An Investigation of the Cutting Process for Chip Breaking Monitoring in Turning of Steels

1998 ◽  
Vol 120 (3) ◽  
pp. 555-562 ◽  
Author(s):  
W. Grzesik ◽  
P. Bernat
Keyword(s):  
Frequency Domain ◽  
Control Factor ◽  
Interface Temperature ◽  
State Monitoring ◽  
Chip Breaking ◽  
Interface Control ◽  
Orthogonal Machining ◽  
Wide Range ◽  
On Line ◽  
On Chip

This paper presents some results of an experimental study on chip breaking monitoring when turning steels with chip forming inserts. In the first part of this study the recognition of chip forms by means of cutting force analysis in the frequency domain is described. Generally, the present work is concerned with the use of the interface control factor for determining the transition from unacceptable chip forms to the chip breaking. For this purpose experiments under approximately orthogonal machining conditions including measuring the shear strain, the cutting energy and the average interface temperature are carried out. The obtained results confirmed that the initiation of acceptable chip breaking for a wide range of cutting conditions and the three steels used could be predicted in terms of an appropriate energy consumption rate. An architecture for on-line cutting state monitoring system based on signal processing procedure in the frequency domain is developed and the performance of the system is experimentally evaluated.

GIS: State Monitoring Tool for Pipelines

1996 ◽  
Author(s):  
Barnabás Pallaghy ◽  
András Bartos
Keyword(s):  
Information System ◽  
Pipeline System ◽  
State Monitoring ◽  
Technical Data ◽  
Gis Applications ◽  
Wide Range ◽  
On Line ◽  
Manual Handling ◽  
Integrity Analysis ◽  
To Receive

Analysis of the breakdown-statistics of the Hungarian crude and gas pipeline system dating back more than 20 years shows the main sources of the errors. In order to prevent these, we have started a vast program regarding state monitoring of pipelines by means of the common use of on-line and above-ground methodes. Related expenses are as high as 8% of maintenance costs. Manual handling and analysing of the available and continually increasing data nowadays is already insoluble. To solve the problem, we have decided to develop an integrated information system that integrates the technical data with the up-to-date GIS applications, thus providing a wide-range application possibility for the operating staff. Integrity analysis is supported by the system, which shows the various examination results in a comparable way, their change in time can be followed, and there is a possibility to automatically compare them sinchronously with map displaying. The system is able to receive and process the results of outer examination (for example such as of an intelligent pipe scraper), but the sinchronous transmission into outer systems is also possible. The development of the information system and especially the input of the data into the system is possible only at great costs but the usefulness of the application and the turnover of the investment can be, even if only undirectly, proved.

Recent Progress and Plans in Computer-Controlled High Resolution Electron Microscopy

1990 ◽  
Vol 48 (1) ◽  
pp. 154-155
Author(s):  
W.J. de Ruijter ◽  
Peter Rez ◽  
David J. Smith
Keyword(s):  
Electron Microscopy ◽  
Digital Processing ◽  
High Resolution Electron Microscopy ◽  
Objective Lens ◽  
Linear Filter ◽  
Contrast Transfer Function ◽  
Image Displacement ◽  
Spatially Resolved ◽  
Wide Range ◽  
On Line

Digital computers are becoming widely recognized as standard accessories for electron microscopy. Due to instrumental innovations the emphasis in digital processing is shifting from off-line manipulation of electron micrographs to on-line image acquisition, analysis and microscope control. An on-line computer leads to better utilization of the instrument and, moreover, the flexibility of software control creates the possibility of a wide range of novel experiments, for example, based on temporal and spatially resolved acquisition of images or microdiffraction patterns. The instrumental resolution in electron microscopy is often restricted by a combination of specimen movement, radiation damage and improper microscope adjustment (where the settings of focus, objective lens stigmatism and especially beam alignment are most critical). We are investigating the possibility of proper microscope alignment based on computer induced tilt of the electron beam. Image details corresponding to specimen spacings larger than ∼20Å are produced mainly through amplitude contrast; an analysis based on geometric optics indicates that beam tilt causes a simple image displacement. Higher resolution detail is characterized by wave propagation through the optical system of the microscope and we find that beam tilt results in a dispersive image displacement, i.e. the displacement varies with spacing. This approach is valid for weak phase objects (such as amorphous thin films), where transfer is simply described by a linear filter (phase contrast transfer function) and for crystalline materials, where imaging is described in terms of dynamical scattering and non-linear imaging theory. In both cases beam tilt introduces image artefacts.

A Wide Range Ge Gamma-Ray Spectrometer for on-Line Measurements of Reactor Cooling Water Activity

1977 ◽  
Vol 24 (1) ◽  
pp. 673-677 ◽  
Author(s):  
J. J. Lipsett ◽  
I. L. Fowler ◽  
R. J. Dinger ◽  
H. L. Malm
Keyword(s):  
Water Activity ◽  
Gamma Ray ◽  
Cooling Water ◽  
Gamma Ray Spectrometer ◽  
Wide Range ◽  
On Line

scholarly journals A Stochastic Model to Describe the Scattering in the Response of Polysilicon MEMS

