crystal defects and their effect on the diffraction pattern. In recent years LACBED has been used successfully for the investigation of a variety of crystal defects, such as stacking faults, interfaces and dislocations. In this paper the contrast from coherent precipitates and decorated dislocations in LACBED patterns has been investigated. Computer simulated LACBED contrast from decorated dislocations and coherent precipitates is compared with experimental observations.

An Electron Diffraction Study on Litnerized Potato Starch

1990 ◽  
Vol 48 (1) ◽  
pp. 580-581
Author(s):  
Jean-Claude Jésior ◽  
Roger Vuong ◽  
Henri Chanzy
Keyword(s):  
Electron Microscope ◽  
Electron Diffraction ◽  
Signal To Noise Ratio ◽  
Potato Starch ◽  
Image Intensifier ◽  
Electron Diffraction Study ◽  
Starch Granules ◽  
X Ray ◽  
Individual Grains ◽  
Diamond Knife

Starch is arranged in a crystalline manner within its storage granules and should thus give sharp X-ray diagrams. Unfortunately most of the common starch granules have sizes between 1 and 100μm, making them too small for an X-ray study on individual grains. There is only one instance where an oriented X-ray diagram could be obtained on one sector of an individual giant starch granule. Despite their small size, starch granules are still too thick to be studied by electron diffraction with a transmission electron microscope. The only reported study on starch ultrastructure using electron diffraction on frozen hydrated material was made on small fragments. The present study has been realized on thin sectioned granules previously litnerized to improve the signal to noise ratio.Potato starch was hydrolyzed for 10 days in 2.2N HCl at 35°C, dialyzed against water until neutrality and embedded in Nanoplast. Sectioning was achieved with a commercially available low-angle “35°” diamond knife (Diatome) after a very carefull trimming and a pre-sectioning with a classical “45°” diamond knife. Sections obtained at a final sectioning angle of 42.2° (compared with the usual 55-60°) and at a nominal thickness of 900Å were collected on a Formvar-carbon coated grid. The exact location of the starch granules in their sections was recorded by optical microscopy on a Zeiss Universal polarizing microscope (Fig. 1a). After rehydration at a relative humidity of 95% for 24 hours they were mounted on a Philips cryoholder and quench frozen in liquid nitrogen before being inserted under frozen conditions in a Philips EM 400T electron microscope equipped with a Gatan anticontaminator and a Lhesa image intensifier.

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