scholarly journals Spatial organization of cellulose microfibrils and matrix polysaccharides in primary plant cell walls as imaged by multichannel atomic force microscopy

2016 ◽  
Vol 85 (2) ◽  
pp. 179-192 ◽  
Author(s):  
Tian Zhang ◽  
Yunzhen Zheng ◽  
Daniel J. Cosgrove
Keyword(s):  
Atomic Force Microscopy ◽  
Plant Cell ◽  
Cell Walls ◽  
Spatial Organization ◽  
Cellulose Microfibrils ◽  
Plant Cell Walls ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Visualization of plant cell walls by atomic force microscopy

1996 ◽  
Vol 70 (3) ◽  
pp. 1138-1143 ◽  
Author(s):  
A.R. Kirby ◽  
A.P. Gunning ◽  
K.W. Waldron ◽  
V.J. Morris ◽  
A. Ng
Keyword(s):  
Atomic Force Microscopy ◽  
Plant Cell ◽  
Cell Walls ◽  
Plant Cell Walls ◽  
Force Microscopy ◽  
Atomic Force

Elastic Modulus of Single Cellulose Microfibrils from Tunicate Measured by Atomic Force Microscopy

2009 ◽  
Vol 10 (9) ◽  
pp. 2571-2576 ◽  
Author(s):  
Shinichiro Iwamoto ◽  
Weihua Kai ◽  
Akira Isogai ◽  
Tadahisa Iwata
Keyword(s):  
Atomic Force Microscopy ◽  
Elastic Modulus ◽  
Cellulose Microfibrils ◽  
Force Microscopy ◽  
Atomic Force

THE ABSENCE OF ELASTIC DEFORMATION IN DRIED BENT CELLULOSE MICROFIBRILS IN PLANT CELL WALLS

1965 ◽  
Vol 43 (3) ◽  
pp. 339-343
Author(s):  
J. Ross Colvin
Keyword(s):  
Elastic Deformation ◽  
Plant Cell ◽  
Cell Walls ◽  
Cold Water ◽  
Hot Water ◽  
Cellulose Microfibrils ◽  
Plant Cell Walls ◽  
Avena Coleoptile ◽  
Parenchyma Cells ◽  
Embedding Medium

A small fraction of individual cellulose microfibrils in plant cell walls show appreciable bending along a portion of their length in a plane tangential to the cell surface. Segments of such curved microfibrils from transverse sections of Avena coleoptile epidermal or parenchyma cells do not straighten when they are freed from the constraints imposed by adjacent microfibrils, amorphous cell wall constituents, or the embedding medium. The curvature of these segments is not affected by immersion in cold water for 30 minutes, in hot water for 10 minutes, or in steam at 100° for 10 minutes. The results indicate that there is no elastic deformation of bent cellulose microfibrils in dried plant cell walls. The curvature of the microfibrils in the absence of elastic deformation suggests either (a) that cellulose microfibrils may be synthesized in a bent strain-free condition or (b) that cellulose microfibrils are synthesized in a straight form, followed by elastic deformation with subsequent release of strain by recrystallization on drying.

scholarly journals Using atomic force microscopy to work with the cell surface of Candida albicans

2021 ◽  
Vol 2091 (1) ◽  
pp. 012026
Author(s):  
E M Filippova ◽  
U V Nesvizhski ◽  
S A Titov ◽  
A I Glukhov
Keyword(s):  
Atomic Force Microscopy ◽  
Candida Albicans ◽  
Cell Walls ◽  
Opportunistic Infections ◽  
Modes Of Operation ◽  
Force Microscopy ◽  
Operating Modes ◽  
Biological Objects ◽  
Atomic Force ◽  
Mucous Membranes

Abstract Candida albicans is a yeast-like fungus that lives on human mucous membranes and skin and does not cause infections. However, it plays a role in the development of opportunistic infections in immunocompromised people. In this work, we would like to evaluate the possibility of studying the cell wall of C. albicans by atomic force microscopy, as well as compare the operating modes of the microscope and choose optimal one for working with the fungus. Atomic force microscopy is a powerful tool for evaluating surfaces, including the cell walls of biological objects. The microscope is capable of operating in different modes, but in this study we compared two of them: contact and semi-contact. These methods are the most popular for evaluating the surfaces of biological objects. Comparison of the modes was carried out on the C. albicans strain. The surface of the strain was scanned by atomic force microscopy, and the curves of the dependence of the sensor deviation from the distance to the object were recorded. Scanning and recording of curves were carried out in two modes of operation of the microscope: contact and semi-contact, as well as three sensors: soft, medium and hard.

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