scholarly journals Action of vibration on the response of cat muscle spindle Ia afferents to low frequency sinusoidal stretching.

1981 ◽  
Vol 317 (1) ◽  
pp. 365-381 ◽  
Author(s):  
P B Matthews ◽  
J D Watson
1997 ◽  
Vol 77 (4) ◽  
pp. 2227-2231 ◽  
Author(s):  
Y. Masuda ◽  
T. Morimoto ◽  
O. Hidaka ◽  
T. Kato ◽  
R. Matsuo ◽  
...  

Masuda, Y., T. Morimoto, O. Hidaka, T. Kato, R. Matsuo, T. Inoue, M. Kobayashi, and A. Taylor. Modulation of jaw muscle spindle discharge during mastication in the rabbit. J. Neurophysiol. 77: 2227–2231, 1997. Discharges of jaw muscle spindles were recorded during chewing carrot from mesencephalic trigeminal nucleus (Mes V) in the awake rabbit to evaluate contribution of the muscle spindles to the development of complete sequences of masticatory movements. The Mes V spindle units were divided into two types according to the maximum firing rates during mastication, with a dividing line at 200 Hz; high-frequency units and low-frequency units. Although both types of units fired maximally during the jaw-opening phase of chewing cycles, their firing rates and pattern varied according to three sequential stages of mastication (stages I, IIa, and IIb). The high-frequency units often increased firing before the start of mastication and built up firing in the first few chewing cycles. Their maximal firing rate was sometimes lower during stage IIa (chewing stage) than during stage I (ingestion stage) and stage IIb (preswallowing stage), although the jaw movements were greater in stage IIa than in other stages. The phase relationship of the firing to a jaw movement cycle in stage IIa was consistent in individual units. The low-frequency units did not build up activity before the onset of movements. They fired mostly during the jaw-opening phase, but the peak of firing did not necessarily coincide with the time of maximal opening. It was concluded that the difference in the firing pattern among masticatory stages may be ascribed to a stage-dependent modulation of both fusimotor activity and jaw movement pattern.


1984 ◽  
Vol 44 (2) ◽  
pp. 137-142 ◽  
Author(s):  
C. Morin ◽  
E. Pierrot-Deseilligny ◽  
H. Hultborn

Author(s):  
K. Hama

The lateral line organs of the sea eel consist of canal and pit organs which are different in function. The former is a low frequency vibration detector whereas the latter functions as an ion receptor as well as a mechano receptor.The fine structure of the sensory epithelia of both organs were studied by means of ordinary transmission electron microscope, high voltage electron microscope and of surface scanning electron microscope.The sensory cells of the canal organ are polarized in front-caudal direction and those of the pit organ are polarized in dorso-ventral direction. The sensory epithelia of both organs have thinner surface coats compared to the surrounding ordinary epithelial cells, which have very thick fuzzy coatings on the apical surface.


Author(s):  
Robert E. Nordquist ◽  
J. Hill Anglin ◽  
Michael P. Lerner

A human breast carcinoma cell line (BOT-2) was derived from an infiltrating duct carcinoma (1). These cells were shown to have antigens that selectively bound antibodies from breast cancer patient sera (2). Furthermore, these tumor specific antigens could be removed from the living cells by low frequency sonication and have been partially characterized (3). These proteins have been shown to be around 100,000 MW and contain approximately 6% hexose and hexosamines. However, only the hexosamines appear to be available for lectin binding. This study was designed to use Concanavalin A (Con A) and Ricinus Communis (Ricin) agglutinin for the topagraphical localization of D-mannopyranosyl or glucopyranosyl and D-galactopyranosyl or DN- acetyl glactopyranosyl configurations on BOT-2 cell surfaces.


Author(s):  
P. A. Marsh ◽  
T. Mullens ◽  
D. Price

It is possible to exceed the guaranteed resolution on most electron microscopes by careful attention to microscope parameters essential for high resolution work. While our experience is related to a Philips EM-200, we hope that some of these comments will apply to all electron microscopes.The first considerations are vibration and magnetic fields. These are usually measured at the pre-installation survey and must be within specifications. It has been our experience, however, that these factors can be greatly influenced by the new facilities and therefore must be rechecked after the installation is completed. The relationship between the resolving power of an EM-200 and the maximum tolerable low frequency interference fields in milli-Oerstedt is 10 Å - 1.9, 8 Å - 1.4, 6 Å - 0.8.


Author(s):  
G. Y. Fan ◽  
J. M. Cowley

It is well known that the structure information on the specimen is not always faithfully transferred through the electron microscope. Firstly, the spatial frequency spectrum is modulated by the transfer function (TF) at the focal plane. Secondly, the spectrum suffers high frequency cut-off by the aperture (or effectively damping terms such as chromatic aberration). While these do not have essential effect on imaging crystal periodicity as long as the low order Bragg spots are inside the aperture, although the contrast may be reversed, they may change the appearance of images of amorphous materials completely. Because the spectrum of amorphous materials is continuous, modulation of it emphasizes some components while weakening others. Especially the cut-off of high frequency components, which contribute to amorphous image just as strongly as low frequency components can have a fundamental effect. This can be illustrated through computer simulation. Imaging of a whitenoise object with an electron microscope without TF limitation gives Fig. 1a, which is obtained by Fourier transformation of a constant amplitude combined with random phases generated by computer.


Author(s):  
M. T. Postek ◽  
A. E. Vladar

Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. The industry requires that an automated instrument must be routinely capable of 5 nm resolution (or better) at 1.0 kV accelerating voltage for the measurement of nominal 0.25-0.35 micrometer semiconductor critical dimensions. Testing and proving that the instrument is performing at this level on a day-by-day basis is an industry need and concern which has been the object of a study at NIST and the fundamentals and results are discussed in this paper.In scanning electron microscopy, two of the most important instrument parameters are the size and shape of the primary electron beam and any image taken in a scanning electron microscope is the result of the sample and electron probe interaction. The low frequency changes in the video signal, collected from the sample, contains information about the larger features and the high frequency changes carry information of finer details. The sharper the image, the larger the number of high frequency components making up that image. Fast Fourier Transform (FFT) analysis of an SEM image can be employed to provide qualitiative and ultimately quantitative information regarding the SEM image quality.


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