Discontinuity-Induced Bifurcations in Systems With Hysteretic Force Interactions

2009 ◽  
Vol 4 (4) ◽  
Author(s):  
Harry Dankowicz ◽  
Mark R. Paul
Keyword(s):  
Thin Liquid Film ◽  
Sample Surface ◽  
Mapping Technique ◽  
Hysteretic Model ◽  
Contact Mode ◽  
Atomic Force ◽  
Discontinuity Mapping ◽  
Intermittent Contact ◽  
Parameter Values ◽  
Grazing Contact

This paper presents the application of the discontinuity-mapping technique to the analysis of discontinuity-induced bifurcations of periodic trajectories in an example hybrid dynamical system in which changes in the vector field associated with the crossing of a discontinuity-surface depend on the direction of crossing. The analysis is motivated by a hysteretic model of the capillary force interactions between an atomic-force-microscope cantilever probe tip and a nanoscale sample surface in the presence of a thin liquid film on the tip and the surface and operating in intermittent-contact mode. The analysis predicts the sudden termination of branches of periodic system responses at parameter values corresponding to grazing contact with the onset of the hysteretic force interactions. It further establishes the increase beyond all bounds of the magnitude of one of the eigenvalues of the linearization of a suitably defined Poincaré mapping, indicating the destabilizing influence of near-grazing contact.

Discontinuity-Induced Bifurcations in Systems With Hysteretic Force Interactions

2008 ◽  
Author(s):  
Harry Dankowicz ◽  
Mark R. Paul
Keyword(s):  
Thin Liquid Film ◽  
Sample Surface ◽  
Mapping Technique ◽  
Hysteretic Model ◽  
Contact Mode ◽  
Atomic Force ◽  
Discontinuity Mapping ◽  
Intermittent Contact ◽  
Parameter Values ◽  
Grazing Contact

This paper presents the application of the discontinuity-mapping technique to the analysis of discontinuity-induced bifurcations of periodic trajectories in an example piecewise smooth system in which changes in the vector field associated with the crossing of a discontinuity-surface depend on the direction of crossing. The analysis is motivatived by a hysteretic model of the capillary force interactions between an atomic-force-microscope cantilever probe tip and a nanoscale sample surface in the presence of a thin liquid film on the tip and the surface and operating in intermittent-contact mode. The analysis predicts the sudden termination of branches of periodic system responses at parameter values corresponding to grazing contact with the onset of the hysteretic force interactions. It further establishes the increase beyond all bounds of the magnitude of one of the eigenvalues of the linearization of a suitably defined Poincare´ mapping indicating the destabilizing influence of near-grazing contact.

scholarly journals Wide range local resistance imaging on fragile materials by conducting probe atomic force microscopy in intermittent contact mode

2016 ◽  
Vol 108 (24) ◽  
pp. 243101 ◽  
Author(s):  
Aymeric Vecchiola ◽  
Pascal Chrétien ◽  
Sophie Delprat ◽  
Karim Bouzehouane ◽  
Olivier Schneegans ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Local Resistance ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Wide Range ◽  
Intermittent Contact

Acquisition of High Precision Images for Non-Contact Atomic Force Microscopy via Direct Identification of Sample Height

2005 ◽  
Author(s):  
H. N. Pishkenari ◽  
Nader Jalili ◽  
A. Meghdari
Keyword(s):  
High Precision ◽  
Single Mode ◽  
Scanning Speed ◽  
Sample Surface ◽  
Biological Species ◽  
Atomic Scale ◽  
Contact Mode ◽  
Practical Applications ◽  
Atomic Force ◽  
Sample Height

Atomic force microscopes (AFM) can image and manipulate sample properties at the atomic scale. The non-contact mode of AFM offers unique advantages over other contemporary scanning probe techniques, especially when utilized for reliable measurements of soft samples (e.g., biological species). The distance between cantilever tip and sample surface is a time varying parameter even for a fixed sample height, and hence, difficult to identify. A remedy to this problem is to directly identify the sample height in order to generate high precision, atomic-resolution images. For this, the microcantilever is modeled by a single mode approximation and the interaction between the sample and cantilever is derived from a van der Waals potential. Since in most practical applications only the microcantilever deflection is accessible, this measurement is utilized to identify the sample height in each point. Using the proposed approach for identification of the sample height, the scanning speed can be increased significantly. Furthermore, for taking atomic-scale images of atomically flat samples, there is no need to use the feedback loop to achieve setpoint amplitude. Simulation results are provided to demonstrate the effectiveness of the approach and suggest the most suitable technique for the sample height identification.

