Emittance of Boehmite and Alumina Films on 6061 Aluminum Alloy Between 295 and 773 K

1991 ◽  
Vol 113 (1) ◽  
pp. 185-189 ◽  
Author(s):  
T. G. Kollie ◽  
T. D. Radcliff ◽  
F. J. Weaver
Keyword(s):  
Aluminum Alloy ◽  
National Laboratory ◽  
X Ray Diffraction ◽  
Anodized Aluminum ◽  
Aluminum Films ◽  
Oak Ridge ◽  
Alumina Films ◽  
Loss Of Coolant Accident ◽  
Total Hemispherical Emittance ◽  
Loss Of Coolant

The total hemispherical emittance of an oxide film that formed on 6061-T6 aluminum alloy parts in the Tower Shielding Reactor-II at Oak Ridge National Laboratory was measured from 295 to 773 K using an emissometer and/or a calorimeter. The emittance of this film was critically needed for heat transfer calculations in a simulated loss-of-coolant accident of the reactor. X-ray diffraction analysis identified the film as boehmite (Al2O3·H2O), which dehydrated to alumina (Al2O3) upon heating above 473 K. The measured emittances for the alumina film are in excellent agreement with published values for anodized aluminum films and for bulk alumina. Published values of the emittance of boehmite could not be found for comparison, but evidence is presented that some anodization processes for aluminum yield boehmite and not alumina films.

Observation of grain superstructure in thin aluminum films by orientation imaging microscopy

1995 ◽  
Vol 53 ◽  
pp. 436-437
Author(s):  
Roger Alvis ◽  
David Dingley ◽  
David Field
Keyword(s):  
Aluminum Alloy ◽  
Orientation Imaging Microscopy ◽  
Test Structure ◽  
Al Alloy ◽  
X Ray Diffraction ◽  
Aluminum Films ◽  
Orientation Imaging ◽  
Reliability Parameters ◽  
Transmission Electron ◽  
Thin Aluminum

The correlation of aluminum alloy reliability data to microstructure has long been the goal of those scientists seeking to model electromigration behavior of interconnects. Traditionally, microstructural information has been acquired through x-ray diffraction , and transmission electron microscopy (TEM). However, each of these techniques is capable of delivering only part of the characterization whole. We describe the application of orientation imaging microscopy (OIM) to thin aluminum alloy films and demonstrate its versatility in providing the key microstructural reliability parameters: namely texture and grain size, as well as providing insight to the microstructure of grain boundaries.OIM was performed on an electromigration test structure (figure 1). The Al-alloy was deposited on titanium and capped with an anti-reflective titanium nitride. Subsequently, the test structure was patterned and capped with a multilayer blanket consisting of silicon nitride (SiN), and SiO2. The structure was annealed after the SOG deposition at 450° C for 90 minutes, seeing no electrical stressing. The die was removed from the package and deprocessed before the OIM was acquired.

Plug-in scripts for EFTEM automation

1996 ◽  
Vol 54 ◽  
pp. 546-547
Author(s):  
N. D. Evans ◽  
M. K. Kundmann
Keyword(s):  
Electron Microscopy ◽  
National Laboratory ◽  
Oak Ridge ◽  
Multiple User ◽  
Transmission Electron ◽  
Short Period ◽  
User Facility ◽  
Instrument Control ◽  
And Control ◽  
Research Equipment

Post-column energy-filtered transmission electron microscopy (EFTEM) is inherently challenging as it requires the researcher to setup, align, and control both the microscope and the energy-filter. The software behind an EFTEM system is therefore critical to efficient, day-to-day application of this technique. This is particularly the case in a multiple-user environment such as at the Shared Research Equipment (SHaRE) User Facility at Oak Ridge National Laboratory. Here, visiting researchers, who may oe unfamiliar with the details of EFTEM, need to accomplish as much as possible in a relatively short period of time.We describe here our work in extending the base software of a commercially available EFTEM system in order to automate and streamline particular EFTEM tasks. The EFTEM system used is a Philips CM30 fitted with a Gatan Imaging Filter (GIF). The base software supplied with this system consists primarily of two Macintosh programs and a collection of add-ons (plug-ins) which provide instrument control, imaging, and data analysis facilities needed to perform EFTEM.

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