scholarly journals Dual-Direction Optical Measurement Instrument for Assisting X-Ray Mammography

2011 ◽  
Vol 5 (2) ◽  
Author(s):  
H.-Z. Jiang ◽  
J.-Y. Chen ◽  
M.-Cheng Pan ◽  
Ch.-T. Wu ◽  
S.-Y. Sun ◽  
...  
Keyword(s):  
Optical Measurement ◽  
Measurement Instrument ◽  
X Ray

scholarly journals Upconversion Spectral Rulers for Transcutaneous Displacement Measurements

Sensors ◽  
2021 ◽  
Vol 21 (10) ◽  
pp. 3554
Author(s):  
Melissa M. Suckey ◽  
Donald W. Benza ◽  
John D. DesJardins ◽  
Jeffrey N. Anker
Keyword(s):  
Optical Measurement ◽  
Optical Measurements ◽  
Small Displacement ◽  
Simple Method ◽  
Low Background ◽  
X Ray ◽  
Optical Displacement ◽  
Spectral Peaks ◽  
Displacement Measurements ◽  
Minimal Intensity

We describe a method to measure micron to millimeter displacement through tissue using an upconversion spectral ruler. Measuring stiffness (displacement under load) in muscles, bones, ligaments, and tendons is important for studying and monitoring healing of injuries. Optical displacement measurements are useful because they are sensitive and noninvasive. Optical measurements through tissue must use spectral rather than imaging approaches because optical scattering in the tissue blurs the image with a point spread function typically around the depth of the tissue. Additionally, the optical measurement should have low background and minimal intensity dependence. Previously, we demonstrated a spectral encoder using either X-ray luminescence or fluorescence, but the X-ray luminescence required an expensive X-ray source and used ionizing radiation, while the fluorescence sensor suffered from interference from autofluorescence. Here, we used upconversion, which can be provided with a simple fiber-coupled spectrometer with essentially autofluorescence-free signals. The upconversion phosphors provide a low background signal, and the use of closely spaced spectral peaks minimizes spectral distortion from the tissue. The small displacement noise level (precision) through tissue was 2 µm when using a microscope-coupled spectrometer to collect light. We also showed proof of principle for measuring strain on a tendon mimic. The approach provides a simple method to study biomechanics using implantable sensors.

A fluorescence XAFS measurement instrument in the soft x-ray region toward observation under operando conditions

2015 ◽  
Vol 86 (3) ◽  
pp. 035103 ◽  
Author(s):  
M. Honda ◽  
Y. Baba ◽  
I. Shimoyama ◽  
T. Sekiguchi
Keyword(s):  
Measurement Instrument ◽  
X Ray ◽  
Fluorescence Xafs

A Study on 3D Micro-Topographical Measurement of FRCMC Grinding Surface

2013 ◽  
Author(s):  
Xiaoyan Cao ◽  
Bin Lin ◽  
Yan Wang ◽  
Shaolei Wang
Keyword(s):  
Surface Topography ◽  
Surface Quality ◽  
Optical Measurement ◽  
Measurement Instrument ◽  
Ceramic Matrix Composites ◽  
Sampling Interval ◽  
High Tech ◽  
Starting Position ◽  
Sampling Conditions

Fiber-reinforced ceramic matrix composites (FRCMCs) have potential applications in aerospace and other high-tech fields. Meanwhile, it is significant to evaluate the grinding surface quality of FRCMCs. But according to FRCMCs’ anisotropic and non-homogeneous structure, it is difficult to evaluatethe surface quality with the traditionalmeasuring method used in metal material. The present paper studied the 3D micro-topographical measurement and evaluationfrom a new perspective. The research is based on some new discovery that the material enhanced fiber orientation played key role in micro-topographical of FRCMC grinding surface. Using a non-contact optical measurement instrument, the method was developed on 2.5D SiO2/SiO2 composite. Through a series of measuring experiments, we found that both starting position of measurement and sampling conditions affected on the measurement results. This paper recommendedoptimization measurement parameter valuesof sampling conditions, and also analyzedcharacteristics of the RCMC grinding surface topography on amplitude, wave distribution and surface supportcharacteristics in details. The results show that the optimal range of sampling interval is 40 μm to 70 μm, the range of sampling area is better more than 64mm2 and the range of sampling speed is 8 to 14mm/s. The measurement of surface topography is the bridge framed between the manufacture and parts performance, so theresearchobtained will be an important technical support on improvingthe processing quality of FRCMC.

