scholarly journals Probing for Flaws

2001 ◽  
Vol 123 (10) ◽  
pp. 73
Author(s):  
John DeGaspari

This article focuses on NASA Langley that is manipulating carbon nanotubes to test for weaknesses in advanced aircraft materials. NASA’s Langley Research Center in Hampton, VA, is making use of nanotechnology to develop methods for nondestructive evaluation to support super lightweight, multifunctional structures. Carbon nanotubes, for instance, can be used as sensing elements embedded in materials. In general, nondestructive evaluation methods could be used to detect flaws in material structures, such as pressure vessels, air plane hulls that expand at high altitudes, or space stations subject to bombardment from meteorites. Using the NanoManipulator makes it possible to fine tune the position of the nanotubes. Besides plotting coordinates on a screen, the NanoManipulator’s haptic interface—a penlike device for guiding the scanning probe—will stop the user from pushing the probe tip through the surface of the sample.

RSC Advances ◽  
2019 ◽  
Vol 9 (48) ◽  
pp. 28135-28145
Author(s):  
Ahmed I. A. Abd El-Mageed ◽  
Takuji Ogawa

For the first time, using scanning probe microscopy, the supramolecular structures of terbium porphyrin double-decker complexes were observed on single-walled carbon nanotubes surfaces, where the molecules formed a well-ordered self-assembled array.


2010 ◽  
Vol 1258 ◽  
Author(s):  
Oleg Kononenko ◽  
S I Bozhko ◽  
V N Matveev ◽  
V T Volkov ◽  
M A Knyazev ◽  
...  

AbstractPd is widely used in producing electrodes to single-walled carbon nanotubes (SWNT). However up to now its ability to form ohmic contacts to SWNTs was not employed in scanning probe microscopy (SPM). Here we present a study of SWNTs with Pd electrodes by SPM using Pd-coated tips. SWNTs were selectively grown on oxidized silicon substrates by low pressure CVD method. Pd electrodes were prepared to SWNTs to fabricate two terminal structures for SWNTs resistance measurements. It is shown that SPM Kelvin mode is a reliable technique for SWNT detection on insulating substrate. Contact potential difference between Pd electrode and SWNT is measured using the Kelvin mode.


2006 ◽  
Author(s):  
Takahide Sakagami ◽  
Shiro Kubo ◽  
Yukio Hyodo ◽  
Toshio Ogasawara ◽  
Takashi Nishimura ◽  
...  

2010 ◽  
Author(s):  
Kenneth J. Faller II ◽  
Stephen Rizzi ◽  
Jacob Klos ◽  
William L. Chapin ◽  
Fahri Surucu ◽  
...  

1997 ◽  
Author(s):  
W.A. Ellingson ◽  
R.D. Koehl ◽  
J.B. Stuckey ◽  
J.G. Sun ◽  
H.P. Engel ◽  
...  

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