Microwave Imaging for the Integrity Assessment of IC Packages

2000 ◽  
Vol 123 (1) ◽  
pp. 42-46 ◽  
Author(s):  
Y. Ju ◽  
M. Saka ◽  
H. Abe´

Since IC packages have been made thinner and smaller, the delamination and crack, which may be induced in the soldering process, have become important factors affecting the reliability of the package. The ability to penetrate deeply inside dielectric materials, and to reflect completely at the metal surface makes microwave inspection very suitable to detect such delamination. The authors have recently developed a new microwave imaging technique that uses an open-ended coaxial line sensor to detect the delamination in IC packages. The image was created by measuring the phase of the effective reflection coefficient at the aperture of the coaxial line sensor. For better evaluation of the shape and the size of the delamination, a method to further increase the spatial resolution of microwave imaging was studied in the present paper. The resolution affected by the dimensions of the sensor, the frequency of operation, and the standoff distance between the sensor and the sample was investigated by experiment. The experimental results indicate that microwave imaging is a promising technique for the integrity assessment of IC packages.

Author(s):  
Yang Ju ◽  
Masumi Saka ◽  
Hiroyuki Abe´

Conductivity of silicon wafers was measured using the amplitude of the reflection coefficient of a microwave signal. A network analyzer was used to generate the microwave signal fed to a sensor and to measure the amplitude of the reflection coefficient. An open-ended coaxial line sensor was used to increase the spatial resolution and the sensitivity of the measurement. By microwave imaging, the distribution of the conductivity of a silicon wafer was mapped.


2021 ◽  
Vol 29 (1) ◽  
pp. 99-104
Author(s):  
V. M. Morozov ◽  
V. I. Magro

The calculation of the non-reflective connection in the coaxial line is performed by the integral equation method. The connection of coaxial lines with a significant difference in geometric dimensions is considered. A system of equations is obtained that allows calculating the reflection coefficient of the T-wave from such an inhomogeneity. This technique makes it possible to calculate a multistage coaxial waveguide in order to minimize the reflection coefficient from inhomogeneities.


2006 ◽  
Vol 55 (6) ◽  
pp. 1878-1884 ◽  
Author(s):  
Manuel Benedetti ◽  
Massimo Donelli ◽  
Anna Martini ◽  
Matteo Pastorino ◽  
Andrea Rosani ◽  
...  

Author(s):  
Chiara Dachena ◽  
Alessandro Fedeli ◽  
Alessandro Fanti ◽  
Matteo B. Lodi ◽  
Matteo Pastorino ◽  
...  

2016 ◽  
Vol 78 (6-2) ◽  
Author(s):  
Roshayati Yahya ◽  
Muhammad Ramlee Kamarudin ◽  
Norhudah Seman ◽  
Ali Moradikordalivand

In this paper, a wideband jean antenna with bending structure for flexible microwave imaging applications is presented. Coplanar waveguide (CPW) feeding structure with Koch shape ground slotted technique has been implemented for widening the bandwidth. The design evolution process of the proposed antenna is started from a simple CPW-fed monopole antenna to bending circumstance. The proposed antennas under normal condition, bending circumstance and as well as on-arm bending effect are simulated and optimized using CST microwave studio software and fabricated; also tested so as to validate the results . Under normal condition, the antenna provides measured bandwidth of 4500 MHz (1.5–6 GHz) in the case of |S11|≤−10 dB while 4360 MHz (1.44–5.8 GHz) for the measured bandwidth under bending circumstance is obtained. Also, there is a slight degradation on the reflection coefficient of the antenna under on-arm bending so that measured bandwidth became narrower with operating frequency of 3800 MHz (2.2–6 GHz). The measured gain of the antenna fluctuates between 2.5–5.6 dBi and 1.5–2.8 dBi with quasi-omnidirectional pattern within the expected frequency band for normal and bending condition, respectively. The proposed antenna provides a good performance in terms of its reflection coefficient and radiation characteristics. Therefore, due to insensitiveness to bending and body effect, the proposed antenna has become good candidate for microwave imaging applications.


2013 ◽  
Vol 64 (3) ◽  
Author(s):  
Rashidah Che Yob ◽  
Norhudah Seman

This article presents the reflection coefficient measurement by using a wideband multi-port reflectometer for microwave imaging application of human head. The configuration of the proposed wideband multi-port reflectometer is formed by passive components, which are four couplers and two power dividers operating from 1 to 6 GHz. The investigation is successfully done through simulation using the Agilent’s Advanced Design Systems (ADS) software and practical measurement in laboratory. An error correction method with three standards of match, open and short load is then applied to the constructed wideband multi-port reflectometer to remove its imperfect characteristics. The wideband characteristics of proposed reflectometer are analyzed and verified across the designated frequency band.  Its operation in reflection coefficient is tested with the chosen device under test (DUT).


1973 ◽  
Vol 12 (66) ◽  
pp. 383-397 ◽  
Author(s):  
C. H. Harrison

Radio echo-sounding surveys of Antarctica and Greenland have revealed extensive layering within the ice. Formulae for the effective reflection coefficient, when viewed by a pulsed radar, are derived for isolated or multiple randomly spaced layers. In the latter case the variation in dielectric constant with depth is described by a vertical autocorrelation function and a standard deviation. Some measurements of the reflection coefficient of layers, and the dielectric absorption of ice are given. The significance of the fading of layer echoes and the possible causes of variations in the dielectric constant are considered and some further investigations are suggested. It is concluded that the echo strengths found in the Antarctic may be explained by multiple layering, and that the necessary fractional change in the dielectric constant may be as small as 10−4. It is suggested that this change in dielectric constant may be due to differences in orientation of anisotropic ice crystals.


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