The analysis of structural properties and parameters of objectsusing an integrated approach to processing x-ray optical measurement

2018 ◽  
Vol 11 (7-8) ◽  
pp. 534-541
Author(s):  
D. Petrakov ◽  
N. Gerasimenk ◽  
N. Medetov ◽  
D. Smirnov ◽  
R. Suyundukov
Keyword(s):  
Structural Properties ◽  
Optical Measurement ◽  
Integrated Approach ◽  
X Ray

Production Control of Gold and Rhodium Plating Thickness on Very Small Samples by X-Ray Spectroscopy

1967 ◽  
Vol 11 ◽  
pp. 185-190
Author(s):  
George H. Glade
Keyword(s):  
Sample Size ◽  
Production Control ◽  
Control Method ◽  
Optical Measurement ◽  
Small Sample Size ◽  
Base Material ◽  
Small Sample ◽  
Optical Methods ◽  
Small Samples ◽  
X Ray

AbstractManufacture of reed switches, critical components in present-day dataprocessing support devices, requires a means of accurate, rapid analysis of elements used in plating tlie levers of the switch. Because of gready reduced feedback time, X-ray spectroscopy has replaced metallographic sectioning and optical measurement as a plating-thickness control method. While 6 hr were required to obtain thickness data for a given sample size by sectioning, X-ray spectroscopy requires only 2 hr, which permits better control of the plating operating. X-ray spectroscopy is now used routinely to control both gold and rhodium plating thicknesses in the 20- to 100μin. (1 × 10−6) thickness range. The large number of samples prevents long count duration, while the small sample size (0.110 by 0.033 in.) reduces the precision of the analysis. However, the precision of the X-ray and optical methods is approximately the same, 8% variance. X-ray accuracy is comparable to that of sectioning since the standards are obtained by sectioning. Simplicity of operation is required since relatively untrained operators are used. An aperture system is used to reduce background. The rhodium thickness measurement is obtained from gross rhodium intensity. Attenuation of gross nickel intensity from the base material was found to be a better measure of gold thickness intensity. Calibration for hoth gold and rhodium is performed by using the same wide detector conditions. The choice of analysis is made by changing only the 2θ angle, thus avoiding the time required for recalibration when changing analysis.

scholarly journals PENERAPAN RANCANG BANGUN pH METER BERBASIS ARDUINO PADA MESIN PENCUCI FILM RADIOGRAFI SINAR-X

2017 ◽  
Vol 6 (1) ◽  
pp. 66
Author(s):  
Muchamad Ngafifuddin ◽  
Sunarno Sunarno ◽  
Susilo Susilo
Keyword(s):  
Acidic Solution ◽  
Measurement Instrument ◽  
Ph Measurement ◽  
Basic Solution ◽  
Buffer Solution ◽  
X Ray ◽  
Examination Result ◽  
Positive Voltage ◽  
Arduino Uno ◽  
Radiograph Image

Perancangan pH meter berbasis Arduino dilakukan untuk membuat alat ukur pH yang kompatibel dengan alat mesin pencuci film otomatis. Pengukuran pH pada larutan fixer sangat diperlukan karena tingkat pH sangat berpengaruh terhadap hasil citra radiografi. Pada penelitian ini telah dilakukan rancang bangun pH meter berbasis arduino uno. Rancang bangun alat ini menggunakan sensor E-201C,  arduino uno, dan tampilan PC. Pengambilan data dilakukan menggunakan variasi larutan buffer. Hasil dari karakterisasi sensor menunjukkan sensor memiliki nilai sensitivitas 46,2mV/pH pada suhu 28oC. Pengukuran pada larutan asam menghasilkan tegangan sensor bernilai positif, larutan netral menghasilkan tegangan sensor mendekati nol, dan larutan basa menghasilkan tegangan sensor bernilai negatif. Berdasarkan hasil pengujian, pH meter yang dibuat mampu mengukur rentang nilai pH 1,6 sampai dengan 11 dengan ketelitian 99% dan layak digunakan sebagai alat ukur pH pada mesin pencuci film radiografi.Kata Kunci : Larutan fixer, sensor E-201C, arduino uno, pH meter Abstract Design of pH meter based on Arduino had done to create pH measurement instrument that compatible with automatic washing machine of x-ray radiograph film. The pH Measurement on buffer solution is important because acidic level extremely effect to result of radiograph image. In this research,  the design of pH meter based on arduino uno has been performed. Sensor of E-201C, arduino uno an display PC used to designed of pH meter. Buffer solution has variated to get a data result. The result of sensor characterization shows that the sensitivity of the sensor is about 46.2mV/pH in the temperature of 28C. Measurement of acidic solution give result of positive voltage, netral solution voltage of limit to zero, and basic solution of negative voltage. According to the examination result,  pH meter has made as can measure pH with ranges of 1,6 to 11 with 99% accuracy and proper to use as a pH measuring instrument to wash film radiography equipment.Keywords : Buffer Solution, Sensor of E-201C, Arduino uno, pH meter

