Investigation of fatigue crack initiation facets in Ti-6Al-4V using focused ion beam milling and electron backscatter diffraction

2017 ◽  
Vol 267 (1) ◽  
pp. 57-69 ◽  
Author(s):  
J. EVERAERTS ◽  
B. VERLINDEN ◽  
M. WEVERS
Keyword(s):  
Fatigue Crack ◽  
Crack Initiation ◽  
Focused Ion Beam ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Fatigue Crack Initiation ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Focused Ion Beam Milling

A high-fidelity crystal-plasticity finite element methodology for low-cycle fatigue using automatic electron backscatter diffraction scan conversion: Application to hot-rolled cobalt–chromium alloy

2021 ◽  
pp. 146442072110108
Author(s):  
Yuhui Tu ◽  
Seán B Leen ◽  
Noel M Harrison
Keyword(s):  
Finite Element ◽  
Fatigue Crack ◽  
Crack Initiation ◽  
Crystal Plasticity ◽  
Electron Backscatter Diffraction ◽  
Voronoi Tessellation ◽  
Fatigue Crack Initiation ◽  
Crystal Plasticity Finite Element ◽  
Electron Backscatter ◽  
Backscatter Diffraction

The common approach to crystal-plasticity finite element modeling for load-bearing prediction of metallic structures involves the simulation of simplified grain morphology and substructure detail. This paper details a methodology for predicting the structure–property effect of as-manufactured microstructure, including true grain morphology and orientation, on cyclic plasticity, and fatigue crack initiation in biomedical-grade CoCr alloy. The methodology generates high-fidelity crystal-plasticity finite element models, by directly converting measured electron backscatter diffraction metal microstructure grain maps into finite element microstructural models, and thus captures essential grain definition for improved microstructure–property analyses. This electron backscatter diffraction-based method for crystal-plasticity finite element model generation is shown to give approximately 10% improved agreement for fatigue life prediction, compared with the more commonly used Voronoi tessellation method. However, the added microstructural detail available in electron backscatter diffraction–crystal-plasticity finite element did not significantly alter the bulk stress–strain response prediction, compared to Voronoi tessellation–crystal-plasticity finite element. The new electron backscatter diffraction-based method within a strain-gradient crystal-plasticity finite element model is also applied to predict measured grain size effects for cyclic plasticity and fatigue crack initiation, and shows the concentration of geometrically necessary dislocations around true grain boundaries, with smaller grain samples exhibiting higher overall geometrically necessary dislocations concentrations. In addition, minimum model sizes for Voronoi tessellation–crystal-plasticity finite element and electron backscatter diffraction–crystal-plasticity finite element models are proposed for cyclic hysteresis and fatigue crack initiation prediction.

Intergrowth Structure of Zeolite Crystals and Pore Orientation of Individual Subunits Revealed by Electron Backscatter Diffraction/Focused Ion Beam Experiments

2008 ◽  
Vol 47 (30) ◽  
pp. 5637-5640 ◽  
Author(s):  
Eli Stavitski ◽  
Martyn R. Drury ◽  
D. A. Matthijs de Winter ◽  
Marianne H. F. Kox ◽  
Bert M. Weckhuysen
Keyword(s):  
Focused Ion Beam ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Zeolite Crystals

Application of FIB-EBSD Tomography for Understanding Annealing Phenomena in a Cold Rolled Particle-Containing Nickel Alloy

2007 ◽  
Vol 558-559 ◽  
pp. 413-418 ◽  
Author(s):  
Wan Qiang Xu ◽  
Michael Ferry ◽  
Julie M. Cairney ◽  
John F. Humphreys
Keyword(s):  
Nickel Alloy ◽  
Focused Ion Beam ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Serial Sectioning ◽  
Dual Beam ◽  
Electron Backscatter ◽  
Cold Rolled ◽  
Twin Formation ◽  
Backscatter Diffraction

A typical dual-beam platform combines a focused ion beam (FIB) microscope with a field emission gun scanning electron microscope (FEGSEM). Using FIB-FEGSEM, it is possible to sequentially mill away > ~ 50 nm sections of a material by FIB and characterize, at high resolution, the crystallographic features of each new surface by electron backscatter diffraction (EBSD). The successive images can be combined to generate 3D crystallographic maps of the microstructure. A useful technique is described for FIB milling that allows the reliable reconstruction of 3D microstructures using EBSD. This serial sectioning technique was used to investigate the recrystallization behaviour of a particle-containing nickel alloy, which revealed a number of features of the recrystallizing grains that are not clearly evident in 2D EBSD micrographs such as clear evidence of particle stimulated nucleation (PSN) and twin formation and growth during PSN.

A 3D FIB Investigation of Dynamic Recrystallization in a Cu-Sn Bronze

2012 ◽  
Vol 715-716 ◽  
pp. 498-501 ◽  
Author(s):  
Ali Gholinia ◽  
Ian Brough ◽  
John F. Humphreys ◽  
Pete S. Bate
Keyword(s):  
Dynamic Recrystallization ◽  
Focused Ion Beam ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Bronze Alloy ◽  
Ebsd Data ◽  
Nucleation Sites ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Relationship Of

A combination of electron backscatter diffraction (EBSD) and focused ion beam (FIB) techniques were used to obtain 3D EBSD data in an investigation of dynamic recrystallization in a Cu-2%Sn bronze alloy. The results of this investigation show the origin of the nucleation sites for dynamic recrystallization and also elucidates the orientation relationship of the recrystallized grains to the deformed, prior grains and between the dynamically recrystallized grains.

Intergrowth Structure of Zeolite Crystals and Pore Orientation of Individual Subunits Revealed by Electron Backscatter Diffraction/Focused Ion Beam Experiments

2008 ◽  
Vol 120 (30) ◽  
pp. 5719-5722 ◽  
Author(s):  
Eli Stavitski ◽  
Martyn R. Drury ◽  
D. A. Matthijs de Winter ◽  
Marianne H. F. Kox ◽  
Bert M. Weckhuysen
Keyword(s):  
Focused Ion Beam ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Zeolite Crystals

scholarly journals TEM Sample Preparation and FIB-Induced Damage

MRS Bulletin ◽  
2007 ◽  
Vol 32 (5) ◽  
pp. 400-407 ◽  
Author(s):  
Joachim Mayer ◽  
Lucille A. Giannuzzi ◽  
Takeo Kamino ◽  
Joseph Michael
Keyword(s):  
Electron Microscope ◽  
Focused Ion Beam ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
X Ray ◽  
Transmission Electron ◽  
Electron Backscatter ◽  
Future Potential ◽  
Backscatter Diffraction ◽  
Composite Samples

AbstractOne of the most important applications of a focused ion beam (FIB) workstation is preparing samples for transmission electron microscope (TEM) investigation. Samples must be uniformly thin to enable the analyzing beam of electrons to penetrate. The FIB enables not only the preparation of large, uniformly thick, sitespecific samples, but also the fabrication of lamellae used for TEM samples from composite samples consisting of inorganic and organic materials with very different properties. This article gives an overview of the variety of techniques that have been developed to prepare the final TEM specimen. The strengths of these methods as well as the problems, such as FIB-induced damage and Ga contamination, are illustrated with examples. Most recently, FIB-thinned lamellae were used to improve the spatial resolution of electron backscatter diffraction and energy-dispersive x-ray mapping. Examples are presented to illustrate the capabilities, difficulties, and future potential of FIB.

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