Effect of Interface Layers on Scattering of Elastic Waves

1988 ◽  
Vol 55 (4) ◽  
pp. 871-878 ◽  
Author(s):  
R. Paskaramoorthy ◽  
S. K. Datta ◽  
A. H. Shah

Scattering of elastic waves by spheroidal elastic inclusions has been studied in this paper. Particular attention has been focused on the effect of interface layers between the inclusions and the matrix on the scattering cross-sections. It has been assumed that properties of each layer is constant through its thickness. For spheroidal inclusion this problem cannot be solved by exact means. We have used a hybrid finite element and wave function expansion technique to analyze the problem. It is shown that solutions thus obtained for spherical inclusions and cavities agree well with analytical solutions. For spheroidal inclusions we show that when the interface layer properties are intermediate between those of the particles and the matrix the scattering cross-section increases. These results can be useful in characterizing interface layer properties.

1990 ◽  
Vol 57 (3) ◽  
pp. 672-676 ◽  
Author(s):  
P. Olsson ◽  
S. K. Datta ◽  
A. Bostrom

The scattering of elastic waves by elastic inclusions surrounded by interface layers is a problem of interest for nondestructive evaluation of interfaces in composites. In the present paper the scattering by a single elastic inclusion is studied. The scattering problem is solved by means of the null field approach and the properties of the interface layer enters through the boundary conditions on the inclusion. Various ways of doing this have been tried, from the simpler approach of just keeping the inertia of the layer, to using a membrane type of approximation or a more sophisticated method that includes all effects to first order in the layer thickness. The results obtained by using these different methods are compared numerically and with the exact solution for a layered sphere and with some recent results for a spheroid obtained using a hybrid finite element and wave function expansion technique. The numerical results show significant dependence on parameters containing the thickness and stiffness of the interface layer.


1960 ◽  
Vol 38 (12) ◽  
pp. 1654-1660 ◽  
Author(s):  
Ta-You Wu

The elastic (1s–1s) and the inelastic (1s–2s, 1s–2p) scattering cross sections in the Born approximation at energies of 1, 4, 9, 16 rydbergs have been calculated exactly from the closed formulas of the matrix elements for these transitions. Both the differential and the total cross sections are given here.


Author(s):  
P.A. Crozier

Absolute inelastic scattering cross sections or mean free paths are often used in EELS analysis for determining elemental concentrations and specimen thickness. In most instances, theoretical values must be used because there have been few attempts to determine experimental scattering cross sections from solids under the conditions of interest to electron microscopist. In addition to providing data for spectral quantitation, absolute cross section measurements yields useful information on many of the approximations which are frequently involved in EELS analysis procedures. In this paper, experimental cross sections are presented for some inner-shell edges of Al, Cu, Ag and Au.Uniform thin films of the previously mentioned materials were prepared by vacuum evaporation onto microscope cover slips. The cover slips were weighed before and after evaporation to determine the mass thickness of the films. The estimated error in this method of determining mass thickness was ±7 x 107g/cm2. The films were floated off in water and mounted on Cu grids.


2020 ◽  
Vol 102 (11) ◽  
Author(s):  
Hidenori Fukaya ◽  
Shoji Hashimoto ◽  
Takashi Kaneko ◽  
Hiroshi Ohki

2021 ◽  
Vol 27 (S1) ◽  
pp. 600-602
Author(s):  
Zezhong Zhang ◽  
Annick De Backer ◽  
Ivan Lobato ◽  
Sandra Van Aert ◽  
Peter Nellist

Pramana ◽  
1998 ◽  
Vol 51 (3-4) ◽  
pp. 453-461 ◽  
Author(s):  
P. Rawat ◽  
K. P. Subramanian ◽  
Vijay Kumar

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