scholarly journals Molecular Orientation Behaviors with Optical Measurement and X-Ray Diffraction for Strip-Biaxially Stretched Syndiotactic Polypropylene Films.

1999 ◽  
Vol 56 (7) ◽  
pp. 445-455 ◽  
Author(s):  
Keiji NAGAYA ◽  
Yasushi HATANO ◽  
Sadao HIBI ◽  
Tsuneo KAWAKAMI ◽  
Yousuke KAKIZAKI ◽  
...  
Keyword(s):  
Molecular Orientation ◽  
Optical Measurement ◽  
X Ray Diffraction ◽  
Syndiotactic Polypropylene ◽  
X Ray ◽  
Polypropylene Films

Standard Sample Package for Calibration of X-Ray Stress Measurement

2013 ◽  
Vol 768-769 ◽  
pp. 242-245
Author(s):  
Shoichi Yasukawa ◽  
Tatsuki Miyoshi ◽  
Masayuki Yamamoto ◽  
Takashi Yamamoto ◽  
Shinichi Ohya
Keyword(s):  
Residual Stress ◽  
Standard Sample ◽  
Stress Measurement ◽  
Bulk Material ◽  
Measurement Instrument ◽  
Powder Particle Size ◽  
Standard Samples ◽  
Beam Position ◽  
X Ray ◽  
Wide Range

The purpose of our study is to provide standard samples for X-ray stress measurement. Typically zero adjustment is performed by a stress free sample which is a fine powder of pure metal. However, if the sample has stress (not stress-free), the stress value obtained by measurement can contain the errors caused by each stress measurement instrument. To solve this instrumental error, we have created a standard sample package. The sample package includes the following three samples. 1) Fluorescent powder to confirm the beam position and size. 2) Iron powder (particle size 6-8μm) to calibrate the zero-stress. 3) Bulk iron material which has approx. -100(MPa) of residual stress. Each sample has been laid out in a 6mm thick plate, and each sample can be selected by sliding the plate manually. By measuring the bulk material and the powder, correction and calibration of the stress measurement instrument is possible. The manufacturing process employed in this study has confirmed that the iron bulk material does not have residual stress and FWHM changes over time in the past 20 years. Therefore, the standard sample can be used semi permanently by adequate management. Correction of instrument by using this standard sample package increases the reliability of X-ray stress measurement method which will help to employ it in a wide range of practical uses.

scholarly journals Analyses of direct verification data of Rockwell diamond indenters by iterative regression method

ACTA IMEKO ◽  
2014 ◽  
Vol 3 (3) ◽  
pp. 15 ◽  
Author(s):  
Satoshi Taakagi
Keyword(s):  
Dimensional Analysis ◽  
Cross Sections ◽  
Optical Measurement ◽  
Three Dimensional ◽  
Measurement Instrument ◽  
Least Square ◽  
National Standard ◽  
National Metrology Institute ◽  
Geometrical Parameters ◽  
Profile Measurement

For the verification of Rockwell diamond indenters exactly compliant to the international definition, an iterative method with the least square circle fitting was introduced. This method was applied to the analysis of verification data obtained with a laser probe 3D profile measurement instrument. The geometry of a Rockwell diamond indenter was verified with the equipment as an example. Conventional analyses on cross sections of an indenter is demonstrated as well as three dimensional analysis of indenter geometry. The analyses on cross sections showed that the technique can be used to express the geometrical parameters described in the definition of CIPM/CCM/WGH properly, whereas three dimensional analysis enables to express the imperfection of geometry with fewer parameters. In addition, this technique can be applicable to determine equivalent geometrical parameters obtained with the optical measurement system currently used at the National Metrology Institute of Japan (NMIJ) to establish the national standard indenters. It is shown that the proposed method describes the geometry of indenter better than currently used method. These results suggest that the uncertainty of the national standard indenter could be improved through this high resolution geometry measurement and the multiple regression analysis NMIJ is using.

Sign in / Sign up

Export Citation Format

Share Document