Immobilization method of yeast cells for intermittent contact mode imaging using the atomic force microscope

2010 ◽  
Vol 110 (3) ◽  
pp. 254-258 ◽  
Author(s):  
Tathagata De ◽  
Antony M. Chettoor ◽  
Pranav Agarwal ◽  
Murti V. Salapaka ◽  
Saju Nettikadan
Keyword(s):  
Atomic Force Microscope ◽  
Yeast Cells ◽  
Contact Mode ◽  
Atomic Force ◽  
Intermittent Contact ◽  
Immobilization Method

scholarly journals Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis

2020 ◽  
Vol 11 ◽  
pp. 453-465 ◽  
Author(s):  
Berkin Uluutku ◽  
Santiago D Solares
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Potential ◽  
Current Response ◽  
Contact Mode ◽  
Higher Harmonics ◽  
Conductive Afm ◽  
Force Microscopy ◽  
Atomic Force ◽  
Static Contact ◽  
Intermittent Contact

Atomic force microscopy (AFM) is an important tool for measuring a variety of nanoscale surface properties, such as topography, viscoelasticity, electrical potential and conductivity. Some of these properties are measured using contact methods (static contact or intermittent contact), while others are measured using noncontact methods. Some properties can be measured using different approaches. Conductivity, in particular, is mapped using the contact-mode method. However, this modality can be destructive to delicate samples, since it involves continuously dragging the cantilever tip on the surface during the raster scan, while a constant tip–sample force is applied. In this paper we discuss a possible approach to develop an intermittent-contact conductive AFM mode based on Fourier analysis, whereby the measured current response consists of higher harmonics of the cantilever oscillation frequency. Such an approach may enable the characterization of soft samples with less damage than contact-mode imaging. To explore its feasibility, we derive the analytical form of the tip–sample current that would be obtained for attractive (noncontact) and repulsive (intermittent-contact) dynamic AFM characterization, and compare it with results obtained from numerical simulations. Although significant instrumentation challenges are anticipated, the modelling results are promising and suggest that Fourier-based higher-harmonics current measurement may enable the development of a reliable intermittent-contact conductive AFM method.

scholarly journals A Non-Destructive, Tuneable Method to Isolate Live Cells for High-Speed AFM Analysis

2021 ◽  
Vol 9 (4) ◽  
pp. 680
Author(s):  
Christopher T. Evans ◽  
Sara J. Baldock ◽  
John G. Hardy ◽  
Oliver Payton ◽  
Loren Picco ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
High Speed ◽  
Single Cells ◽  
Sample Surface ◽  
Live Cells ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Analysis

Suitable immobilisation of microorganisms and single cells is key for high-resolution topographical imaging and study of mechanical properties with atomic force microscopy (AFM) under physiologically relevant conditions. Sample preparation techniques must be able to withstand the forces exerted by the Z range-limited cantilever tip, and not negatively affect the sample surface for data acquisition. Here, we describe an inherently flexible methodology, utilising the high-resolution three-dimensional based printing technique of multiphoton polymerisation to rapidly generate bespoke arrays for cellular AFM analysis. As an example, we present data collected from live Emiliania huxleyi cells, unicellular microalgae, imaged by contact mode High-Speed Atomic Force Microscopy (HS-AFM), including one cell that was imaged continuously for over 90 min.

The Development of the "Terra AFM" Microscope

2014 ◽  
Vol 223 ◽  
pp. 299-307
Author(s):  
Sławomir Pawłowski ◽  
Grzegorz Dobiński ◽  
Marek Smolny ◽  
Andrzej Majcher ◽  
Andrzej Zbrowski ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Modular Design ◽  
Advanced Imaging ◽  
Contact Mode ◽  
Atomic Force ◽  
Advanced Technologies ◽  
Intermittent Contact

The article describes the development of the atomic force microscope “Terra AFM.” The microscope has been designed and built by the authors as a device for research applications in advanced technologies in industry and in teaching. The modular design of the microscope - the majority of mechanical, electronic and informatics solutions - facilitates the development and introduction of new functionality. Two new modules, correction of piezoelectric scanner nonlinearity and advanced imaging, using the measurement of the amplitude and phase of harmonics of the signal from the probe in the intermittent contact mode, are presented.

Modeling and Simulation of Non-Contact Atomic Force Microscope

2010 ◽  
Author(s):  
Mohammadreza Bahrami ◽  
Asghar Ramezani ◽  
Kambiz Ghaemi Osquie
Keyword(s):  
Atomic Force Microscope ◽  
Frequency Response ◽  
Multiple Scales ◽  
Sample Surface ◽  
Parameter System ◽  
Contact Mode ◽  
Atomic Force ◽  
Lumped Parameter ◽  
Mode Of Operation ◽  
Response Equation

The Atomic force microscope in non-contact mode of operation is modeled as a lumped parameter system. The interaction of the cantilever tip with the sample surface through the van der Waals force introduces the nonlinearity to the model. The model is analyzed by the method of multiple scales and the frequency response equation is obtained. The effects of the nonlinearity, amplitude of excitation, and damping coefficient on the frequency response are studied.

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