2021 ◽  
Vol 2 (1) ◽  
pp. 95
Author(s):  
Luca Dassi ◽  
Marco Merola ◽  
Eleonora Riva ◽  
Angelo Santalucia ◽  
Andrea Venturelli ◽  
...  
Keyword(s):  
Silicon Film ◽  
Micro Fabrication ◽  
Micro Electro Mechanical Systems ◽  
Local Fluctuations ◽  
Stochastic Framework ◽  
On Line ◽  
Chip Testing ◽  
On Chip ◽  
Time Required ◽  
Polycrystalline Silicon Film

The current miniaturization trend in the market of inertial microsystems is leading to movable device parts with sizes comparable to the characteristic length-scale of the polycrystalline silicon film morphology. The relevant output of micro electro-mechanical systems (MEMS) is thus more and more affected by a scattering, induced by features resulting from the micro-fabrication process. We recently proposed an on-chip testing device, specifically designed to enhance the aforementioned scattering in compliance with fabrication constraints. We proved that the experimentally measured scattering cannot be described by allowing only for the morphology-affected mechanical properties of the silicon films, and etch defects must be properly accounted for too. In this work, we discuss a fully stochastic framework allowing for the local fluctuations of the stiffness and of the etch-affected geometry of the silicon film. The provided semi-analytical solution is shown to catch efficiently the measured scattering in the C-V plots collected through the test structure. This approach opens up the possibility to learn on-line specific features of the devices, and to reduce the time required for their calibration.

Estimation of the Thermodynamic Properties of Branched Hydrocarbons

2000 ◽  
Vol 122 (3) ◽  
pp. 147-152 ◽  
Author(s):  
Hui He ◽  
Mohamad Metghalchi ◽  
James C. Keck
Keyword(s):  
Thermodynamic Properties ◽  
Degrees Of Freedom ◽  
Statistical Thermodynamic ◽  
Motion Modes ◽  
Branched Alkanes ◽  
Branched Hydrocarbons ◽  
Wide Range ◽  
On Line ◽  
Kinetic Calculations ◽  
Good Agreement

A simple model has been developed to estimate the sensible thermodynamic properties such as Gibbs free energy, enthalpy, heat capacity, and entropy of hydrocarbons over a wide range of temperatures with special attention to the branched molecules. The model is based on statistical thermodynamic expressions incorporating translational, rotational and vibrational motions of the atoms. A method to determine the number of degrees of freedom for different motion modes (bending and torsion) has been established. Branched rotational groups, such as CH3 and OH, have been considered. A modification of the characteristic temperatures for different motion mode has been made which improves the agreement with the exact values for simple cases. The properties of branched alkanes up to 2,3,4,-trimthylpentane have been calculated and the results are in good agreement with the experimental data. A relatively small number of parameters are needed in this model to estimate the sensible thermodynamic properties of a wide range of species. The model may also be used to estimate the properties of molecules and their isomers, which have not been measured, and is simple enough to be easily programmed as a subroutine for on-line kinetic calculations. [S0195-0738(00)00902-X]

A STUDY ON CHIP BREAKING LIMITS IN MACHINING

1999 ◽  
Vol 3 (1) ◽  
pp. 25-48 ◽  
Author(s):  
Z. Li ◽  
Y. Rong
Keyword(s):  
Chip Breaking ◽  
On Chip

Health care Online

2000 ◽  
Vol 1 (2) ◽  
pp. 24-25
Keyword(s):  
Health Care ◽  
Health Care Policy ◽  
Central Government ◽  
Medical Profession ◽  
Medical Opinion ◽  
Proactive Approach ◽  
The United Kingdom ◽  
Wide Range ◽  
On Line ◽  
The Subject

The BMJ has always been recognised as a leading medical journal for a wide range of subjects, and has always been useful for nurses to access for up to date and current medical opinion. Recently the BMJ has diversified to take on a more political nature, with its content reflecting a more proactive approach to influencing health care policy in the United Kingdom by the medical profession. As such the BMJ has become extremely useful for identifying opinions of current ‘hot topics’ for nurses that are headline news such as nurse consultants, hospital administration and central government policy. However, one problem remains, trying to find the original copy in the library will remain difficult. After spending the best part of an hour to suddenly realise that ‘how silly you are for not realising that BMJ March 1997 is filed in the British Journal of Nursing section 1998!!’ is often a frustrating and demoralising experience - particularly if after finding the article you find it has nothing to do with the subject that you are researching. This problem is to be banished forever with the BMJ website. The full BMJ is available free on line. The excellent search engine is particularly useful and is accurate when matching target articles. All articles are available for ‘full text’ downloads free of charge.

Artificial Neural Network and the Taguchi Method Application for Robust Wheatstone Bridge Design

1994 ◽  
Author(s):  
Jung-eui Hong ◽  
Cihan H. Dagli ◽  
Kenneth M. Ragsdell
Keyword(s):  
Neural Network ◽  
Artificial Neural Network ◽  
Wheatstone Bridge ◽  
Parameter Design ◽  
System Response ◽  
Measurement Circuit ◽  
Wide Range ◽  
Reduce Measurement Error ◽  
On Line ◽  
Artificial Neural

Abstract The primary function of the Wheatstone bridge is to measure an unknown resistance. The elements of this well-known measurement circuit will take on different values depending upon the range and accuracy required for a particular application. The Taguchi approach to parameter design is used to select values for the measurement circuit elements so as to reduce measurement error. Next we introduce the use of an artificial neural network to extrapolate limited experimental results to predict system response over a wide range of applications. This approach can be employed for on-line quality control of the manufacture of such device.

Sign in / Sign up

Export Citation Format

Share Document